Defect Recognition and Image Processing in Semiconductors 1997 - Info and Reading Options
Proceedings of the seventh conference on Defect Recognition and Image Processing, Berlin, ... (Institute of Physics Conference Series)
By International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany), Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : Templin, J. Donecker and I. Rechenberg
"Defect Recognition and Image Processing in Semiconductors 1997" was published by Taylor & Francis in January 1, 1998, it has 524 pages and the language of the book is English.
“Defect Recognition and Image Processing in Semiconductors 1997” Metadata:
- Title: ➤ Defect Recognition and Image Processing in Semiconductors 1997
- Authors: ➤ International Conference on Defect Recognition and Image Processing in Semiconductors (7th 1997 Templin, Germany)Germany) International Conference on Defect Recognition and Image Processing in Semiconductors (7th : 1997 : TemplinJ. DoneckerI. Rechenberg
- Language: English
- Number of Pages: 524
- Publisher: Taylor & Francis
- Publish Date: January 1, 1998
“Defect Recognition and Image Processing in Semiconductors 1997” Subjects and Themes:
- Subjects: ➤ Congresses - Semiconductors - Image processing - Defects - Condensed matter physics (liquids & solids) - Materials science - Semi-conductors & super-conductors - Technology - Reliability Engineering - Science - Solid State Physics - Science/Mathematics - Science / Solid State Physics - Electronics - Semiconductors
Edition Specifications:
- Format: Hardcover
- Weight: 2 pounds
- Dimensions: 9.2 x 6.2 x 1.2 inches
Edition Identifiers:
- The Open Library ID: OL7971014M - OL2747914W
- ISBN-13: 9780750305006
- ISBN-10: 0750305002
- All ISBNs: 0750305002 - 9780750305006
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