Explore: 4227
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Source: The Open Library
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1Scanning electron microscopy and x-ray microanalysis
By Goldstein, Joseph, Dale E. Newbury, David joy, Patrick Echlin, Eric Lifshin, Linda Sawyer, Charles E. Lyman and Joseph R. Michael

“Scanning electron microscopy and x-ray microanalysis” Metadata:
- Title: ➤ Scanning electron microscopy and x-ray microanalysis
- Authors: ➤ Goldstein, JosephDale E. NewburyDavid joyPatrick EchlinEric LifshinLinda SawyerCharles E. LymanJoseph R. Michael
- Language: English
- Number of Pages: Median: 689
- Publisher: ➤ Springer London, Limited - Springer - Kluwer Academic/Plenum Publishers - Springer My Copy UK - Island Press
- Publish Date: ➤ 1992 - 2003 - 2004 - 2011 - 2012 - 2013 - 2017
- Publish Location: New York, NY
“Scanning electron microscopy and x-ray microanalysis” Subjects and Themes:
- Subjects: ➤ Scanning electron microscopy - X-ray microanalysis - Scanning electron microscopes - X-rays - X-ray microscopes - Materials science - General - Nanotechnology & mems - Trades & technology -> industrial technology -> materials science - Physical & earth sciences -> science -> general - Biological sciences & nutrition -> biology -> life sciences general - Trades & technology -> technology & engineering -> nanotechnology & mems - Scz17000 - Scz00000 - Sca11007 - Scl26000 - Scz19000 - Scz14000 - 4741 - 2866 - 2883 - 2874 - 4227 - 3460 - Suco11644 - 4305
Edition Identifiers:
- The Open Library ID: ➤ OL50685518M - OL37418708M - OL34522978M - OL34494566M - OL34387478M - OL28435060M - OL28119803M - OL28111033M - OL28039964M - OL22535289M - OL9375319M
- Library of Congress Control Number (LCCN): 2002028276
- All ISBNs: ➤ 0306472929 - 9781493966745 - 1461332745 - 149396674X - 1461276535 - 9781461502166 - 9781461332756 - 9781461332732 - 9781461276531 - 1461502152 - 146130492X - 9780306472923 - 9781461349693 - 9781461304920 - 1461502160 - 1461332753 - 1461349699 - 1461332737 - 9781461502159 - 9781461332749
First Setence:
"The scanning electron microscope (SEM) permits the observation and characterization of heterogeneous organic and inorganic materials on a nanometer (nm) to micrometer (m) scale."
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
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2Handbook of Advanced Plasma Processing Techniques
By Randy J. Shul

“Handbook of Advanced Plasma Processing Techniques” Metadata:
- Title: ➤ Handbook of Advanced Plasma Processing Techniques
- Author: Randy J. Shul
- Language: English
- Number of Pages: Median: 653
- Publisher: ➤ Imprint - Springer - Springer Berlin Heidelberg
- Publish Date: 2000
- Publish Location: Berlin, Heidelberg
“Handbook of Advanced Plasma Processing Techniques” Subjects and Themes:
- Subjects: ➤ Atomic & molecular - Manufacturing - General - Materials science - Physical & earth sciences -> physics -> nuclear & subatomic physics - Trades & technology -> industrial technology -> manufacturing - Trades & technology -> technology & engineering -> general - Trades & technology -> industrial technology -> materials science - Scz19000 - Scp24009 - Scz12000 - Sct22050 - Sct00004 - Scz17000 - 4227 - 2928 - 3148 - 3643 - 2887 - 4741 - Suco11644 - 3714
Edition Identifiers:
- The Open Library ID: OL27042559M
- Online Computer Library Center (OCLC) ID: 840292330
- All ISBNs: 9783642569890 - 3642569897
Access and General Info:
- First Year Published: 2000
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
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3Transmission Electron Microscopy and Diffractometry of Materials
By Brent Fultz

“Transmission Electron Microscopy and Diffractometry of Materials” Metadata:
- Title: ➤ Transmission Electron Microscopy and Diffractometry of Materials
- Author: Brent Fultz
- Language: English
- Number of Pages: Median: 761
- Publisher: ➤ Imprint: Springer - Springer Berlin Heidelberg
- Publish Date: 2013
- Publish Location: Berlin, Heidelberg
“Transmission Electron Microscopy and Diffractometry of Materials” Subjects and Themes:
- Subjects: ➤ Characterization and Evaluation of Materials - Spectrum analysis - Surfaces (Physics) - Thin Films Surfaces and Interfaces - Spectroscopy and Microscopy - Spectroscopy/Spectrometry - Physics - Thin Films Surface and Interface Science - Materials, microscopy - Electron microscopes - X-rays, diffraction - Spectroscopy & spectrum analysis - Materials science - Condensed matter - Physical & earth sciences -> physics -> general - Trades & technology -> industrial technology -> materials science - Physical & earth sciences -> physics -> condensed matter - Scp31090 - Scz17000 - Scc11020 - Scz19000 - Scp25160 - Suco11651 - 2951 - 4741 - 4227 - 4699
Edition Identifiers:
- The Open Library ID: OL27092726M
- All ISBNs: 9783642297618 - 3642297617
Access and General Info:
- First Year Published: 2013
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
Find Transmission Electron Microscopy and Diffractometry of Materials at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.