Explore: Reliability Engineering
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Source: The Open Library
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1Probabilistic risk assessment
By Ernest J. Henley, E. J. Henley and Hiromitsu Kumamoto
“Probabilistic risk assessment” Metadata:
- Title: Probabilistic risk assessment
- Authors: Ernest J. HenleyE. J. HenleyHiromitsu Kumamoto
- Language: English
- Number of Pages: Median: 568
- Publisher: ➤ Institute of Electrical & Electronics Enginee - IEEE Press
- Publish Date: 1991 - 1992
- Publish Location: New York
“Probabilistic risk assessment” Subjects and Themes:
- Subjects: ➤ Health risk assessment - Reliability (Engineering) - Reliability Engineering - Technology & Industrial Arts - Science/Mathematics - Quality Control
Edition Identifiers:
- The Open Library ID: OL1549232M - OL8129021M
- Online Computer Library Center (OCLC) ID: 24214016
- Library of Congress Control Number (LCCN): 91028802
- All ISBNs: 9780879422905 - 0879422904
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
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2Collision course
By Ralph Nader and Wesley J. Smith
“Collision course” Metadata:
- Title: Collision course
- Authors: Ralph NaderWesley J. Smith
- Language: English
- Number of Pages: Median: 378
- Publisher: Tab Books
- Publish Date: 1993 - 1994
- Publish Location: Blue Ridge Summit, PA
“Collision course” Subjects and Themes:
- Subjects: ➤ Aeronautics - Safety measures - Commercial Aeronautics - Aerospace & aviation technology - Public health & preventive medicine - Reliability engineering - Travel - Safety - Aviation Safety (Engineering) - Transportation - United States - Aviation - General - Aeronautics, Commercial - Essays & Travelogues
- Places: United States
Edition Identifiers:
- The Open Library ID: OL8183640M - OL1400499M
- Online Computer Library Center (OCLC) ID: 28113464
- Library of Congress Control Number (LCCN): 0830672714 - 93008266
- All ISBNs: 0830642714 - 9780830642717
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
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3Reliability and safety of processes and manufacturing systems
By Society of Reliability Engineers. Scandinavian Chapter. Symposium, Y. Malmen and V. Rouhiainen
“Reliability and safety of processes and manufacturing systems” Metadata:
- Title: ➤ Reliability and safety of processes and manufacturing systems
- Authors: ➤ Society of Reliability Engineers. Scandinavian Chapter. SymposiumY. MalmenV. Rouhiainen
- Language: English
- Number of Pages: Median: 382
- Publisher: Elsevier - Chapman & Hall/CRC
- Publish Date: 1991
- Publish Location: New York - London
“Reliability and safety of processes and manufacturing systems” Subjects and Themes:
- Subjects: ➤ Congresses - Reliability (Engineering) - System safety - Reliability Engineering - Mathematics - Science/Mathematics - Quality Control - General - Business & Economics / Quality Control - Reliability (engineering)
Edition Identifiers:
- The Open Library ID: OL1545952M - OL8971267M
- Library of Congress Control Number (LCCN): 91025172
- All ISBNs: 1851667105 - 9781851667109
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
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4TQM for computer software
By Robert H. Dunn and Richard S. Ullman
“TQM for computer software” Metadata:
- Title: TQM for computer software
- Authors: Robert H. DunnRichard S. Ullman
- Language: English
- Number of Pages: Median: 384
- Publisher: Mcgraw-Hill (Tx)
- Publish Date: 1994
“TQM for computer software” Subjects and Themes:
- Subjects: ➤ Computer software - Quality control - Total quality management - Computer programs - Reliability engineering - Computer systems programs - Computer program integrity - Management methods - Production management - Personnel management
Edition Identifiers:
- The Open Library ID: OL9957662M
- Library of Congress Control Number (LCCN): 93038089
- All ISBNs: 9780070183148 - 0070183147
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
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5Reliability engineering and risk analysis
By M. Modarres, Mohammad Modarres, Mark Kaminskiy and Vasiliy Krivtsov
“Reliability engineering and risk analysis” Metadata:
- Title: ➤ Reliability engineering and risk analysis
- Authors: M. ModarresMohammad ModarresMark KaminskiyVasiliy Krivtsov
- Language: English
- Number of Pages: Median: 513
- Publisher: ➤ Taylor & Francis Group - Taylor & Francis, Inc. - CRC Press LLC - CRC Press - CRC - Marcel Dekker
- Publish Date: ➤ 1999 - 2009 - 2010 - 2011 - 2016
- Publish Location: New York - Boca Raton, FL
“Reliability engineering and risk analysis” Subjects and Themes:
- Subjects: ➤ Reliability (Engineering) - Risk assessment - Reliability Engineering - Technology - Technology & Industrial Arts - Science/Mathematics - Engineering - General - General - Quality Control - Technology / Quality Control - Reliability (engineering) - Fiabilité - Évaluation du risque - TECHNOLOGY & ENGINEERING - Engineering (General) - Reference
Edition Identifiers:
- The Open Library ID: ➤ OL51663763M - OL50677834M - OL50662257M - OL50607024M - OL50605131M - OL50598792M - OL33737198M - OL33648007M - OL33563265M - OL33389400M - OL29328534M - OL28884108M - OL8125130M - OL9631512M - OL23643381M - OL22606763M - OL18136646M
- Online Computer Library Center (OCLC) ID: 144565822 - 1038716473
- Library of Congress Control Number (LCCN): 99026668 - 2020691093 - 2009029623
- All ISBNs: ➤ 9781420047059 - 9781498745871 - 1466501766 - 9781498745895 - 1498745881 - 9781439890592 - 9780849392474 - 9781498745888 - 0849392470 - 9781439890585 - 1439890587 - 9781498745901 - 1498745903 - 9781315382425 - 0585156670 - 9781466501768 - 1420047051 - 1315382423 - 9781420008944 - 1498745873 - 1420008943 - 1315320428 - 1439890595 - 9780585156675 - 149874589X - 0824720008 - 9780824720001 - 9781315320427
First Setence:
"Engineering systems, components and devices are not perfect."
"The prediction of failures involves uncertainty, and problems associated with failure are inherently probabilistic. Their solution requires optimal tools to analyze strength of evidence and understand failure events and processes to gauge confidence in a design’s reliability."
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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6Probability, statistics, and reliability for engineers and scientists
By Bilal M. Ayyub and Richard H. McCuen
“Probability, statistics, and reliability for engineers and scientists” Metadata:
- Title: ➤ Probability, statistics, and reliability for engineers and scientists
- Authors: Bilal M. AyyubRichard H. McCuen
- Language: English
- Number of Pages: Median: 663
- Publisher: ➤ Chapman and Hall/CRC - Taylor & Francis Group - Chapman & Hall/CRC - Brand: Chapman and Hall/CRC - CRC Press LLC
- Publish Date: ➤ 2002 - 2003 - 2016 - 2024 - 2025
- Publish Location: Boca Raton
“Probability, statistics, and reliability for engineers and scientists” Subjects and Themes:
- Subjects: ➤ Reliability (Engineering) - Engineering mathematics - Mathematics for scientists & engineers - Probability & statistics - Quality Control - Reliability Engineering - Mathematics - Technology & Industrial Arts - Science/Mathematics - Engineering - Civil - Probability & Statistics - General - Mathematics / Statistics - General - Engineering
Edition Identifiers:
- The Open Library ID: ➤ OL51665096M - OL57738519M - OL22574978M - OL29233060M - OL57744070M - OL8795299M - OL33686426M - OL54040957M - OL54024944M - OL33758479M - OL33420772M - OL57753307M
- Online Computer Library Center (OCLC) ID: 49226415
- Library of Congress Control Number (LCCN): 2002276810 - 2024040896
- All ISBNs: ➤ 1040305431 - 1032917903 - 1032967714 - 9781439895337 - 1040063608 - 9781032967714 - 0429112475 - 1439895333 - 9781040305454 - 0429258321 - 9780429112478 - 9781439809525 - 9781040063606 - 1584882867 - 1466501669 - 1040305458 - 1439809526 - 9781032917900 - 9780429258329 - 9781040305430 - 9781584882862 - 9781466501669
First Setence:
"The processes of engineering analysis and design can be systematically performed within a systems framework."
Author's Alternative Names:
"Bilal Ayyub"Access and General Info:
- First Year Published: 2002
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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7Operational reliability and systematic maintenance
By K. Holmberg, Kenneth Holmberg, A Folkeson, B Bergman, R Ostvik and C Aage
“Operational reliability and systematic maintenance” Metadata:
- Title: ➤ Operational reliability and systematic maintenance
- Authors: ➤ K. HolmbergKenneth HolmbergA FolkesonB BergmanR OstvikC Aage
- Language: English
- Number of Pages: Median: 347
- Publisher: ➤ Chapman and Hall/CRC - Elsevier Applied Science - Chapman & Hall/CRC - Taylor & Francis Group
- Publish Date: 1991 - 1992 - 2017 - 2018
- Publish Location: New York - London
“Operational reliability and systematic maintenance” Subjects and Themes:
- Subjects: ➤ Reliability (Engineering) - Reliability - Maintainability (Engineering) - Accelerated life testing - Industrial equipment - Reliability Engineering - Technology & Industrial Arts - Science/Mathematics - General - Quality Control - Business & Economics / Quality Control - Reliability (engineering) - Maintainability (engineering) - Fiabilité - Maintenabilité - Essais accélérés (Technologie) - Entreprises - Équipement - Accelerated aging - TECHNOLOGY & ENGINEERING - Engineering (General) - Reference
Edition Identifiers:
- The Open Library ID: ➤ OL8971209M - OL33598140M - OL33684883M - OL33764428M - OL33587522M - OL1533450M - OL33764366M
- Online Computer Library Center (OCLC) ID: 1020698483
- Library of Congress Control Number (LCCN): 91011181
- All ISBNs: ➤ 1315896087 - 9781351075183 - 9781351100533 - 1851666125 - 1351075187 - 1351083635 - 9781315896083 - 1351092081 - 9781351092081 - 135110053X - 9781351083638 - 9781851666126
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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8What every engineer should know about risk engineering and management
By John X. Wang and Marvin L. Roush
“What every engineer should know about risk engineering and management” Metadata:
- Title: ➤ What every engineer should know about risk engineering and management
- Authors: John X. WangMarvin L. Roush
- Language: English
- Number of Pages: Median: 264
- Publisher: ➤ CRC - Taylor & Francis Group - Marcel Dekker, Inc.
- Publish Date: 2000
- Publish Location: New York
“What every engineer should know about risk engineering and management” Subjects and Themes:
- Subjects: ➤ Risk management - Reliability (Engineering) - Risk assessment - Reliability engineering - Quality Control - Technology - Technology & Industrial Arts - Science/Mathematics - Engineering - Industrial - Technology / Engineering / General - Engineering - General - Fiabilité - Évaluation du risque - Gestion du risque - TECHNOLOGY & ENGINEERING / Industrial Health & Safety - TECHNOLOGY & ENGINEERING / Quality Control
Edition Identifiers:
- The Open Library ID: OL33742819M - OL22150043M - OL33513118M - OL8160688M
- Online Computer Library Center (OCLC) ID: 1046995100 - 43076863
- Library of Congress Control Number (LCCN): 99087829
- All ISBNs: ➤ 9780429175183 - 0429175183 - 0824793013 - 1482293579 - 9780824793012 - 9781482293579
First Setence:
"Risk in general arises because of uncertainty."
Access and General Info:
- First Year Published: 2000
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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9Flat-Plate Solar Array Project
By Flat-plate Solar Array Project. Project Integration Meeting
“Flat-Plate Solar Array Project” Metadata:
- Title: Flat-Plate Solar Array Project
- Author: ➤ Flat-plate Solar Array Project. Project Integration Meeting
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1985
- Publish Location: ➤ [Washington, DC - Springfield, Va
“Flat-Plate Solar Array Project” Subjects and Themes:
- Subjects: ➤ Crystal growth - Flat plates - Reliability engineering - Conferences - Electrochemistry - Solar arrays
Edition Identifiers:
- The Open Library ID: OL15416499M - OL18082802M - OL18007861M - OL14985518M
Access and General Info:
- First Year Published: 1985
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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10Universal first-order reliability concept applied to semistatic structures
By V. Verderaime
“Universal first-order reliability concept applied to semistatic structures” Metadata:
- Title: ➤ Universal first-order reliability concept applied to semistatic structures
- Author: V. Verderaime
- Language: English
- Number of Pages: Median: 11
- Publisher: ➤ National Aeronautics and Space Administration, Marshall Space Flight Center - George C. Marshall Space flight Center - National Technical Information Service, distributor
- Publish Date: 1994
- Publish Location: ➤ [Springfield, Va - MSFC, Ala - Huntsville, Ala
“Universal first-order reliability concept applied to semistatic structures” Subjects and Themes:
- Subjects: Structural reliability - Structural design - Reliability engineering - Structural engineering
Edition Identifiers:
- The Open Library ID: OL19753428M - OL18083199M - OL16982143M - OL15417481M
- Online Computer Library Center (OCLC) ID: 33433493
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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11Multi-disciplinary system reliability analysis
By Sankaran Mahadevan
“Multi-disciplinary system reliability analysis” Metadata:
- Title: ➤ Multi-disciplinary system reliability analysis
- Author: Sankaran Mahadevan
- Language: English
- Publisher: ➤ Available from NASA Center for Aerospace Information - National Technical Information Service, distributor - National Aeronautics and Space Administration - National Aeronautics and Space Administration, Glenn Research Center
- Publish Date: 1997 - 2001
- Publish Location: ➤ [Washington, DC - [Cleveland, Ohio] - Springfield, Va - Hanover, MD
“Multi-disciplinary system reliability analysis” Subjects and Themes:
- Subjects: ➤ Estimating - Failure analysis - Failure modes - Fluid flow - Fluid mechanics - Heat exchangers - Mechanical properties - Procedures - Reliability analysis - Reliability engineering - Structural analysis - Structural engineering - Systems analysis
Edition Identifiers:
- The Open Library ID: OL16025841M - OL17134228M - OL15547925M - OL17597463M
- Online Computer Library Center (OCLC) ID: 42334283
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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12Achievement and assurance of safety
By Safety-Critical Systems Symposium (3rd 1995 Brighton, England), Felix Redmill and Tom Anderson
“Achievement and assurance of safety” Metadata:
- Title: ➤ Achievement and assurance of safety
- Authors: ➤ Safety-Critical Systems Symposium (3rd 1995 Brighton, England)Felix RedmillTom Anderson
- Language: English
- Number of Pages: Median: 329
- Publisher: Springer
- Publish Date: 1995 - 2011
- Publish Location: London - New York
“Achievement and assurance of safety” Subjects and Themes:
- Subjects: ➤ Congresses - Industrial safety - Reliability - Automatic control - Applications of Computing - Engineering: general - Health & safety aspects of computing - Reliability engineering - Industrial Health & Safety - Computers - Technology & Industrial Arts - Computer Books: Languages - Science/Mathematics - Programming - Software Development
Edition Identifiers:
- The Open Library ID: OL1120313M - OL28109514M - OL9054316M
- Library of Congress Control Number (LCCN): 94046761
- All ISBNs: 9783540199229 - 9781447130048 - 3540199225 - 1447130049
Access and General Info:
- First Year Published: 1995
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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13Reliability fundamentals
By Vasile M. Cătuneanu, Vasile M. Catuneanu and Adrian N. Mihalache
“Reliability fundamentals” Metadata:
- Title: Reliability fundamentals
- Authors: Vasile M. CătuneanuVasile M. CatuneanuAdrian N. Mihalache
- Language: English
- Number of Pages: Median: 240
- Publisher: ➤ Elsevier - Elsevier Science Publishing Company - Editura Academiei
- Publish Date: 1989
- Publish Location: ➤ Oxford - Bucharest - New-York - Amsterdam
“Reliability fundamentals” Subjects and Themes:
- Subjects: ➤ Reliability (Engineering) - Electronics & Communications Engineering - Mathematics - Mechanical engineering - Reliability engineering - Quality Control - Technology & Industrial Arts - Science/Mathematics - Fiabilité - Ingénierie des systèmes - Détection de défaut (ingénierie)
Edition Identifiers:
- The Open Library ID: OL10261451M - OL21440758M - OL2059333M
- Online Computer Library Center (OCLC) ID: 18869896
- Library of Congress Control Number (LCCN): 88038601
- All ISBNs: 0444988793 - 9780444988799
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
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141998 IEEE International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1998 Lake Tahoe, Calif.), IEEE Reliability Society, Institute of Electrical and Electronics Engineers, IEEE Electron Devices Society and Ieee Reliability Society
“1998 IEEE International Integrated Reliability Workshop final report” Metadata:
- Title: ➤ 1998 IEEE International Integrated Reliability Workshop final report
- Authors: ➤ International Integrated Reliability Workshop (1998 Lake Tahoe, Calif.)IEEE Reliability SocietyInstitute of Electrical and Electronics EngineersIEEE Electron Devices SocietyIeee Reliability Society
- Language: English
- Number of Pages: Median: 140
- Publisher: ➤ IEEE Reliability Society - IEEE Electron Devices Society - Institute of Electrical & Electronics Enginee - IEEE Standards Office
- Publish Date: 1998 - 2000
- Publish Location: Piscataway, New Jersey
“1998 IEEE International Integrated Reliability Workshop final report” Subjects and Themes:
- Subjects: ➤ Reliability - Congresses - Integrated circuits - Wafer-scale integration - Circuits & components - Reliability engineering - c 1990 to c 2000 - Technology & Industrial Arts - Engineering - Electrical & Electronic - Technology - Science/Mathematics - Electronics - Circuits - General - Electronics - Microelectronics
Edition Identifiers:
- The Open Library ID: OL8083243M - OL396821M - OL8083242M
- Online Computer Library Center (OCLC) ID: 40670900
- Library of Congress Control Number (LCCN): 98084868
- All ISBNs: 0780348818 - 9780780348813 - 9780780348820 - 0780348826
Author's Alternative Names:
"Institute of Electrical & Electronics En", "Institute of Electrical and Electronics Engineers", "IEEE" and "Ieee"Access and General Info:
- First Year Published: 1998
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
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15Techlash
By Ian I. Mitroff
“Techlash” Metadata:
- Title: Techlash
- Author: Ian I. Mitroff
- Language: English
- Number of Pages: Median: 55
- Publisher: ➤ Springer Nature - Springer International Publishing AG
- Publish Date: 2020
- Publish Location: Cham
“Techlash” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL35848169M - OL31368722M - OL35880274M
- All ISBNs: ➤ 9783030432812 - 9783030432782 - 3030432815 - 3030432793 - 3030432785 - 9783030432799
Access and General Info:
- First Year Published: 2020
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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16Reliability theory and applications
By China-Japan Reliability Symposium (1987 Shanghai, China, etc.), Shunji Osaki and Jinhua Cao
“Reliability theory and applications” Metadata:
- Title: ➤ Reliability theory and applications
- Authors: ➤ China-Japan Reliability Symposium (1987 Shanghai, China, etc.)Shunji OsakiJinhua Cao
- Language: English
- Number of Pages: Median: 441
- Publisher: ➤ World Scientific Pub. Co. - World Scientific Pub Co Inc
- Publish Date: 1987
- Publish Location: Singapore - Teaneck, N.J
“Reliability theory and applications” Subjects and Themes:
- Subjects: ➤ Reliability (Engineering) - Congresses - Mathematics for scientists & engineers - Reliability Engineering - Science/Mathematics
Edition Identifiers:
- The Open Library ID: OL17928053M - OL13212627M
- Online Computer Library Center (OCLC) ID: 17432855
- All ISBNs: 9971503476 - 9789971503475
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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17The principles of flight test assessment of flight-safety-critical systems in helicopters
By J. D. L. Gregory
“The principles of flight test assessment of flight-safety-critical systems in helicopters” Metadata:
- Title: ➤ The principles of flight test assessment of flight-safety-critical systems in helicopters
- Author: J. D. L. Gregory
- Language: English
- Number of Pages: Median: 24
- Publisher: AGARD - Agard
- Publish Date: 1994
- Publish Location: ➤ Neuilly sur Seine - Neuilly sur Seine, France
“The principles of flight test assessment of flight-safety-critical systems in helicopters” Subjects and Themes:
- Subjects: Flight control - Flight tests - Helicopters - Reliability engineering
Edition Identifiers:
- The Open Library ID: OL21461854M - OL19005516M - OL19753652M
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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181996 International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1996 Lake Tahoe, California), Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe and California) International Integrated Reliability Workshop (1996 : Lake Tahoe
“1996 International Integrated Reliability Workshop final report” Metadata:
- Title: ➤ 1996 International Integrated Reliability Workshop final report
- Authors: ➤ International Integrated Reliability Workshop (1996 Lake Tahoe, California)Calif.) International Integrated Reliability Workshop (2001 : Lake TahoeCalifornia) International Integrated Reliability Workshop (1996 : Lake Tahoe
- Language: English
- Number of Pages: Median: 175
- Publisher: ➤ IEEE Electron Devices Society - Institute of Electrical & Electronics Enginee - IEEE Reliability Society
- Publish Date: 1996 - 1997
- Publish Location: [New York]
“1996 International Integrated Reliability Workshop final report” Subjects and Themes:
- Subjects: ➤ Congresses - Reliability - Integrated circuits - Wafer scale integration - Electronic devices & materials - Reliability Engineering - Technology - Microelectronics - Education / Teaching - Science/Mathematics - Electronics - Circuits - General - General - Electronics - Microelectronics - Wafer-scale integration
Edition Identifiers:
- The Open Library ID: OL8082988M - OL8082987M - OL1019542M
- Online Computer Library Center (OCLC) ID: 36908636
- Library of Congress Control Number (LCCN): 96077509
- All ISBNs: 9780780335981 - 9780780335998 - 0780335988 - 0780335996
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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19Mathematical theory of reliability
By Richard E. Barlow and Frank Proschan
“Mathematical theory of reliability” Metadata:
- Title: ➤ Mathematical theory of reliability
- Authors: Richard E. BarlowFrank Proschan
- Language: English
- Number of Pages: Median: 258
- Publisher: ➤ Society for Industrial Mathematics - SIAM - Wiley
- Publish Date: 1965 - 1987 - 1996
- Publish Location: Philadelphia - New York
“Mathematical theory of reliability” Subjects and Themes:
- Subjects: ➤ Probabilities - Mathematical models - Mathematical statistics - Reliability (Engineering) - Reliabiltiy (Engineering) - Applied mathematics - Technology - Quality Control - Reliability Engineering - Technology & Industrial Arts - Science/Mathematics - General - Mathematics / General
Edition Identifiers:
- The Open Library ID: OL8271806M - OL5921550M - OL976809M
- Online Computer Library Center (OCLC) ID: 34473511 - 373392
- Library of Congress Control Number (LCCN): 64025897 - 96013952
- All ISBNs: 9780898713695 - 0898713692
First Setence:
"This is a necessarily incomplete but, we hope, representative survey of the events, people, and literature which have come to be associated with what is now called the mathematical theory of reliability."
Access and General Info:
- First Year Published: 1965
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: Unclassified
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20Risk engineering
By Adrian Gheorghe, A.V. Gheorghe and R. Mock
“Risk engineering” Metadata:
- Title: Risk engineering
- Authors: Adrian GheorgheA.V. GheorgheR. Mock
- Language: English
- Number of Pages: Median: 279
- Publisher: Springer - Kluwer Academic
- Publish Date: 1999
- Publish Location: London - Dordrecht
“Risk engineering” Subjects and Themes:
- Subjects: ➤ Risk assessment - Technology - Industrial quality control - Reliability engineering - Risk assessment & analysis for business - Safety - Industrial Safety - Technological Risk Assessment - Technology & Industrial Arts - Science/Mathematics - General - Industrial Health & Safety - Technology / Engineering / Industrial - Engineering - General
Edition Identifiers:
- The Open Library ID: OL22623909M - OL9878873M
- All ISBNs: 0792355741 - 9780792355748
First Setence:
"Industrial development is generally agreed to he essential to the improvement of the standard of living in all countries."
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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21Defect recognition and image processing in semiconductors 1997
By International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany), Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, J. Donecker and I. Rechenberg
“Defect recognition and image processing in semiconductors 1997” Metadata:
- Title: ➤ Defect recognition and image processing in semiconductors 1997
- Authors: ➤ International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany)Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : TemplinJ. DoneckerI. Rechenberg
- Language: English
- Number of Pages: Median: 524
- Publisher: ➤ Institute of Physics Pub. - Taylor & Francis
- Publish Date: 1998
- Publish Location: Philadelphia - Bristol
“Defect recognition and image processing in semiconductors 1997” Subjects and Themes:
- Subjects: ➤ Congresses - Semiconductors - Image processing - Defects - Condensed matter physics (liquids & solids) - Materials science - Semi-conductors & super-conductors - Technology - Reliability Engineering - Science - Solid State Physics - Science/Mathematics - Science / Solid State Physics - Electronics - Semiconductors
Edition Identifiers:
- The Open Library ID: OL700714M - OL7971014M
- Online Computer Library Center (OCLC) ID: 38130571
- Library of Congress Control Number (LCCN): 97049019
- All ISBNs: 9780750305006 - 0750305002
Access and General Info:
- First Year Published: 1998
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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22Bayesian methods for statistical estimation with application to reliability
By V. P. Savchuk and Chris P. Tsokos
“Bayesian methods for statistical estimation with application to reliability” Metadata:
- Title: ➤ Bayesian methods for statistical estimation with application to reliability
- Authors: V. P. SavchukChris P. Tsokos
- Language: English
- Publisher: ➤ World Federation Publishers - World Federation Pub Inc
- Publish Date: 1996 - 2000
- Publish Location: Atlanta, GA
“Bayesian methods for statistical estimation with application to reliability” Subjects and Themes:
- Subjects: ➤ Statistical methods - Bayesian statistical decision theory - Reliability (Engineering) - Bayesian Statistics - Bayesian statistical decision - Reliability Engineering
Edition Identifiers:
- The Open Library ID: OL981323M - OL8705165M
- Online Computer Library Center (OCLC) ID: 34669319
- Library of Congress Control Number (LCCN): 96018907
- All ISBNs: 1885978081 - 9781885978080
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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23Science of Societal Safety
By Seiji Abe
“Science of Societal Safety” Metadata:
- Title: Science of Societal Safety
- Author: Seiji Abe
- Language: English
- Number of Pages: Median: 227
- Publisher: ➤ Springer Nature - Springer Singapore Pte. Limited
- Publish Date: 2018 - 2019
- Publish Location: Singapore
“Science of Societal Safety” Subjects and Themes:
- Subjects: Central government policies - Sociology - Crime & criminology - Reliability engineering - Fire protection & safety
Edition Identifiers:
- The Open Library ID: OL34733678M - OL31369569M
- All ISBNs: 9789811327742 - 9789811327759 - 9811327750 - 9811327742
Access and General Info:
- First Year Published: 2018
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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24The Coupling of Safety and Security
By Corinne Bieder
“The Coupling of Safety and Security” Metadata:
- Title: ➤ The Coupling of Safety and Security
- Author: Corinne Bieder
- Language: English
- Number of Pages: Median: 113
- Publisher: ➤ Springer Nature - Springer International Publishing AG
- Publish Date: 2020
“The Coupling of Safety and Security” Subjects and Themes:
- Subjects: ➤ Security & fire alarm systems - Crime & criminology - Economics of industrial organisation - Reliability engineering - Computer security
Edition Identifiers:
- The Open Library ID: OL35838913M - OL31374027M
- All ISBNs: 9783030472290 - 3030472280 - 9783030472283 - 3030472299
Access and General Info:
- First Year Published: 2020
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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25Optimal reliability design
By Way Kuo, V. Rajendra Prasad, Frank A. Tillman and Ching-Lai Hwang
“Optimal reliability design” Metadata:
- Title: Optimal reliability design
- Authors: Way KuoV. Rajendra PrasadFrank A. TillmanChing-Lai Hwang
- Language: English
- Number of Pages: Median: 420
- Publisher: Cambridge University Press
- Publish Date: 2001
- Publish Location: Cambridge, U.K - New York
“Optimal reliability design” Subjects and Themes:
- Subjects: ➤ Reliability (Engineering) - Engineering: general - Reliability Engineering - Technology - Technology & Industrial Arts - Science/Mathematics - Engineering - General - Quality Control - Technology / General
Edition Identifiers:
- The Open Library ID: OL7753537M - OL18156584M
- Online Computer Library Center (OCLC) ID: 43311869
- Library of Congress Control Number (LCCN): 00021911
- All ISBNs: 9780521781275 - 0521781272
First Setence:
"Reliability engineering appeared on the scene in the late 1940s and early 1950s and was first applied to communication and transportation systems."
Access and General Info:
- First Year Published: 2001
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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26Avoidance of cavitation damage
By Wolfgang Tillner, Wilfried J. Bartz, Horst Fritsch, Rudolf Kruft, Wilfried Lehmann, Hartmut Louis and Gunther Masendorf
“Avoidance of cavitation damage” Metadata:
- Title: Avoidance of cavitation damage
- Authors: ➤ Wolfgang TillnerWilfried J. BartzHorst FritschRudolf KruftWilfried LehmannHartmut LouisGunther Masendorf
- Language: English
- Number of Pages: Median: 267
- Publisher: ➤ Mechanical Engineering Publications - Wiley
- Publish Date: 1993 - 2005
- Publish Location: London
“Avoidance of cavitation damage” Subjects and Themes:
- Subjects: ➤ Pumping machinery - Fluid dynamics - Cavitation - Mechanical engineering - Mechanics of fluids - Reliability engineering - Fracture Mechanics - Technology - Technology & Industrial Arts - Science/Mathematics - Engineering - Mechanical - Technology / Fracture Mechanics - Fluids
Edition Identifiers:
- The Open Library ID: OL1503701M - OL8283033M
- Online Computer Library Center (OCLC) ID: 27768605
- Library of Congress Control Number (LCCN): 93183047
- All ISBNs: 0852988079 - 9780852988077
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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27Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001
By International Symposium on the Physical & Failure Analysis of Integrated Circuits (8th 2001 Singapore), International Symposium on the Physical & Failure Analysis of Integrated Circuits (8th : 2001 : Singapore) and Wilson Tan
“Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001” Metadata:
- Title: ➤ Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001
- Authors: ➤ International Symposium on the Physical & Failure Analysis of Integrated Circuits (8th 2001 Singapore)International Symposium on the Physical & Failure Analysis of Integrated Circuits (8th : 2001 : Singapore)Wilson Tan
- Language: English
- Number of Pages: Median: 262
- Publisher: Ieee - IEEE
- Publish Date: 2001
- Publish Location: Piscataway, New Jersey
“Proceedings of the 2001 8th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2001” Subjects and Themes:
- Subjects: ➤ Congresses - Integrated circuits - Testing - Defects - Circuits & components - Reliability Engineering - Technology - Science/Mathematics - Electronics - Circuits - Integrated - Quality Control
Edition Identifiers:
- The Open Library ID: OL11000066M - OL22461479M
- Online Computer Library Center (OCLC) ID: 47860163
- Library of Congress Control Number (LCCN): 00110824
- All ISBNs: 9780780366756 - 0780366751
Access and General Info:
- First Year Published: 2001
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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28Data-driven methods for fault detection and diagnosis in chemical processes
By Evan Russell, Evan L. Russell, Leo H. Chiang and Richard D. Braatz
“Data-driven methods for fault detection and diagnosis in chemical processes” Metadata:
- Title: ➤ Data-driven methods for fault detection and diagnosis in chemical processes
- Authors: Evan RussellEvan L. RussellLeo H. ChiangRichard D. Braatz
- Language: English
- Number of Pages: Median: 192
- Publisher: Springer
- Publish Date: 2000
- Publish Location: New York - London
“Data-driven methods for fault detection and diagnosis in chemical processes” Subjects and Themes:
- Subjects: ➤ Chemical process control - Data processing - Fault location (Engineering) - Data capture & analysis - Industrial chemistry - Technology - Engineering - Industrial - Chemical Engineering Operations - Reliability Engineering - Technology & Industrial Arts - Science/Mathematics - Computer Science - Engineering - Chemical & Biochemical - Computers-Computer Science - Science / Chemistry / Technical & Industrial - Technology / Engineering / Chemical & Biochemical - Technology-Engineering - Industrial - Quality Control - Production engineering - Chemical processes
Edition Identifiers:
- The Open Library ID: OL8974079M - OL17716387M
- Online Computer Library Center (OCLC) ID: 43541252
- Library of Congress Control Number (LCCN): 00027317
- All ISBNs: 9781852332587 - 1852332581
First Setence:
"In the chemical and other related industries, there has been a large push to produce higher quality products, to reduce product rejection rates, and to satisfy increasingly stringent safety and environmental regulations."
Access and General Info:
- First Year Published: 2000
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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29Integrated risk assessment
By Conference on Integrated Risk Assessment (3rd 1998 Newcastle, New South Wales, Australia) and Stewart.
“Integrated risk assessment” Metadata:
- Title: Integrated risk assessment
- Authors: ➤ Conference on Integrated Risk Assessment (3rd 1998 Newcastle, New South Wales, Australia)Stewart.
- Language: English
- Number of Pages: Median: 144
- Publisher: ➤ A.A. Balkema - Taylor & Francis
- Publish Date: 1998
- Publish Location: Rotterdam - Brookfield
“Integrated risk assessment” Subjects and Themes:
- Subjects: ➤ Congresses - Risk assessment - Building construction & materials - Engineering measurement & calibration - Reliability engineering - Industrial Health & Safety - Technology - Technology & Industrial Arts
Edition Identifiers:
- The Open Library ID: OL18131123M - OL12809173M
- Online Computer Library Center (OCLC) ID: 40603465
- All ISBNs: 9789054109587 - 9054109580
Author's Alternative Names:
"STEWART" and "Stewart"Access and General Info:
- First Year Published: 1998
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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30Robust rocket engine concept
By Carl F. Lorenzo
“Robust rocket engine concept” Metadata:
- Title: Robust rocket engine concept
- Author: Carl F. Lorenzo
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1995
- Publish Location: ➤ [Washington, DC] - [Springfield, Va
“Robust rocket engine concept” Subjects and Themes:
- Subjects: ➤ Cumulative damage - Durability - Engine control - Multidisciplinary design optimization - Reliability engineering - Reusable rocket engines - Rocket engine design - Service life
Edition Identifiers:
- The Open Library ID: OL15414480M - OL17791987M
- Online Computer Library Center (OCLC) ID: 33973348
Access and General Info:
- First Year Published: 1995
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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31Illustrated structural application of universal first-order reliability method
By V. Verderaime
“Illustrated structural application of universal first-order reliability method” Metadata:
- Title: ➤ Illustrated structural application of universal first-order reliability method
- Author: V. Verderaime
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration, Marshall Space Flight Center - National Technical Information Service, distributor
- Publish Date: 1994
- Publish Location: [Springfield, Va - MSFC, Ala
“Illustrated structural application of universal first-order reliability method” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL15403776M - OL17788400M
- Online Computer Library Center (OCLC) ID: 32230381
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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322000 IEEE International Reliability Physics Symposium
By International Reliability Physics Symposium (38th 2000 San Jose, Calif.), Ch&&&&& and Institute of Electrical and Electronics Engineers
“2000 IEEE International Reliability Physics Symposium” Metadata:
- Title: ➤ 2000 IEEE International Reliability Physics Symposium
- Authors: ➤ International Reliability Physics Symposium (38th 2000 San Jose, Calif.)Ch&&&&&Institute of Electrical and Electronics Engineers
- Language: English
- Number of Pages: Median: 456
- Publisher: ➤ IEEE - Institute of Electrical & Electronics Enginee
- Publish Date: 2000
- Publish Location: Piscataway, New Jersey
“2000 IEEE International Reliability Physics Symposium” Subjects and Themes:
- Subjects: ➤ Reliability - Congresses - Electronic apparatus and appliances - Circuits & components - Electronic devices & materials - Reliability Engineering - Electronic Apparatus And Devices - Technology - Technology & Industrial Arts - Science/Mathematics - General - Physics - Electronics - Circuits - General
Edition Identifiers:
- The Open Library ID: OL18175032M - OL10999692M
- All ISBNs: ➤ 0780358600 - 0780358619 - 9780780358614 - 0780358627 - 9780780358621 - 9780780358607
Author's Alternative Names:
"Institute of Electrical and Electronics Engineers", "IEEE", "Institute of Electrical & Electronics En" and "Ieee"Access and General Info:
- First Year Published: 2000
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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33HOW DID THAT HAPPEN?--ENGINEERING SAFETY AND RELIABILITY
By WILLIAM WONG and William Wong
“HOW DID THAT HAPPEN?--ENGINEERING SAFETY AND RELIABILITY” Metadata:
- Title: ➤ HOW DID THAT HAPPEN?--ENGINEERING SAFETY AND RELIABILITY
- Authors: WILLIAM WONGWilliam Wong
- Languages: English - und
- Number of Pages: Median: 227
- Publisher: PROF. ENGINEERING PUB. - Wiley
- Publish Date: 2002
- Publish Location: LONDON
“HOW DID THAT HAPPEN?--ENGINEERING SAFETY AND RELIABILITY” Subjects and Themes:
- Subjects: ➤ Engineering: general - Occupational / industrial health & safety - Reliability engineering - Technology & Engineering - Technology & Industrial Arts - Science/Mathematics - Drafting & Mechanical Drawing - Technology / Drafting & Mechanical Drawing - Facility Management - Reliability (engineering) - Disasters - Industrial safety
Edition Identifiers:
- The Open Library ID: OL12053919M - OL22522942M
- All ISBNs: 9781860583599 - 1860583598
Access and General Info:
- First Year Published: 2002
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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34RADECS 97
By European Conference on Radiation and its Effects on Components and Systems (4th 1997 Cannes, France), IEEE Nuclear & Plasma Science Society and Th&&&&
“RADECS 97” Metadata:
- Title: RADECS 97
- Authors: ➤ European Conference on Radiation and its Effects on Components and Systems (4th 1997 Cannes, France)IEEE Nuclear & Plasma Science SocietyTh&&&&
- Language: English
- Number of Pages: Median: 619
- Publisher: ➤ Institute of Electrical & Electronics Enginee - IEEE
- Publish Date: 1997 - 1998
- Publish Location: Piscataway, New Jersey
“RADECS 97” Subjects and Themes:
- Subjects: ➤ Effect of radiation on - Congresses - Electronic apparatus and appliances - Computer Hardware & Operating Systems - Electronics & Communications Engineering - Nuclear chemistry, photochemistry & radiation - Radioactivity - Reliability Engineering - Science - Science/Mathematics - Electronics - General - Radiation - Solid State Physics - Physics
Edition Identifiers:
- The Open Library ID: OL21043564M - OL10999100M
- Online Computer Library Center (OCLC) ID: 39702628
- Library of Congress Control Number (LCCN): 97072652
- All ISBNs: 078034071X - 9780780340718 - 9780780340725 - 0780340728
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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35Evaluation of reliability modeling tools for advanced fault tolerant systems
By Robert Baker
“Evaluation of reliability modeling tools for advanced fault tolerant systems” Metadata:
- Title: ➤ Evaluation of reliability modeling tools for advanced fault tolerant systems
- Author: Robert Baker
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration, Langley Research Center - For sale by the National Technical Information Service - Center for Digital Systems Research, Research Triangle Institute
- Publish Date: 1986
- Publish Location: ➤ [Springfield, Va - Research Triangle Park, N.C - Hampton, Va
“Evaluation of reliability modeling tools for advanced fault tolerant systems” Subjects and Themes:
- Subjects: ➤ Architecture (Computers) - Spacecraft design - Applications programs (Computers) - Multiprocessing (Computers) - Flight control - Reliability engineering - Aircraft design - Fault tolerance
Edition Identifiers:
- The Open Library ID: OL17684477M - OL14985826M
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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36Impact of reworking ceramic area array packages on the integrity of the printed board laminate
By P. E. Tegehall
“Impact of reworking ceramic area array packages on the integrity of the printed board laminate” Metadata:
- Title: ➤ Impact of reworking ceramic area array packages on the integrity of the printed board laminate
- Author: P. E. Tegehall
- Language: English
- Number of Pages: Median: 16
- Publisher: ➤ ESA Publications Division, ESTEC
- Publish Date: 2005
- Publish Location: Noordwijk, The Netherlands
“Impact of reworking ceramic area array packages on the integrity of the printed board laminate” Subjects and Themes:
- Subjects: ➤ Ball grid array technology - TERMINOLOGY - RELIABILITY ENGINEERING - ARRAYS - TECHNOLOGIES - RELIABILITY
Edition Identifiers:
- The Open Library ID: OL31683954M
- Online Computer Library Center (OCLC) ID: 63680984
- Library of Congress Control Number (LCCN): 2005530041
- All ISBNs: 9789290923862 - 9290923865
Access and General Info:
- First Year Published: 2005
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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37Design for reliability
By Vincent R. Lalli
“Design for reliability” Metadata:
- Title: Design for reliability
- Author: Vincent R. Lalli
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1994
- Publish Location: ➤ [Springfield, Va - [Washington, DC]
“Design for reliability” Subjects and Themes:
- Subjects: Systems engineering - Reliability engineering - Spacecraft reliability - NASA space programs
Edition Identifiers:
- The Open Library ID: OL15408121M
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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38How much redundancy?
By Ronald C. Suich
“How much redundancy?” Metadata:
- Title: How much redundancy?
- Author: Ronald C. Suich
- Language: English
- Publisher: NASA Lewis Research Center
- Publish Date: 1990
- Publish Location: [Cleveland, Ohio
“How much redundancy?” Subjects and Themes:
- Subjects: Electric power supplies - Redundancy - Aerospace systems - Cost analysis - Reliability engineering
Edition Identifiers:
- The Open Library ID: OL16125250M
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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39Revised final report on reliability and cost analysis methods
By Ronald C. Suich
“Revised final report on reliability and cost analysis methods” Metadata:
- Title: ➤ Revised final report on reliability and cost analysis methods
- Author: Ronald C. Suich
- Language: English
- Publisher: ➤ National Technical Information Service, distributor - National Aeronautics and Space Administration
- Publish Date: 1991
- Publish Location: ➤ Springfield, Va - [Washington, DC
“Revised final report on reliability and cost analysis methods” Subjects and Themes:
- Subjects: ➤ Systems engineering - Component reliability - Reliability engineering - Cost analysis - Reliability analysis - Redundant components
Edition Identifiers:
- The Open Library ID: OL15402976M
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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40Performance reports, AXAF VETA-I mirror ring focus measurements
By P. Zhao
“Performance reports, AXAF VETA-I mirror ring focus measurements” Metadata:
- Title: ➤ Performance reports, AXAF VETA-I mirror ring focus measurements
- Author: P. Zhao
- Language: English
- Publisher: ➤ National Technical Information Service, distributor - National Aeronautics and Space Administration - Smithsonian Astrophysical Observatory
- Publish Date: 1994
- Publish Location: ➤ Cambridge, MA - Springfield, Va - [Washington, DC
“Performance reports, AXAF VETA-I mirror ring focus measurements” Subjects and Themes:
- Subjects: ➤ Algorithms - Gravitational effects - Mirrors - Radii - Reliability engineering - Test facilities - X ray astrophysics facility - X ray detectors
Edition Identifiers:
- The Open Library ID: OL15407939M
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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41Inspection planning development
By David A. Graf
“Inspection planning development” Metadata:
- Title: ➤ Inspection planning development
- Author: David A. Graf
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - Rockwell International - National Technical Information Service, distributor
- Publish Date: 1994
- Publish Location: ➤ [Canoga Park, CA - Washington, DC - Springfield, Va
“Inspection planning development” Subjects and Themes:
- Subjects: ➤ Manufacturing - Concurrent engineering - Cost effectiveness - Quality control - Reliability engineering - Reliability - Management planning - Inspection
Edition Identifiers:
- The Open Library ID: OL15419114M
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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42Software safety progress in NASA
By Charles F. Radley
“Software safety progress in NASA” Metadata:
- Title: ➤ Software safety progress in NASA
- Author: Charles F. Radley
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1995
- Publish Location: ➤ [Springfield, Va - [Washington, D.C.]
“Software safety progress in NASA” Subjects and Themes:
- Subjects: ➤ Safety - Reliability engineering - Software engineering - Reliability analysis - Program verification (Computers) - Software reliability
Edition Identifiers:
- The Open Library ID: OL15419929M
Access and General Info:
- First Year Published: 1995
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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43Design master
By D. W. Worthem
“Design master” Metadata:
- Title: Design master
- Author: D. W. Worthem
- Language: English
- Publisher: ➤ National Technical Information Service, distributor - National Aeronautics and Space Administration
- Publish Date: 1997
- Publish Location: ➤ [Springfield, Va - [Washington, DC]
“Design master” Subjects and Themes:
- Subjects: ➤ Computer programs - Computerized simulation - Data bases - Databases - Graphical user interface - Object-oriented programming - Reliability engineering - Software development tools - Systems engineering
Edition Identifiers:
- The Open Library ID: OL15543115M
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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44Practical reliability engineering
By Patrick D.T O'Connor
“Practical reliability engineering” Metadata:
- Title: ➤ Practical reliability engineering
- Author: Patrick D.T O'Connor
- Language: English
- Number of Pages: Median: 513
- Publisher: Wiley
- Publish Date: 2003
- Publish Location: Chichester
“Practical reliability engineering” Subjects and Themes:
- Subjects: ➤ Reliability (Engineering) - Fiabilité - Zuverlässigkeit - Estatística (confiabilidade) - RELIABILITY ENGINEERING - Reliability (engineering)
Edition Identifiers:
- The Open Library ID: OL22530581M
- All ISBNs: 9780470844632 - 0470844639
Access and General Info:
- First Year Published: 2003
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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45Spacecraft system integration and test
By R. P. Brooks
“Spacecraft system integration and test” Metadata:
- Title: ➤ Spacecraft system integration and test
- Author: R. P. Brooks
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1995
- Publish Location: ➤ [Washington, DC - Springfield, Va
“Spacecraft system integration and test” Subjects and Themes:
- Subjects: ➤ Satellite design - Small satellite technology - Payload integration - Spacecraft design - Systems integration - Mission planning - Reliability engineering - Project management
Edition Identifiers:
- The Open Library ID: OL15499060M
Access and General Info:
- First Year Published: 1995
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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46Thermal guide for reliability engineers
By Hughes Aircraft Company. Electro-Optical and Data Systems Group
“Thermal guide for reliability engineers” Metadata:
- Title: ➤ Thermal guide for reliability engineers
- Author: ➤ Hughes Aircraft Company. Electro-Optical and Data Systems Group
- Number of Pages: Median: 126
- Publisher: ➤ Hughes Aircraft Co., Electro-Optical and Data Systems Group
- Publish Date: 1982
- Publish Location: Culver City, Calif
“Thermal guide for reliability engineers” Subjects and Themes:
- Subjects: Thermal analysis - Reliability engineering
Edition Identifiers:
- The Open Library ID: OL19248798M
Access and General Info:
- First Year Published: 1982
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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47The logic of microspace
By Rick Fleeter
“The logic of microspace” Metadata:
- Title: The logic of microspace
- Author: Rick Fleeter
- Language: English
- Number of Pages: Median: 447
- Publisher: ➤ Microcosm Press - Kluwer Academic Publishers
- Publish Date: 2000
- Publish Location: ➤ Dordrecht, Netherlands - El Segundo, Calif
“The logic of microspace” Subjects and Themes:
- Subjects: ➤ Microspacecraft - Reliability engineering - Small scientific satellites - Spacecraft - Spacecraft design - Spacecraft reliability - SMALL SCIENTIFIC SATELLITES - SPACECRAFT - RELIABILITY ENGINEERING - SPACECRAFT RELIABILITY - SPACECRAFT DESIGN
Edition Identifiers:
- The Open Library ID: OL6899757M
- Online Computer Library Center (OCLC) ID: 44741777
- Library of Congress Control Number (LCCN): 00709444
- All ISBNs: 0792360281 - 9780792360285
Access and General Info:
- First Year Published: 2000
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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