Explore: Random Access Memory
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Source: The Open Library
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1Memory technology, design and testing
By IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)

“Memory technology, design and testing” Metadata:
- Title: ➤ Memory technology, design and testing
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)
- Language: English
- Number of Pages: Median: 131
- Publisher: ➤ IEEE Inc. - IEEE Computer Society Press
- Publish Date: 1983 - 1998
- Publish Location: Los Alamitos, California
“Memory technology, design and testing” Subjects and Themes:
- Subjects: ➤ Congresses - Semiconductor storage devices - Testing - Random access memory - Cardiology - Data processing - Electrocardiography - Patient monitoring
Edition Identifiers:
- The Open Library ID: OL22308438M - OL11390623M
- Online Computer Library Center (OCLC) ID: 11487132 - 39841628
- All ISBNs: 0818684968 - 9780818684968 - 9780818684944 - 0818684941
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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2Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California
By IEEE International Workshop on Memory Testing (1993 San Jose, Calif.)

“Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California” Metadata:
- Title: ➤ Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California
- Author: ➤ IEEE International Workshop on Memory Testing (1993 San Jose, Calif.)
- Language: English
- Number of Pages: Median: 143
- Publisher: IEEE Computer Society Press
- Publish Date: 1993
- Publish Location: Los Alamitos, Calif
“Records of the 1993 IEEE International Workshop on Memory Testing, August 9-10, 1993, San Jose, California” Subjects and Themes:
- Subjects: Congresses - Random access memory - Semiconductor storage devices - Testing - Computer storage devices
Edition Identifiers:
- The Open Library ID: OL1442896M
- Online Computer Library Center (OCLC) ID: 30362647
- Library of Congress Control Number (LCCN): 93077854
- All ISBNs: 0818641509 - 9780818641503 - 9780818641510 - 0818641517
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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3Testing and testable design of high-density random-access memories
By Pinaki Mazumder

“Testing and testable design of high-density random-access memories” Metadata:
- Title: ➤ Testing and testable design of high-density random-access memories
- Author: Pinaki Mazumder
- Language: English
- Number of Pages: Median: 386
- Publisher: Kluwer Academic
- Publish Date: 1996
- Publish Location: Boston, Mass
“Testing and testable design of high-density random-access memories” Subjects and Themes:
- Subjects: Random access memory - Testing
Edition Identifiers:
- The Open Library ID: OL989235M
- Library of Congress Control Number (LCCN): 96027507
- All ISBNs: 9780792397823 - 0792397827
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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4Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
By IEEE International Workshop on Memory Technology, Design, and Testing (1994 San Jose, Calif.)

“Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California” Metadata:
- Title: ➤ Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (1994 San Jose, Calif.)
- Language: English
- Number of Pages: Median: 141
- Publisher: IEEE Computer Society Press
- Publish Date: 1994
- Publish Location: Los Alamitos, Calif
“Records of the IEEE International Workshop on Memory Technology, Design, and Testing, August 8-9, 1994, San Jose, California” Subjects and Themes:
- Subjects: Congresses - Semiconductor storage devices - Testing - Random access memory
Edition Identifiers:
- The Open Library ID: OL1130261M
- Online Computer Library Center (OCLC) ID: 31189400
- Library of Congress Control Number (LCCN): 94075844
- All ISBNs: 0818662468 - 9780818662461 - 081866245X - 9780818662454
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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5Photonics for processors, neural networks, and memories
By Joseph L. Horner

“Photonics for processors, neural networks, and memories” Metadata:
- Title: ➤ Photonics for processors, neural networks, and memories
- Author: Joseph L. Horner
- Language: English
- Number of Pages: Median: 669
- Publisher: ➤ SPIE--the International Society for Optical Engineering
- Publish Date: 1993
- Publish Location: Bellingham, Wash., USA
“Photonics for processors, neural networks, and memories” Subjects and Themes:
- Subjects: ➤ Neural networks (Computer science) - Congresses - Optical pattern recognition - Optical storage devices - Optical data processing - Optoelectronic devices - Photonics - Optical Computers - Pattern perception - Random access memory
Edition Identifiers:
- The Open Library ID: OL1446037M
- Online Computer Library Center (OCLC) ID: 29559287
- Library of Congress Control Number (LCCN): 93084694
- All ISBNs: 9780819412751 - 0819412759
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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6Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
By IEEE International Workshop on Memory Technology, Design, and Testing (1995 San Jose, Calif.)

“Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California” Metadata:
- Title: ➤ Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (1995 San Jose, Calif.)
- Language: English
- Number of Pages: Median: 129
- Publisher: IEEE Computer Society Press
- Publish Date: 1995
- Publish Location: Los Alamitos, Calif
“Records of the 1995 IEEE International Workshop on Memory Technology, Design, and Testing, August 7-8, 1995, San Jose, California” Subjects and Themes:
- Subjects: Congresses - Semiconductor storage devices - Testing - Random access memory
Edition Identifiers:
- The Open Library ID: OL821657M
- Online Computer Library Center (OCLC) ID: 33418600
- Library of Congress Control Number (LCCN): 95075673
- All ISBNs: 0818671025 - 9780818671029
Access and General Info:
- First Year Published: 1995
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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7Turing's cathedral
By George Dyson

“Turing's cathedral” Metadata:
- Title: Turing's cathedral
- Author: George Dyson
- Language: English
- Publisher: Pantheon Books - Penguin
- Publish Date: 2012
- Publish Location: New York
“Turing's cathedral” Subjects and Themes:
- Subjects: ➤ BIOGRAPHY & AUTOBIOGRAPHY / Science & Technology - SCIENCE / General - Computable functions - Turing machines - Random access memory - Computers - History - Long Now Manual for Civilization - Informatique - SCIENCE (Programme) - SCIENCE - Science & Technology - Histoire - Programmation informatique - General - Science et technologie - Ordinateurs - BIOGRAPHY & AUTOBIOGRAPHY
- People: ➤ Alan Mathison Turing (1912-1954) - John Von Neumann (1903-1957)
- Places: Princeton - Welwyn Garden - Oxford
Edition Identifiers:
- The Open Library ID: OL25011031M - OL25425430M
- Online Computer Library Center (OCLC) ID: 745979775
- Library of Congress Control Number (LCCN): 2011030265
- All ISBNs: 0375422773 - 9780375422775
Author's Alternative Names:
"George B. Dyson", "George Dyson" and "GEORGE DYSON"Access and General Info:
- First Year Published: 2012
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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8Dynamic Ram
By Muzaffer A. Siddiqi

“Dynamic Ram” Metadata:
- Title: Dynamic Ram
- Author: Muzaffer A. Siddiqi
- Language: English
- Number of Pages: Median: 382
- Publisher: ➤ CRC Press - Taylor & Francis Group
- Publish Date: 2012 - 2017
“Dynamic Ram” Subjects and Themes:
- Subjects: ➤ Computer storage devices - COMPUTERS / Computer Engineering - Semiconductor storage devices - TECHNOLOGY & ENGINEERING / Electronics / Microelectronics - TECHNOLOGY & ENGINEERING / Electronics / Circuits / General - Random access memory - Semiconductors - Ordinateurs - Mémoires à semi-conducteurs - Mémoires à accès sélectif - COMPUTERS - Computer Engineering - TECHNOLOGY & ENGINEERING - Electronics - Circuits - General - Microelectronics - Hardware
Edition Identifiers:
- The Open Library ID: ➤ OL33550321M - OL33665577M - OL33413139M - OL33745186M - OL33686172M - OL28843709M - OL28760516M
- Online Computer Library Center (OCLC) ID: 862975720 - 822565427
- Library of Congress Control Number (LCCN): 2012030359
- All ISBNs: ➤ 9781138077058 - 9781315216690 - 9781439893739 - 9781439893753 - 1306534984 - 1138077054 - 1439893756 - 1351832581 - 143989373X - 9781351823890 - 9781306534987 - 1315216698 - 9781351832588 - 1351823892
Access and General Info:
- First Year Published: 2012
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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9Mega-Bit Memory Technology - from Mega-Bit to Giga-Bit
By Hiroyuki Tango
“Mega-Bit Memory Technology - from Mega-Bit to Giga-Bit” Metadata:
- Title: ➤ Mega-Bit Memory Technology - from Mega-Bit to Giga-Bit
- Author: Hiroyuki Tango
- Language: English
- Number of Pages: Median: 310
- Publisher: Taylor & Francis Group
- Publish Date: 2019
“Mega-Bit Memory Technology - from Mega-Bit to Giga-Bit” Subjects and Themes:
- Subjects: ➤ Random access memory - Integrated circuits - Large scale integration - Ultra large scale integration - Ordinateurs - Mémoires à accès sélectif - Circuits intégrés à grande échelle - Circuits intégrés à ultra-grande échelle - COMPUTERS - General - TECHNOLOGY - Engineering - Civil
Edition Identifiers:
- The Open Library ID: OL33712587M - OL34658827M - OL33712542M - OL33760392M - OL33712652M
- Online Computer Library Center (OCLC) ID: 1125007310
- All ISBNs: ➤ 9781138413955 - 9781000657692 - 1000673413 - 9781000673418 - 113841395X - 9781000665550 - 1000657698 - 9780429332371 - 0429332378 - 1000665550
Access and General Info:
- First Year Published: 2019
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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10Turings Cathedral Vintage
By George Dyson

“Turings Cathedral Vintage” Metadata:
- Title: ➤ Turings Cathedral Vintage
- Author: George Dyson
- Number of Pages: Median: 401
- Publisher: Vintage Books
- Publish Date: 2012
“Turings Cathedral Vintage” Subjects and Themes:
- Subjects: ➤ Computers - History - Turing machines - Computable functions - Random access memory - New York Times reviewed - Von neumann, john, 1903-1957 - Computers, history - Mathematicians, biography - Turing, alan mathison, 1912-1954
Edition Identifiers:
- The Open Library ID: OL26139163M
- Online Computer Library Center (OCLC) ID: 781683394
- Library of Congress Control Number (LCCN): 2013370011
- All ISBNs: 1400075998 - 9781400075997
Author's Alternative Names:
"George B. Dyson", "George Dyson" and "GEORGE DYSON"Access and General Info:
- First Year Published: 2012
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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11Thin film ferroelectric materials and devices
By R. Ramesh

“Thin film ferroelectric materials and devices” Metadata:
- Title: ➤ Thin film ferroelectric materials and devices
- Author: R. Ramesh
- Language: English
- Number of Pages: Median: 249
- Publisher: ➤ Kluwer Academic Publishers - Springer London, Limited - Springer
- Publish Date: 1997 - 2011 - 2013 - 2014
- Publish Location: Boston
“Thin film ferroelectric materials and devices” Subjects and Themes:
- Subjects: ➤ Ferroelectric thin films - Random access memory - Materials - Thin film devices - Thin films - Computer storage devices
Edition Identifiers:
- The Open Library ID: OL29767774M - OL679892M - OL37229929M - OL34383355M
- Library of Congress Control Number (LCCN): 97026415
- All ISBNs: ➤ 9780792399933 - 9781461378358 - 1461561868 - 1461378354 - 0792399935 - 146156185X - 9781461561866 - 9781461561859
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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12Testing static random access memories
By Said Hamdioui

“Testing static random access memories” Metadata:
- Title: ➤ Testing static random access memories
- Author: Said Hamdioui
- Language: English
- Number of Pages: Median: 240
- Publisher: ➤ Kluwer Academic - Springer - Springer London, Limited
- Publish Date: 2004 - 2010 - 2013
- Publish Location: Boston
“Testing static random access memories” Subjects and Themes:
- Subjects: Random access memory - Testing - Computer storage devices
Edition Identifiers:
- The Open Library ID: OL37248131M - OL28144145M - OL8372892M - OL19291324M
- Library of Congress Control Number (LCCN): 2004041373
- All ISBNs: ➤ 1475767064 - 9781475767063 - 9781402077524 - 1402077521 - 9781441954305 - 1441954309
First Setence:
"Ultra large scale integrated (ULSI) circuits are an integral part of any modern electronic system."
Access and General Info:
- First Year Published: 2004
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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13Robust Sram Designs And Analysis
By Jawar Singh

“Robust Sram Designs And Analysis” Metadata:
- Title: ➤ Robust Sram Designs And Analysis
- Author: Jawar Singh
- Publisher: Springer
- Publish Date: 2012
“Robust Sram Designs And Analysis” Subjects and Themes:
- Subjects: Semiconductors - Random access memory - Design - Complementary Metal oxide semiconductors - Design and construction
Edition Identifiers:
- The Open Library ID: OL26016446M
- Library of Congress Control Number (LCCN): 2012936831
- All ISBNs: 1461408172 - 9781461408178
Access and General Info:
- First Year Published: 2012
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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14Emerging Memory Technologies
By Yuan Xie

“Emerging Memory Technologies” Metadata:
- Title: Emerging Memory Technologies
- Author: Yuan Xie
- Language: English
- Number of Pages: Median: 325
- Publisher: ➤ Springer London, Limited - Springer
- Publish Date: 2013 - 2016
“Emerging Memory Technologies” Subjects and Themes:
- Subjects: ➤ Magnetic memory (computers) - Computer storage devices - Random access memory - Magnetic memory (Computers) - Design - Computer-aided design
Edition Identifiers:
- The Open Library ID: OL37145882M - OL28118431M - OL27983331M
- Library of Congress Control Number (LCCN): 2013948866
- All ISBNs: ➤ 9781441995513 - 1493941992 - 1441995501 - 9781493941995 - 9781441995506 - 144199551X
Access and General Info:
- First Year Published: 2013
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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15BCH codes for large IC random-access memory systems
By Shu Lin
“BCH codes for large IC random-access memory systems” Metadata:
- Title: ➤ BCH codes for large IC random-access memory systems
- Author: Shu Lin
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration
- Publish Date: 1983
- Publish Location: [Washington, D.C.?
“BCH codes for large IC random-access memory systems” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL14927629M - OL17831785M - OL17666372M
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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16Nanometer VariationTolerant Sram
By Mohab Anis

“Nanometer VariationTolerant Sram” Metadata:
- Title: ➤ Nanometer VariationTolerant Sram
- Author: Mohab Anis
- Number of Pages: Median: 188
- Publisher: Springer
- Publish Date: 2012 - 2014
“Nanometer VariationTolerant Sram” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL26152672M - OL29266796M - OL28055186M
- Library of Congress Control Number (LCCN): 2012943374
- All ISBNs: ➤ 1461417481 - 9781493902200 - 9781461417484 - 9781461417507 - 1493902202 - 1461417503
Access and General Info:
- First Year Published: 2012
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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17Proceedings
By IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.)

“Proceedings” Metadata:
- Title: Proceedings
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.)
- Language: English
- Number of Pages: Median: 103
- Publisher: ➤ Institute of Electrical & Electronics Enginee - IEEE Computer Society Press
- Publish Date: 1997
- Publish Location: Los Alamitos, Calif
“Proceedings” Subjects and Themes:
- Subjects: Congresses - Semiconductor storage devices - Testing - Random access memory
Edition Identifiers:
- The Open Library ID: OL11390453M - OL11390452M - OL296068M
- Online Computer Library Center (OCLC) ID: 37597894
- Library of Congress Control Number (LCCN): 97202128
- All ISBNs: ➤ 9780818681004 - 0818681004 - 9780818680991 - 9780818681011 - 0818681012 - 0818680997
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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18DOS beyond 640K
By James Forney
“DOS beyond 640K” Metadata:
- Title: DOS beyond 640K
- Author: James Forney
- Language: English
- Number of Pages: Median: 274
- Publisher: ➤ Windcrest/McGraw-Hill - Windcrest
- Publish Date: 1992 - 1994
- Publish Location: ➤ Blue Ridge Summit, PA - New York
“DOS beyond 640K” Subjects and Themes:
- Subjects: MS-DOS (Computer file) - Operating systems (Computers) - PC-DOS (Computer file) - Random access memory - Ms-dos (computer operating system)
Edition Identifiers:
- The Open Library ID: OL1545454M - OL1402236M
- Library of Congress Control Number (LCCN): 91024629 - 93010184
- All ISBNs: ➤ 0830637443 - 9780830643516 - 9780830637447 - 0830697179 - 0830643516 - 0830643508 - 9780830697175 - 9780830643509
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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19Principles of information storage and retrieval using a large scale random access memory
By J. J. Nolan
“Principles of information storage and retrieval using a large scale random access memory” Metadata:
- Title: ➤ Principles of information storage and retrieval using a large scale random access memory
- Author: J. J. Nolan
- Language: English
- Number of Pages: Median: 14
- Publisher: ➤ International Business Machines Corporation
- Publish Date: 1958
- Publish Location: San Jose, Calif
“Principles of information storage and retrieval using a large scale random access memory” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL49880944M
- Online Computer Library Center (OCLC) ID: 15584861
Access and General Info:
- First Year Published: 1958
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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20Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
By IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)

“Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France” Metadata:
- Title: ➤ Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
- Author: ➤ IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)
- Language: English
- Number of Pages: Median: 166
- Publisher: ➤ IEEE Computer Society Pr - IEEE Computer Society
- Publish Date: 2002
- Publish Location: Los Alamitos, Calif
“Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France” Subjects and Themes:
- Subjects: Congresses - Random access memory - Semiconductor storage devices - Testing
Edition Identifiers:
- The Open Library ID: OL3657293M - OL8067537M
- Online Computer Library Center (OCLC) ID: 50244565 - 50761453
- Library of Congress Control Number (LCCN): 2002512007
- All ISBNs: ➤ 076951619X - 9780769516172 - 0769516181 - 9780769516196 - 9780769516189 - 0769516173
Access and General Info:
- First Year Published: 2002
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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21286/DOS-extender SDK
“286/DOS-extender SDK” Metadata:
- Title: 286/DOS-extender SDK
- Language: English
- Publisher: Phar Lap Software
- Publish Date: 1991
- Publish Location: ➤ Cambridge, MA (60 Aberdeen Ave., Cambridge 02138)
“286/DOS-extender SDK” Subjects and Themes:
- Subjects: ➤ Memory management (Computer science) - Intel 80286 (Microprocessor) - Random access memory - MS-DOS (Computer file)
Edition Identifiers:
- The Open Library ID: OL1201453M
- Library of Congress Control Number (LCCN): 94195043
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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22DRAM circuit design
By Brent Keeth, Brian Johnson and Lin, Feng

“DRAM circuit design” Metadata:
- Title: DRAM circuit design
- Authors: Brent KeethBrian JohnsonLin, Feng
- Language: English
- Number of Pages: Median: 421
- Publisher: IEEE - Wiley-Interscience
- Publish Date: 2007
- Publish Location: ➤ Hoboken, N. J - Piscataway, N. J
“DRAM circuit design” Subjects and Themes:
- Subjects: Random access memory - Electronic circuit design - Semiconductors - Magnetic memory (computers)
Edition Identifiers:
- The Open Library ID: OL51664643M - OL17250371M
- Online Computer Library Center (OCLC) ID: 187916859
- Library of Congress Control Number (LCCN): 2008270080
- All ISBNs: 0470184752 - 9780470184752 - 9780470544426 - 0470544422
Access and General Info:
- First Year Published: 2007
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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2364K dynamic random access memory components from Japan
By United States International Trade Commission
“64K dynamic random access memory components from Japan” Metadata:
- Title: ➤ 64K dynamic random access memory components from Japan
- Author: ➤ United States International Trade Commission
- Language: English
- Number of Pages: Median: 73
- Publisher: ➤ U.S. International Trade Commission
- Publish Date: 1985 - 1986
- Publish Location: ➤ Washington, D.C - Washington, DC
“64K dynamic random access memory components from Japan” Subjects and Themes:
- Subjects: ➤ Computer storage device industry - Computer industry - Computer storage devices - Random access memory
- Places: United States - Japan
Edition Identifiers:
- The Open Library ID: OL14919503M - OL14919502M
- Online Computer Library Center (OCLC) ID: 14048289 - 12683587
Access and General Info:
- First Year Published: 1985
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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24DRAMs of one megabit and above from the Republic of Korea
By United States International Trade Commission
“DRAMs of one megabit and above from the Republic of Korea” Metadata:
- Title: ➤ DRAMs of one megabit and above from the Republic of Korea
- Author: ➤ United States International Trade Commission
- Language: English
- Publisher: ➤ The Commission - U.S. International Trade Commission
- Publish Date: 1992 - 1993
- Publish Location: ➤ Washington, DC - Washington, D.C
“DRAMs of one megabit and above from the Republic of Korea” Subjects and Themes:
- Subjects: Semiconductor industry - Random access memory
- Places: United States - Korea (South)
Edition Identifiers:
- The Open Library ID: OL14955738M - OL14705242M
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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25Static random access memory semiconductors from the Republic of Korea and Taiwan
By United States International Trade Commission
“Static random access memory semiconductors from the Republic of Korea and Taiwan” Metadata:
- Title: ➤ Static random access memory semiconductors from the Republic of Korea and Taiwan
- Author: ➤ United States International Trade Commission
- Language: English
- Publisher: ➤ U.S. International Trade Commission
- Publish Date: 1997 - 1998
- Publish Location: Washington, DC
“Static random access memory semiconductors from the Republic of Korea and Taiwan” Subjects and Themes:
- Subjects: Semiconductor industry - Random access memory
- Places: United States - Taiwan - Korea (South)
Edition Identifiers:
- The Open Library ID: OL15091952M - OL15234025M
- Online Computer Library Center (OCLC) ID: 39965626
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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26CMOS SRAM circuit design and parametric test in nano-scaled technologies
By Pavlov, Andrei Ph. D.

“CMOS SRAM circuit design and parametric test in nano-scaled technologies” Metadata:
- Title: ➤ CMOS SRAM circuit design and parametric test in nano-scaled technologies
- Author: Pavlov, Andrei Ph. D.
- Language: English
- Number of Pages: Median: 193
- Publisher: Springer
- Publish Date: 2008
- Publish Location: [Dordrecht]
“CMOS SRAM circuit design and parametric test in nano-scaled technologies” Subjects and Themes:
- Subjects: ➤ Complementary Metal oxide semiconductors - Design - Metal oxide semiconductors, Complementary - Nanoelectronics - Random access memory - Metal oxide semiconductors, complementary - Computer storage devices - Nanotechnology
Edition Identifiers:
- The Open Library ID: OL22565967M
- Library of Congress Control Number (LCCN): 2008924192
- All ISBNs: 9781402083624 - 1402083629 - 9781402083631 - 1402083637
Access and General Info:
- First Year Published: 2008
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: Unclassified
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27Turing's Cathedral
By George Dyson

“Turing's Cathedral” Metadata:
- Title: Turing's Cathedral
- Author: George Dyson
- Number of Pages: Median: 200
- Publisher: Allen Lane
- Publish Date: 2012
“Turing's Cathedral” Subjects and Themes:
- Subjects: ➤ Turing machines - Computable functions - Random access memory - Computers - History - Computer science - Philosophy - Informatik - Theoretische Informatik - Computer - Datorer - Historia - Datavetenskap - Teori, filosofi - Von neumann, john, 1903-1957 - Computers, history - Computer storage devices - Mathematicians, biography - Turing, alan mathison, 1912-1954
Edition Identifiers:
- The Open Library ID: OL27628301M
- Online Computer Library Center (OCLC) ID: 760292658
- All ISBNs: 9780713997507 - 0713997508
Author's Alternative Names:
"George B. Dyson", "George Dyson" and "GEORGE DYSON"Access and General Info:
- First Year Published: 2012
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
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28DRAMs of one megabit and above from the Republic of Korea
By United States International Trade Commission.
“DRAMs of one megabit and above from the Republic of Korea” Metadata:
- Title: ➤ DRAMs of one megabit and above from the Republic of Korea
- Author: ➤ United States International Trade Commission.
- Language: English
- Publisher: ➤ The Commission - U.S. International Trade Commission
- Publish Date: 1992 - 1993
- Publish Location: ➤ Washington, DC - Washington, D.C
“DRAMs of one megabit and above from the Republic of Korea” Subjects and Themes:
- Subjects: Semiconductor industry - Random access memory
- Places: United States - Korea (South)
Edition Identifiers:
- The Open Library ID: OL17679814M - OL17676744M
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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29CMOS processors and memories
By Krzysztof Iniewski

“CMOS processors and memories” Metadata:
- Title: CMOS processors and memories
- Author: Krzysztof Iniewski
- Language: English
- Number of Pages: Median: 380
- Publisher: Springer
- Publish Date: 2010
- Publish Location: Dordrecht - New York
“CMOS processors and memories” Subjects and Themes:
- Subjects: ➤ Complementary Metal oxide semiconductors - Random access memory - Semiconductor storage devices - Design and construction - Metal oxide semiconductors, complementary - Computer storage devices
Edition Identifiers:
- The Open Library ID: OL25093858M
- Online Computer Library Center (OCLC) ID: 646113954
- Library of Congress Control Number (LCCN): 2010933360
- All ISBNs: 9789048192151 - 9048192153
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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30New DRAM technologies
By Steven A. Przybylski
“New DRAM technologies” Metadata:
- Title: New DRAM technologies
- Author: Steven A. Przybylski
- Language: English
- Number of Pages: Median: 846
- Publisher: MicroDesign Resources
- Publish Date: 1996
- Publish Location: Sebastopol, CA
“New DRAM technologies” Subjects and Themes:
- Subjects: Random access memory - Semiconductor storage devices
Edition Identifiers:
- The Open Library ID: OL111335M
- Library of Congress Control Number (LCCN): 99231315
- All ISBNs: 9781885330062 - 1885330065
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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312005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan
By Ieee International Workshop on Memory Te
“2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan” Metadata:
- Title: ➤ 2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan
- Author: ➤ Ieee International Workshop on Memory Te
- Language: English
- Number of Pages: Median: 153
- Publisher: ➤ Institute of Electrical & Electronics Enginee
- Publish Date: 2005
“2005 IEEE International Workshop on Memory Technology, Design, and Testing Mtdt 2005, 3-5 August 2005, Taipei, Taiwan” Subjects and Themes:
- Subjects: Semiconductor storage devices - Congresses - Testing - Random access memory
Edition Identifiers:
- The Open Library ID: OL10967136M
- Library of Congress Control Number (LCCN): 2006278060
- All ISBNs: 9780769523132 - 0769523137
Access and General Info:
- First Year Published: 2005
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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32A Random search algorithm for constrained global optimization
By Seppo Palosaari
“A Random search algorithm for constrained global optimization” Metadata:
- Title: ➤ A Random search algorithm for constrained global optimization
- Author: Seppo Palosaari
- Language: English
- Number of Pages: Median: 45
- Publisher: ➤ Finnish Academy of Technical Sciences
- Publish Date: 1986
- Publish Location: Helsinki
“A Random search algorithm for constrained global optimization” Subjects and Themes:
- Subjects: Mathematical optimization - Algorithms - Random access memory
Edition Identifiers:
- The Open Library ID: OL54430789M
- Online Computer Library Center (OCLC) ID: 17490423
- All ISBNs: 9789516662292 - 9516662293
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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33Dynamic semiconductor RAM structures
By A. Cardon

“Dynamic semiconductor RAM structures” Metadata:
- Title: ➤ Dynamic semiconductor RAM structures
- Author: A. Cardon
- Language: English
- Number of Pages: Median: 469
- Publisher: ➤ Pergamon Press - Pergamon International Information Corp.
- Publish Date: 1984
- Publish Location: ➤ New York - Oxford [Oxfordshire] - McLean, VA, USA
“Dynamic semiconductor RAM structures” Subjects and Themes:
- Subjects: Patents - Random access memory - Semiconductor storage devices - Semiconductors
Edition Identifiers:
- The Open Library ID: OL3182993M
- Online Computer Library Center (OCLC) ID: 10275735
- Library of Congress Control Number (LCCN): 83025713
- All ISBNs: 9780080305783 - 0080305784
Access and General Info:
- First Year Published: 1984
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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34MS-DOS beyond 640K
By James Forney
“MS-DOS beyond 640K” Metadata:
- Title: MS-DOS beyond 640K
- Author: James Forney
- Language: English
- Number of Pages: Median: 235
- Publisher: Windcrest
- Publish Date: 1989
- Publish Location: Blue Ridge Summit, PA
“MS-DOS beyond 640K” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL2186926M
- Library of Congress Control Number (LCCN): 89005013
- All ISBNs: 9780830632398 - 9780830614394 - 0830632395 - 0830614397
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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35MTDT 2004
By IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.)
“MTDT 2004” Metadata:
- Title: MTDT 2004
- Author: ➤ IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.)
- Language: English
- Number of Pages: Median: 121
- Publisher: IEEE Computer Society
- Publish Date: 2004
- Publish Location: Los Alamitos, Calif
“MTDT 2004” Subjects and Themes:
- Subjects: Congresses - Random access memory - Semiconductor storage devices - Testing
Edition Identifiers:
- The Open Library ID: OL3437786M
- Online Computer Library Center (OCLC) ID: 56496106
- Library of Congress Control Number (LCCN): 2005295655
- All ISBNs: 9780769521930 - 0769521932
Access and General Info:
- First Year Published: 2004
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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36DRAM no juyō to kyōkyū no kankei oyobi sorera ga kokunai kakaku ni ataeta eikyō tō ni tsuite no teiryōteki bunseki to genʼin tankyū
By Japan. Keizai Sangyōshō
“DRAM no juyō to kyōkyū no kankei oyobi sorera ga kokunai kakaku ni ataeta eikyō tō ni tsuite no teiryōteki bunseki to genʼin tankyū” Metadata:
- Title: ➤ DRAM no juyō to kyōkyū no kankei oyobi sorera ga kokunai kakaku ni ataeta eikyō tō ni tsuite no teiryōteki bunseki to genʼin tankyū
- Author: Japan. Keizai Sangyōshō
- Language: jpn
- Number of Pages: Median: 109
- Publisher: Nomura Sōgō Kenkyūjo
- Publish Date: 2005
- Publish Location: [Tokyo]
“DRAM no juyō to kyōkyū no kankei oyobi sorera ga kokunai kakaku ni ataeta eikyō tō ni tsuite no teiryōteki bunseki to genʼin tankyū” Subjects and Themes:
- Subjects: Random access memory
- Places: Japan
Edition Identifiers:
- The Open Library ID: OL31798463M
- Library of Congress Control Number (LCCN): 2007557470
Access and General Info:
- First Year Published: 2005
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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37Fault-tolerance and reliability techniques for high-density random-access memories
By Kanad Chakraborty and Pinaki Mazumder

“Fault-tolerance and reliability techniques for high-density random-access memories” Metadata:
- Title: ➤ Fault-tolerance and reliability techniques for high-density random-access memories
- Authors: Kanad ChakrabortyPinaki Mazumder
- Language: English
- Number of Pages: Median: 448
- Publisher: Prentice Hall PTR
- Publish Date: 2002
“Fault-tolerance and reliability techniques for high-density random-access memories” Subjects and Themes:
- Subjects: Random access memory - Reliability - Integrated circuits - Fault tolerance - Semiconductor storage devices
Edition Identifiers:
- The Open Library ID: OL7329663M
- Online Computer Library Center (OCLC) ID: 50115724
- Library of Congress Control Number (LCCN): 2002027055
- All ISBNs: 9780130084651 - 0130084654
Access and General Info:
- First Year Published: 2002
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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38Ci xing ji yi ti chuan li di tu ji fen xi =
“Ci xing ji yi ti chuan li di tu ji fen xi =” Metadata:
- Title: ➤ Ci xing ji yi ti chuan li di tu ji fen xi =
- Language: chi
- Number of Pages: Median: 169
- Publisher: ➤ Xing zheng yuan Guo jia ke xue wei yuan hui ke xue ji shu zi liao zhong xin
- Publish Date: 2004
- Publish Location: Taibei Shi
“Ci xing ji yi ti chuan li di tu ji fen xi =” Subjects and Themes:
- Subjects: Random access memory - Magnetic memory (Computers) - Patents
Edition Identifiers:
- The Open Library ID: OL22674185M
- Library of Congress Control Number (LCCN): 2008438722
- All ISBNs: 9789576191152 - 9576191157
Access and General Info:
- First Year Published: 2004
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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39Handōtai memori
By Hideo Sunami
“Handōtai memori” Metadata:
- Title: Handōtai memori
- Author: Hideo Sunami
- Language: jpn
- Number of Pages: Median: 189
- Publisher: Koronasha
- Publish Date: 2008
- Publish Location: Tōkyō
“Handōtai memori” Subjects and Themes:
- Subjects: Semiconductor storage devices - Random access memory
Edition Identifiers:
- The Open Library ID: OL23955464M
- Library of Congress Control Number (LCCN): 2009352186
- All ISBNs: 4339007986 - 9784339007985
Access and General Info:
- First Year Published: 2008
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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40MTDT 2009
By IEEE International Workshop on Memory Technology, Design, and Testing (17th 2009 Hsinchu, Taiwan)
“MTDT 2009” Metadata:
- Title: MTDT 2009
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (17th 2009 Hsinchu, Taiwan)
- Language: English
- Number of Pages: Median: 95
- Publisher: IEEE Computer Society
- Publish Date: 2009
- Publish Location: Los Alamitos, Calif
“MTDT 2009” Subjects and Themes:
- Subjects: Semiconductor storage devices - Testing - Congresses - Random access memory
Edition Identifiers:
- The Open Library ID: OL25044961M
- Online Computer Library Center (OCLC) ID: 498380290
- Library of Congress Control Number (LCCN): 2010484146
- All ISBNs: 9780769537979 - 0769537979
Access and General Info:
- First Year Published: 2009
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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41Ultra low voltage DRAM current sense amplifier with body bias techniques
By Yung-jin Gang
“Ultra low voltage DRAM current sense amplifier with body bias techniques” Metadata:
- Title: ➤ Ultra low voltage DRAM current sense amplifier with body bias techniques
- Author: Yung-jin Gang
- Language: English
- Number of Pages: Median: 95
- Publish Date: 1998
“Ultra low voltage DRAM current sense amplifier with body bias techniques” Subjects and Themes:
- Subjects: ➤ Metal oxide semiconductor field-effect transistors - Random access memory - Low voltage integrated circuits
Edition Identifiers:
- The Open Library ID: OL15534181M
Access and General Info:
- First Year Published: 1998
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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42Parallel optical random access memory (PORAM)
By G. A. Alphonse
“Parallel optical random access memory (PORAM)” Metadata:
- Title: ➤ Parallel optical random access memory (PORAM)
- Author: G. A. Alphonse
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division - National Technical Information Service, distributor]
- Publish Date: 1989
- Publish Location: ➤ [Washington, DC] - [Springfield, Va
“Parallel optical random access memory (PORAM)” Subjects and Themes:
- Subjects: ➤ Acousto-optics - Emitters - Magneto-optics - Random access memory - Optical memory (Data storage) - Parallel processing (Computers) - Electron precipitation
Edition Identifiers:
- The Open Library ID: OL15407780M
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
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43In the matter of certain dynamic random access memories, components thereof and products containing same
By United States International Trade Commission
“In the matter of certain dynamic random access memories, components thereof and products containing same” Metadata:
- Title: ➤ In the matter of certain dynamic random access memories, components thereof and products containing same
- Author: ➤ United States International Trade Commission
- Language: English
- Publisher: ➤ U.S. International Trade Commission
- Publish Date: 1987
- Publish Location: Washington, DC
“In the matter of certain dynamic random access memories, components thereof and products containing same” Subjects and Themes:
- Subjects: ➤ Computer storage device industry - Computer storage devices - Imports - Inc Samsung Company - Random access memory - Texas Instruments Incorporated
- Places: United States
Edition Identifiers:
- The Open Library ID: OL14648226M
- Online Computer Library Center (OCLC) ID: 18803786
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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44Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA
By IEEE International Workshop on Memory Technology, Design, and Testing (1999 San Jose, Calif.)
“Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA” Metadata:
- Title: ➤ Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (1999 San Jose, Calif.)
- Language: English
- Number of Pages: Median: 131
- Publisher: IEEE Computer Society Press
- Publish Date: 1999
- Publish Location: Los Alamitos, Calif
“Records of the 1999 IEEE International Workshop on Memory Technology, Design, and Testing, August 9-10, 1999, San Jose, California, USA” Subjects and Themes:
- Subjects: Congresses - Random access memory - Testing - Semiconductor storage devices
Edition Identifiers:
- The Open Library ID: OL20862166M
- All ISBNs: 0769502598 - 9780769502595 - 9780769502618 - 076950261X
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
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45Random access audio
By David Miles Huber
“Random access audio” Metadata:
- Title: Random access audio
- Author: David Miles Huber
- Language: English
- Number of Pages: Median: 316
- Publisher: SAMS Pub.
- Publish Date: 1992
- Publish Location: Carmel, Ind., USA
“Random access audio” Subjects and Themes:
- Subjects: Sound - Random access memory - Recording and reproducing - Digital techniques
Edition Identifiers:
- The Open Library ID: OL1751514M
- Library of Congress Control Number (LCCN): 92074672
- All ISBNs: 9780672300868 - 0672300869
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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46Is random access memory random?
By Peter J. Denning
“Is random access memory random?” Metadata:
- Title: ➤ Is random access memory random?
- Author: Peter J. Denning
- Language: English
- Publisher: ➤ Research Institute for Advanced Computer Science, NASA Ames Research Center
- Publish Date: 1986
- Publish Location: [Moffett Field, Calif.?]
“Is random access memory random?” Subjects and Themes:
- Subjects: Random access memory
Edition Identifiers:
- The Open Library ID: OL14663964M
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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47In the matter of certain dynamic random access memories, components thereof and products containing same
investigation no. 337-TA-242.
By United States International Trade Commission.
“In the matter of certain dynamic random access memories, components thereof and products containing same” Metadata:
- Title: ➤ In the matter of certain dynamic random access memories, components thereof and products containing same
- Author: ➤ United States International Trade Commission.
- Language: English
- Publisher: ➤ U.S. International Trade Commission
- Publish Date: 1987
- Publish Location: Washington, DC
“In the matter of certain dynamic random access memories, components thereof and products containing same” Subjects and Themes:
- Subjects: ➤ Computer storage device industry - Computer storage devices - Random access memory - Imports
- Places: United States
Edition Identifiers:
- The Open Library ID: OL17657647M
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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48In the matter of certain memory devices with increased capacitance and products containing same
By United States International Trade Commission.
“In the matter of certain memory devices with increased capacitance and products containing same” Metadata:
- Title: ➤ In the matter of certain memory devices with increased capacitance and products containing same
- Author: ➤ United States International Trade Commission.
- Language: English
- Publisher: ➤ U.S. International Trade Commission
- Publish Date: 1996
- Publish Location: Washington, DC
“In the matter of certain memory devices with increased capacitance and products containing same” Subjects and Themes:
- Subjects: ➤ Computer storage device industry - Computer storage devices - Random access memory
- Places: United States
Edition Identifiers:
- The Open Library ID: OL17696176M
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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49Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
By IEEE International Workshop on Memory Technology, Design and Testing (11th 2003 San Jose, Calif.)
“Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California” Metadata:
- Title: ➤ Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California
- Author: ➤ IEEE International Workshop on Memory Technology, Design and Testing (11th 2003 San Jose, Calif.)
- Language: English
- Number of Pages: Median: 95
- Publisher: IEEE Computer Society
- Publish Date: 2003
- Publish Location: Los Alamitos, Calif
“Records of the 2003 IEEE International Workshop on Memory Technology, Design and Testing, 28-29 July, 2003, San Jose, California” Subjects and Themes:
- Subjects: Congresses - Random access memory - Semiconductor storage devices - Testing
Edition Identifiers:
- The Open Library ID: OL3320310M
- Online Computer Library Center (OCLC) ID: 505738050 - 52962806
- Library of Congress Control Number (LCCN): 2004272254
- All ISBNs: 9780769520049 - 0769520049
Access and General Info:
- First Year Published: 2003
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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502006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan
By IEEE Computer Society
“2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan” Metadata:
- Title: ➤ 2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan
- Author: IEEE Computer Society
- Language: English
- Number of Pages: Median: 83
- Publisher: IEEE Computer Society Press
- Publish Date: 2006
“2006 IEEE International Workshop on Memory Technology, Design, and Testing: 2-4 August 2006, Taipei, Taiwan” Subjects and Themes:
- Subjects: Semiconductor storage devices - Congresses - Testing - Random access memory
Edition Identifiers:
- The Open Library ID: OL10967258M
- Library of Congress Control Number (LCCN): 2006285152
- All ISBNs: 0769525725 - 9780769525723
Author's Alternative Names:
"Ieee Computer Society", "Computer Society Ieee", "Computer Society Staff Ieee" and "IEEE Computer Soc"Access and General Info:
- First Year Published: 2006
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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