Scanning Electron Microscopy and X-Ray Microanalysis
By Goldstein, Joseph, Dale E. Newbury, David joy, Patrick Echlin, Eric Lifshin, Linda Sawyer, Charles E. Lyman and Joseph R. Michael
"Scanning Electron Microscopy and X-Ray Microanalysis" is published by Springer in 2017 - New York, NY, U.S.A, it has 550 pages and the language of the book is English.
“Scanning Electron Microscopy and X-Ray Microanalysis” Metadata:
- Title: ➤ Scanning Electron Microscopy and X-Ray Microanalysis
- Authors: ➤ Goldstein, JosephDale E. NewburyDavid joyPatrick EchlinEric LifshinLinda SawyerCharles E. LymanJoseph R. Michael
- Language: English
- Number of Pages: 550
- Publisher: Springer
- Publish Date: 2017
- Publish Location: New York, NY, U.S.A
“Scanning Electron Microscopy and X-Ray Microanalysis” Subjects and Themes:
- Subjects: ➤ Scanning electron microscopy - X-ray microanalysis - Scanning electron microscopes - X-rays - X-ray microscopes - Materials science - General - Nanotechnology & mems - Trades & technology -> industrial technology -> materials science - Physical & earth sciences -> science -> general - Biological sciences & nutrition -> biology -> life sciences general - Trades & technology -> technology & engineering -> nanotechnology & mems - Scz17000 - Scz00000 - Sca11007 - Scl26000 - Scz19000 - Scz14000 - 4741 - 2866 - 2883 - 2874 - 4227 - 3460 - Suco11644 - 4305
Edition Specifications:
- Weight: 13.661
Edition Identifiers:
- The Open Library ID: OL34387478M - OL16964847W
- ISBN-13: 9781493966745 - 9781493966769
- All ISBNs: 9781493966745 - 9781493966769
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