Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France - Info and Reading Options
By IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)
"Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France" was published by IEEE Computer Society in 2002 - Los Alamitos, Calif, it has 182 pages and the language of the book is English.
“Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France” Metadata:
- Title: ➤ Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France
- Author: ➤ IEEE International Workshop on Memory Technology, Design and Testing (10th 2002 Isle of Bendor, France)
- Language: English
- Number of Pages: 182
- Publisher: IEEE Computer Society
- Publish Date: 2002
- Publish Location: Los Alamitos, Calif
“Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France” Subjects and Themes:
- Subjects: Congresses - Random access memory - Semiconductor storage devices - Testing - Conference papers and proceedings
Edition Specifications:
- Pagination: xii, 182 p. :
Edition Identifiers:
- The Open Library ID: OL3657293M - OL6016945W
- Online Computer Library Center (OCLC) ID: 50244565 - 50761453
- Library of Congress Control Number (LCCN): 2002512007
- ISBN-13: 9780769516172 - 9780769516189 - 9780769516196
- ISBN-10: 0769516173 - 0769516181 - 076951619X
- All ISBNs: ➤ 0769516173 - 0769516181 - 076951619X - 9780769516172 - 9780769516189 - 9780769516196
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