Testing and testable design of high-density random-access memories - Info and Reading Options
By Pinaki Mazumder
"Testing and testable design of high-density random-access memories" was published by Kluwer Academic in 1996 - Boston, Mass, it has 386 pages and the language of the book is English.
“Testing and testable design of high-density random-access memories” Metadata:
- Title: ➤ Testing and testable design of high-density random-access memories
- Author: Pinaki Mazumder
- Language: English
- Number of Pages: 386
- Publisher: Kluwer Academic
- Publish Date: 1996
- Publish Location: Boston, Mass
“Testing and testable design of high-density random-access memories” Subjects and Themes:
- Subjects: Random access memory - Testing
Edition Specifications:
- Pagination: xxxviii, 386 p. :
Edition Identifiers:
- The Open Library ID: OL989235M - OL3283165W
- Library of Congress Control Number (LCCN): 96027507
- ISBN-10: 0792397827
- All ISBNs: 0792397827
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