Transmission Electron Microscopy and Diffractometry of Materials - Info and Reading Options
By Brent Fultz
"Transmission Electron Microscopy and Diffractometry of Materials" was published by Springer Berlin Heidelberg in 2013 - Berlin, Heidelberg, it has 761 pages and the language of the book is English.
“Transmission Electron Microscopy and Diffractometry of Materials” Metadata:
- Title: ➤ Transmission Electron Microscopy and Diffractometry of Materials
- Author: Brent Fultz
- Language: English
- Number of Pages: 761
- Publisher: Springer Berlin Heidelberg
- Publish Date: 2013
- Publish Location: Berlin, Heidelberg
“Transmission Electron Microscopy and Diffractometry of Materials” Subjects and Themes:
- Subjects: ➤ Characterization and Evaluation of Materials - Spectrum analysis - Surfaces (Physics) - Thin Films Surfaces and Interfaces - Spectroscopy and Microscopy - Spectroscopy/Spectrometry - Physics - Thin Films Surface and Interface Science - Materials, microscopy - Electron microscopes - X-rays, diffraction - Spectroscopy & spectrum analysis - Materials science - Condensed matter - Physical & earth sciences -> physics -> general - Trades & technology -> industrial technology -> materials science - Physical & earth sciences -> physics -> condensed matter - Scp31090 - Scz17000 - Scc11020 - Scz19000 - Scp25160 - Suco11651 - 2951 - 4741 - 4227 - 4699
Edition Specifications:
- Format: [electronic resource] /
- Pagination: XX, 761 p. 470 illus.
Edition Identifiers:
- The Open Library ID: OL27092726M - OL19907784W
- ISBN-13: 9783642297618
- All ISBNs: 9783642297618
AI-generated Review of “Transmission Electron Microscopy and Diffractometry of Materials”:
"Transmission Electron Microscopy and Diffractometry of Materials" Table Of Contents:
- 1- <p>Diffraction and X-Ray Powder Diffractometer Problems
- 2- TEM and its Optics Problems
- 3- Neutron Scattering Problems
- 4- Scattering Problems
- 5- Inelastic Electron Scattering and Spectroscopy Problems
- 6- Diffraction from Crystals Sphere Problems
- 7- Electron Diffraction and Crystallography Problems
- 8- Diffraction Contrast in TEM Images Problems
- 9- Diffraction Lineshapes Problems
- 10- Patterson Functions and Diffuse Scattering Problems
- 11- High-Resolution TEM Imaging Problems
- 12- High-Resolution STEM and Related Imaging Techniques Problems
- 13- Dynamical Theory Problems.</p>.
"Transmission Electron Microscopy and Diffractometry of Materials" Description:
The Open Library:
This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam diffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. <br><br>
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