Scanning electron microscopy and x-ray microanalysis - Info and Reading Options
By Goldstein, Joseph, Dale E. Newbury, David joy, Patrick Echlin, Eric Lifshin, Linda Sawyer, Charles E. Lyman and Joseph R. Michael
"Scanning electron microscopy and x-ray microanalysis" was published by Kluwer Academic/Plenum Publishers in 2004 - New York, NY, it has 689 pages and the language of the book is English.
“Scanning electron microscopy and x-ray microanalysis” Metadata:
- Title: ➤ Scanning electron microscopy and x-ray microanalysis
- Authors: ➤ Goldstein, JosephDale E. NewburyDavid joyPatrick EchlinEric LifshinLinda SawyerCharles E. LymanJoseph R. Michael
- Language: English
- Number of Pages: 689
- Publisher: ➤ Kluwer Academic/Plenum Publishers
- Publish Date: 2004
- Publish Location: New York, NY
“Scanning electron microscopy and x-ray microanalysis” Subjects and Themes:
- Subjects: ➤ Scanning electron microscopy - X-ray microanalysis - Scanning electron microscopes - X-rays - X-ray microscopes - Materials science - General - Nanotechnology & mems - Trades & technology -> industrial technology -> materials science - Physical & earth sciences -> science -> general - Biological sciences & nutrition -> biology -> life sciences general - Trades & technology -> technology & engineering -> nanotechnology & mems - Scz17000 - Scz00000 - Sca11007 - Scl26000 - Scz19000 - Scz14000 - 4741 - 2866 - 2883 - 2874 - 4227 - 3460 - Suco11644 - 4305
Edition Specifications:
- Pagination: xix, 689 p. :
Edition Identifiers:
- The Open Library ID: OL22535289M - OL16964847W
- Library of Congress Control Number (LCCN): 2002028276
- ISBN-10: 0306472929
- All ISBNs: 0306472929
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