Proceedings - Info and Reading Options
2001 IEEE International Workshop on Memory Technology, Design, and Testing : August 6-7, 2001, San Jose, California
By IEEE International Workshop on Memory Technology, Design, and Testing (9th 2001 San Jose, Calif.)
"Proceedings" was published by IEEE Computer Society in 2001 - Los Alamitos, Calif, it has 108 pages and the language of the book is English.
“Proceedings” Metadata:
- Title: Proceedings
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (9th 2001 San Jose, Calif.)
- Language: English
- Number of Pages: 108
- Publisher: IEEE Computer Society
- Publish Date: 2001
- Publish Location: Los Alamitos, Calif
“Proceedings” Subjects and Themes:
- Subjects: Congresses - Random access memory - Semiconductor storage devices - Testing
Edition Specifications:
- Pagination: viii, 108 p. :
Edition Identifiers:
- The Open Library ID: OL3970400M - OL6225753W
- Online Computer Library Center (OCLC) ID: 47860768 - 49326416
- Library of Congress Control Number (LCCN): 2001277459
- ISBN-13: ➤ 9780769512433 - 9780818681011 - 9780818681004 - 9780818684944 - 9780818684968 - 9780769512426 - 9780769512440 - 9780818680991
- ISBN-10: 0769512429 - 0769512437 - 0769512445
- All ISBNs: ➤ 0769512429 - 0769512437 - 0769512445 - 9780769512433 - 9780818681011 - 9780818681004 - 9780818684944 - 9780818684968 - 9780769512426 - 9780769512440 - 9780818680991
AI-generated Review of “Proceedings”:
"Proceedings" Description:
Open Data:
Annotation, The 14 papers in this collection from the August 2001 workshop are divided into five sessions on semiconductor memory design, BIST, redundancy and error control, fault models and multi-port SRAM testing, and verification and testing. Some of the topics are evaluation of redundancy analysis algorithms, a parallel approach for testing multi-port static random access memories, a low output resistance charge pump for flash memory programming, BIST-based bitfail mapping of an embedded DRAM, and an orthogonal transpose- RAM cell array architecture with an alternate bit-line to bit-line contact scheme. No subject index. c. Book News Inc
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