Proceedings - Info and Reading Options
International Workshop on Memory Technology, Design, and Testing
By IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.)

"Proceedings" was published by IEEE Computer Society Press in 1997 - Los Alamitos, Calif, it has 103 pages and the language of the book is English.
“Proceedings” Metadata:
- Title: Proceedings
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (1997 San Jose, Calif.)
- Language: English
- Number of Pages: 103
- Publisher: IEEE Computer Society Press
- Publish Date: 1997
- Publish Location: Los Alamitos, Calif
“Proceedings” Subjects and Themes:
- Subjects: Congresses - Semiconductor storage devices - Testing - Random access memory
Edition Specifications:
- Pagination: ix, 103 p. :
Edition Identifiers:
- The Open Library ID: OL296068M - OL1685355W
- Online Computer Library Center (OCLC) ID: 37597894
- Library of Congress Control Number (LCCN): 97202128
- ISBN-10: 0818680997 - 0818681004 - 0818681012
- All ISBNs: 0818680997 - 0818681004 - 0818681012
AI-generated Review of “Proceedings”:
"Proceedings" Table Of Contents:
- 1- Matching memory to the power of personal computers / R. Foss
- 2- A low-cost, high performance three-dimensional memory module technology / A. Glaser ... [et al.]
- 3- High speed circuit techniques in a 150MHz 64M SDRAM / V. Lines ... [et al.]
- 4- An analysis of (linked) addressed decoder faults / A. van de Goor, G. Gaydadjiev
- 5- SRAM yield estimation in the early stage of the design cycle / V. Kim, T. Chen
- 6- False write through and un-restored write electrical level fault models for SRAMs / R. Adams, E. Cooley
- 7- A defect-tolerant DRAM employing a hierarchical redundancy scheme, built-in self-test and self-reconfiguration / D. Niggemeyer, J. Otterstedt, M. Redeker
- 8- Formal verification of memory arrays using symbolic trajectory evaluation / M. Pandey, R. Bryant
- 9- A product development flow with metrics for memory designs / S. Hegde, I. Pal, K. Rao
- 10- A low-power high storage capacity structure for GaAs MESFET ROM / R. Kanan ... [et al.]
- 11- Use of selective precharge for low-power on the match lines of content-addressable memories / C. Zukowski, S. Wang
- 12- An open notation for memory tests / A. Offerman, A. van de Goor
- 13- Testing memory modules in SRAM-based configurable FPGAs / W. Huang ... [et al.]
- 14- Memory array testing through a scannable configuration / S. Yano, N. Ishiura
- 15- A high-speed parallel sensing scheme for multi-level non-volatile memories / C. Calligaro ... [et al.].
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