Memory Technology, Design, & Testing International Workshop - Info and Reading Options
By Design and Testing (1998 : San Jose, Calif.) IEEE International Workshop on Memory Technology
"Memory Technology, Design, & Testing International Workshop" was published by IEEE Computer Society Pr in November 1998 - Los Alamitos, Calif, it has 150 pages and the language of the book is English.
“Memory Technology, Design, & Testing International Workshop” Metadata:
- Title: ➤ Memory Technology, Design, & Testing International Workshop
- Author: ➤ Design and Testing (1998 : San Jose, Calif.) IEEE International Workshop on Memory Technology
- Language: English
- Number of Pages: 150
- Publisher: IEEE Computer Society Pr
- Publish Date: November 1998
- Publish Location: Los Alamitos, Calif
“Memory Technology, Design, & Testing International Workshop” Subjects and Themes:
- Subjects: ➤ Semiconductor storage devices - Testing - Congresses - Random access memory - Congresses - Conference papers and proceedings
Edition Specifications:
- Format: Paperback
- Weight: 12.3 ounces
- Dimensions: 10.8 x 8.5 x 0.3 inches
Edition Identifiers:
- The Open Library ID: OL11390622M - OL9619805W
- ISBN-13: 9780818684944 - 9780818684968
- ISBN-10: 0818684941
- All ISBNs: 0818684941 - 9780818684944 - 9780818684968
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