Defect recognition and image processing in semiconductors 1997 - Info and Reading Options
proceedings of the 7th International Conference on Defect Recognition and Image Processing in Semiconductors (DRIP VII) held in Templin, Germany, 7-10 September 1997
By International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany), Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, J. Donecker and I. Rechenberg
"Defect recognition and image processing in semiconductors 1997" was published by Institute of Physics Pub. in 1998 - Bristol, it has 524 pages and the language of the book is English.
“Defect recognition and image processing in semiconductors 1997” Metadata:
- Title: ➤ Defect recognition and image processing in semiconductors 1997
- Authors: ➤ International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany)Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : TemplinJ. DoneckerI. Rechenberg
- Language: English
- Number of Pages: 524
- Publisher: Institute of Physics Pub.
- Publish Date: 1998
- Publish Location: Bristol
“Defect recognition and image processing in semiconductors 1997” Subjects and Themes:
- Subjects: ➤ Congresses - Semiconductors - Image processing - Defects - Condensed matter physics (liquids & solids) - Materials science - Semi-conductors & super-conductors - Technology - Reliability Engineering - Science - Solid State Physics - Science/Mathematics - Science / Solid State Physics - Electronics - Semiconductors
Edition Specifications:
- Pagination: xx, 524 p. :
Edition Identifiers:
- The Open Library ID: OL700714M - OL2747914W
- Online Computer Library Center (OCLC) ID: 38130571
- Library of Congress Control Number (LCCN): 97049019
- ISBN-10: 0750305002
- All ISBNs: 0750305002
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