Explore: Wafer Scale Integration
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Books Results
Source: The Open Library
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1Materials and technologies for optical communications
“Materials and technologies for optical communications” Metadata:
- Title: ➤ Materials and technologies for optical communications
- Language: English
- Number of Pages: Median: 170
- Publisher: The Society
- Publish Date: 1988
- Publish Location: Bellingham, Wash., USA
“Materials and technologies for optical communications” Subjects and Themes:
- Subjects: ➤ Congresses - Materials - Wafer scale integration - Optical communications - Integrated circuits - Wafer-scale integration
Edition Identifiers:
- The Open Library ID: OL2412555M
- Online Computer Library Center (OCLC) ID: 18000341
- Library of Congress Control Number (LCCN): 87063513
- All ISBNs: 0892529016 - 9780892529018
Access and General Info:
- First Year Published: 1988
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
- Borrowing from Open Library: Borrowing link
- Borrowing from Archive.org: Borrowing link
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21996 International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1996 Lake Tahoe, California), Calif.) International Integrated Reliability Workshop (2001 : Lake Tahoe and California) International Integrated Reliability Workshop (1996 : Lake Tahoe
“1996 International Integrated Reliability Workshop final report” Metadata:
- Title: ➤ 1996 International Integrated Reliability Workshop final report
- Authors: ➤ International Integrated Reliability Workshop (1996 Lake Tahoe, California)Calif.) International Integrated Reliability Workshop (2001 : Lake TahoeCalifornia) International Integrated Reliability Workshop (1996 : Lake Tahoe
- Language: English
- Number of Pages: Median: 175
- Publisher: ➤ IEEE Electron Devices Society - Institute of Electrical & Electronics Enginee - IEEE Reliability Society
- Publish Date: 1996 - 1997
- Publish Location: [New York]
“1996 International Integrated Reliability Workshop final report” Subjects and Themes:
- Subjects: ➤ Congresses - Reliability - Integrated circuits - Wafer scale integration - Electronic devices & materials - Reliability Engineering - Technology - Microelectronics - Education / Teaching - Science/Mathematics - Electronics - Circuits - General - General - Electronics - Microelectronics - Wafer-scale integration
Edition Identifiers:
- The Open Library ID: OL8082988M - OL8082987M - OL1019542M
- Online Computer Library Center (OCLC) ID: 36908636
- Library of Congress Control Number (LCCN): 96077509
- All ISBNs: 9780780335981 - 9780780335998 - 0780335988 - 0780335996
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
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31994 International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1994 Lake Tahoe, Calif.)
“1994 International Integrated Reliability Workshop final report” Metadata:
- Title: ➤ 1994 International Integrated Reliability Workshop final report
- Author: ➤ International Integrated Reliability Workshop (1994 Lake Tahoe, Calif.)
- Language: English
- Number of Pages: Median: 155
- Publisher: ➤ IEEE Electron Devices Society - IEEE Reliability Society
- Publish Date: 1994
- Publish Location: [New York]
“1994 International Integrated Reliability Workshop final report” Subjects and Themes:
- Subjects: Congresses - Reliability - Integrated circuits - Wafer scale integration - Wafer-scale integration
Edition Identifiers:
- The Open Library ID: OL1130254M - OL8082681M
- Online Computer Library Center (OCLC) ID: 32426337
- Library of Congress Control Number (LCCN): 94075834
- All ISBNs: 0780319095 - 9780780319097 - 9780780319080 - 0780319087
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
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41995 International Integrated Reliability Workshop Final Report
By Ieee Reliability Society
“1995 International Integrated Reliability Workshop Final Report” Metadata:
- Title: ➤ 1995 International Integrated Reliability Workshop Final Report
- Author: Ieee Reliability Society
- Language: English
- Number of Pages: Median: 173
- Publisher: IEEE Electron Devices Society
- Publish Date: 1996
“1995 International Integrated Reliability Workshop Final Report” Subjects and Themes:
- Subjects: Congresses - Reliability - Wafer scale integration - Integrated circuits - Wafer-scale integration
Edition Identifiers:
- The Open Library ID: OL8082802M
- Online Computer Library Center (OCLC) ID: 503404717
- Library of Congress Control Number (LCCN): 95077004
- All ISBNs: 9780780327054 - 0780327055
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
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51995 International Integrated Reliability Workshop final report
By International Integrated Reliability Workshop (1995 Lake Tahoe, Calif.)
“1995 International Integrated Reliability Workshop final report” Metadata:
- Title: ➤ 1995 International Integrated Reliability Workshop final report
- Author: ➤ International Integrated Reliability Workshop (1995 Lake Tahoe, Calif.)
- Language: English
- Number of Pages: Median: 173
- Publisher: ➤ IEEE Reliability Society - IEEE Electron Devices Society
- Publish Date: 1996
- Publish Location: [New York]
“1995 International Integrated Reliability Workshop final report” Subjects and Themes:
- Subjects: Congresses - Reliability - Integrated circuits - Wafer scale integration
Edition Identifiers:
- The Open Library ID: OL822393M
- Library of Congress Control Number (LCCN): 95077004
- All ISBNs: 9780780327054 - 0780327055
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
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6Wafer-level integrated systems
By Stuart K. Tewksbury
“Wafer-level integrated systems” Metadata:
- Title: Wafer-level integrated systems
- Author: Stuart K. Tewksbury
- Language: English
- Number of Pages: Median: 456
- Publisher: Kluwer Academic
- Publish Date: 1989
- Publish Location: Boston
“Wafer-level integrated systems” Subjects and Themes:
- Subjects: Design and construction - Integrated circuits - Wafer scale integration - Wafer-scale integration
Edition Identifiers:
- The Open Library ID: OL2057743M
- Online Computer Library Center (OCLC) ID: 18960605
- Library of Congress Control Number (LCCN): 88036779
- All ISBNs: 0792390067 - 9780792390060
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
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7Wafer scale integration, III
By IFIP WG 10.5 Workshop on Wafer Scale Integration (3rd 1989 Como, Italy)
“Wafer scale integration, III” Metadata:
- Title: Wafer scale integration, III
- Author: ➤ IFIP WG 10.5 Workshop on Wafer Scale Integration (3rd 1989 Como, Italy)
- Language: English
- Number of Pages: Median: 402
- Publisher: ➤ North-Holland - Distributors for the U.S. and Canada, Elsevier Science Pub. Co.
- Publish Date: 1990
- Publish Location: ➤ New York, N.Y., U.S.A - Amsterdam - New York
“Wafer scale integration, III” Subjects and Themes:
- Subjects: Congresses - Integrated circuits - Wafer scale integration - Wafer-scale integration
Edition Identifiers:
- The Open Library ID: OL2204726M
- Online Computer Library Center (OCLC) ID: 20724308
- Library of Congress Control Number (LCCN): 89026671
- All ISBNs: 9780444884961 - 0444884963
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
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- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.