Memory Technology, Design, & Testing International Workshop - Info and Reading Options
By Design and Testing (1998 : San Jose, Calif.) IEEE International Workshop on Memory Technology
"Memory Technology, Design, & Testing International Workshop" was published by IEEE Computer Society Pr in November 1998 - Piscataway, N.J., it has 150 pages and the language of the book is English.
“Memory Technology, Design, & Testing International Workshop” Metadata:
- Title: ➤ Memory Technology, Design, & Testing International Workshop
- Author: ➤ Design and Testing (1998 : San Jose, Calif.) IEEE International Workshop on Memory Technology
- Language: English
- Number of Pages: 150
- Publisher: IEEE Computer Society Pr
- Publish Date: November 1998
- Publish Location: Piscataway, N.J.
Edition Specifications:
- Format: Paperback
- Weight: 12.3 ounces
- Dimensions: 10.8 x 8.5 x 0.3 inches
Edition Identifiers:
- The Open Library ID: OL11390622M - OL9619805W
- ISBN-13: ➤ 9780818684944 - 9780818681011 - 9780818681004 - 9780818684968 - 9780769512426 - 9780769512433 - 9780769512440 - 9780818680991
- ISBN-10: 0818684941
- All ISBNs: ➤ 0818684941 - 9780818684944 - 9780818681011 - 9780818681004 - 9780818684968 - 9780769512426 - 9780769512433 - 9780769512440 - 9780818680991
AI-generated Review of “Memory Technology, Design, & Testing International Workshop”:
"Memory Technology, Design, & Testing International Workshop" Description:
Open Data:
Annotation, The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc
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