"Scanning electron microscopy and x-ray microanalysis" - Information and Links:

Scanning electron microscopy and x-ray microanalysis - Info and Reading Options

"Scanning electron microscopy and x-ray microanalysis" was published by Kluwer Academic/Plenum Publishers in 2004 - New York, NY, it has 689 pages and the language of the book is English.


“Scanning electron microscopy and x-ray microanalysis” Metadata:

  • Title: ➤  Scanning electron microscopy and x-ray microanalysis
  • Authors: ➤  
  • Language: English
  • Number of Pages: 689
  • Publisher: ➤  Kluwer Academic/Plenum Publishers
  • Publish Date:
  • Publish Location: New York, NY

“Scanning electron microscopy and x-ray microanalysis” Subjects and Themes:

Edition Specifications:

  • Pagination: xix, 689 p. :

Edition Identifiers:

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