MTDT 2004 - Info and Reading Options
records of the 2004 International Workshop on Memory Technology, Design and Testing : 9-10 August, 2004, San Jose, California, USA
By IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.)
"MTDT 2004" was published by IEEE Computer Society in 2004 - Los Alamitos, Calif, it has 121 pages and the language of the book is English.
“MTDT 2004” Metadata:
- Title: MTDT 2004
- Author: ➤ IEEE International Workshop on Memory Technology, Design and Testing (12th 2004 San Jose, Calif.)
- Language: English
- Number of Pages: 121
- Publisher: IEEE Computer Society
- Publish Date: 2004
- Publish Location: Los Alamitos, Calif
“MTDT 2004” Subjects and Themes:
- Subjects: Congresses - Random access memory - Semiconductor storage devices - Testing
Edition Specifications:
- Pagination: vii, 121 p. :
Edition Identifiers:
- The Open Library ID: OL3437786M - OL5858822W
- Online Computer Library Center (OCLC) ID: 56496106
- Library of Congress Control Number (LCCN): 2005295655
- ISBN-10: 0769521932
- All ISBNs: 0769521932
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