MTDT 2009 - Info and Reading Options
2009 IEEE International Workshop on Memory Technology, Design, and Testing : proceedings, 31 August- 2 September 2009, Hsinchu, Taiwan
By IEEE International Workshop on Memory Technology, Design, and Testing (17th 2009 Hsinchu, Taiwan)
"MTDT 2009" was published by IEEE Computer Society in 2009 - Los Alamitos, Calif, it has 95 pages and the language of the book is English.
“MTDT 2009” Metadata:
- Title: MTDT 2009
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (17th 2009 Hsinchu, Taiwan)
- Language: English
- Number of Pages: 95
- Publisher: IEEE Computer Society
- Publish Date: 2009
- Publish Location: Los Alamitos, Calif
“MTDT 2009” Subjects and Themes:
- Subjects: Semiconductor storage devices - Testing - Congresses - Random access memory
Edition Specifications:
- Pagination: xxii, 95 p. :
Edition Identifiers:
- The Open Library ID: OL25044961M - OL16166188W
- Online Computer Library Center (OCLC) ID: 498380290
- Library of Congress Control Number (LCCN): 2010484146
- ISBN-13: 9780769537979
- ISBN-10: 0769537979
- All ISBNs: 0769537979 - 9780769537979
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