Explore: Ellipsometry

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1International Conference on Modulation Spectroscopy

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Book's cover

“International Conference on Modulation Spectroscopy” Metadata:

  • Title: ➤  International Conference on Modulation Spectroscopy
  • Author: ➤  
  • Language: English
  • Number of Pages: Median: 416
  • Publisher: The Society
  • Publish Date:
  • Publish Location: Bellingham, Wash., USA

“International Conference on Modulation Spectroscopy” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1990
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Borrowable

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2Optical polarimetry

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“Optical polarimetry” Metadata:

  • Title: Optical polarimetry
  • Author:
  • Language: English
  • Number of Pages: Median: 226
  • Publisher: The Society
  • Publish Date:
  • Publish Location: Bellingham, Wash

“Optical polarimetry” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1977
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Borrowable

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3A User's Guide to Ellipsometry

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“A User's Guide to Ellipsometry” Metadata:

  • Title: A User's Guide to Ellipsometry
  • Author:
  • Language: English
  • Number of Pages: Median: 266
  • Publisher: ➤  Dover Publications, Incorporated - Dover Publications - Academic Press - Elsevier Science & Technology Books
  • Publish Date:
  • Publish Location: Boston

“A User's Guide to Ellipsometry” Subjects and Themes:

Edition Identifiers:

First Setence:

"Electromagnetic waves and polarized light are treated in textbooks and reference books on optics."

Access and General Info:

  • First Year Published: 1993
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Printdisabled

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    4Spectroscopic Ellipsometry

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    Book's cover

    “Spectroscopic Ellipsometry” Metadata:

    • Title: Spectroscopic Ellipsometry
    • Author:
    • Language: English
    • Number of Pages: Median: 388
    • Publisher: ➤  Wiley & Sons, Limited, John - Wiley & Sons, Incorporated, John - Wiley
    • Publish Date:

    “Spectroscopic Ellipsometry” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 2007
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: Unclassified

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      5A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models

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      “A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models” Metadata:

      • Title: ➤  A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models
      • Author:
      • Language: English
      • Number of Pages: Median: 334
      • Publisher: ➤  National Institute of Standards and Technology - U.S. Dept. of Commerce, National Institute of Standards and Technology - For sale by the Supt. of Docs., U.S. G.P.O. - U.S. G.P.O.
      • Publish Date:
      • Publish Location: ➤  Washington - Gaithersburg, MD - Washington, D.C

      “A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models” Subjects and Themes:

      Edition Identifiers:

      Access and General Info:

      • First Year Published: 1990
      • Is Full Text Available: No
      • Is The Book Public: No
      • Access Status: No_ebook

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      Downloads Are Not Available:

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        6Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN

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        “Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN” Metadata:

        • Title: ➤  Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN
        • Author:
        • Language: English
        • Publisher: ➤  Available from NASA Center for AeroSpace Information - National Aeronautics and Space Administration, Langley Research Center
        • Publish Date:
        • Publish Location: Hanover, MD - Hampton, Va

        “Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN” Subjects and Themes:

        Edition Identifiers:

        Access and General Info:

        • First Year Published: 2001
        • Is Full Text Available: No
        • Is The Book Public: No
        • Access Status: No_ebook

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          7Ellipsometry and polarized light

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          Book's cover

          “Ellipsometry and polarized light” Metadata:

          • Title: ➤  Ellipsometry and polarized light
          • Author:
          • Language: English
          • Number of Pages: Median: 529
          • Publisher: ➤  sole distributors for the U.S.A. and Canada, Elsevier North-Holland - North-Holland Pub. Co.
          • Publish Date:
          • Publish Location: New York - Amsterdam

          “Ellipsometry and polarized light” Subjects and Themes:

          Edition Identifiers:

          Access and General Info:

          • First Year Published: 1977
          • Is Full Text Available: No
          • Is The Book Public: No
          • Access Status: Unclassified

          Online Access

          Downloads Are Not Available:

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            8Handbook of ellipsometry

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            Book's cover

            “Handbook of ellipsometry” Metadata:

            • Title: Handbook of ellipsometry
            • Authors:
            • Language: English
            • Number of Pages: Median: 878
            • Publisher: ➤  Elsevier Science & Technology Books - Noyes Data Corporation/Noyes Publications
            • Publish Date:

            “Handbook of ellipsometry” Subjects and Themes:

            Edition Identifiers:

            First Setence:

            "Polarization is a fundamental property of light."

            Access and General Info:

            • First Year Published: 2004
            • Is Full Text Available: No
            • Is The Book Public: No
            • Access Status: No_ebook

            Online Access

            Downloads Are Not Available:

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              9Ellipsometry and polarized light

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              Book's cover

              “Ellipsometry and polarized light” Metadata:

              • Title: ➤  Ellipsometry and polarized light
              • Authors:
              • Language: English
              • Number of Pages: Median: 549
              • Publisher: North-Holland - North Holland
              • Publish Date:
              • Publish Location: Amsterdam - Oxford

              “Ellipsometry and polarized light” Subjects and Themes:

              Edition Identifiers:

              Access and General Info:

              • First Year Published: 1987
              • Is Full Text Available: No
              • Is The Book Public: No
              • Access Status: No_ebook

              Online Access

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                10Spectroscopic ellipsometry and reflectometry

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                “Spectroscopic ellipsometry and reflectometry” Metadata:

                • Title: ➤  Spectroscopic ellipsometry and reflectometry
                • Author:
                • Language: English
                • Number of Pages: Median: 238
                • Publisher: ➤  Wiley - Wiley & Sons, Incorporated, John
                • Publish Date:
                • Publish Location: New York

                “Spectroscopic ellipsometry and reflectometry” Subjects and Themes:

                Edition Identifiers:

                Access and General Info:

                • First Year Published: 1999
                • Is Full Text Available: Yes
                • Is The Book Public: No
                • Access Status: Printdisabled

                Online Access

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                  11Ellipsometric surface analysis of wear tacks produced by different lubricants

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                  “Ellipsometric surface analysis of wear tacks produced by different lubricants” Metadata:

                  • Title: ➤  Ellipsometric surface analysis of wear tacks produced by different lubricants
                  • Author:
                  • Language: English
                  • Publisher: ➤  National Aeronautics and Space Administration - For sale by the National Technical Information Service
                  • Publish Date:
                  • Publish Location: ➤  [Washington, D.C.?] - [Springfield, Va

                  “Ellipsometric surface analysis of wear tacks produced by different lubricants” Subjects and Themes:

                  Edition Identifiers:

                  Access and General Info:

                  • First Year Published: 1985
                  • Is Full Text Available: No
                  • Is The Book Public: No
                  • Access Status: No_ebook

                  Online Access

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                    12Radiovolnovai︠a︡ ėllipsometrii︠a︡

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                    “Radiovolnovai︠a︡ ėllipsometrii︠a︡” Metadata:

                    • Title: ➤  Radiovolnovai︠a︡ ėllipsometrii︠a︡
                    • Author:
                    • Language: rus
                    • Number of Pages: Median: 103
                    • Publisher: ➤  Nauka i tekhnika - "Nauka i tekhnika"
                    • Publish Date:
                    • Publish Location: Minsk

                    “Radiovolnovai︠a︡ ėllipsometrii︠a︡” Subjects and Themes:

                    Edition Identifiers:

                    Access and General Info:

                    • First Year Published: 1985
                    • Is Full Text Available: No
                    • Is The Book Public: No
                    • Access Status: No_ebook

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                    13Analytic analysis of ellipsometric errors

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                    “Analytic analysis of ellipsometric errors” Metadata:

                    • Title: ➤  Analytic analysis of ellipsometric errors
                    • Author:
                    • Language: English
                    • Number of Pages: Median: 32
                    • Publisher: ➤  For sale by the Supt. of Docs., U.S. G.P.O. - National Bureau of Standards - U.S. Dept. of Commerce, National Bureau of Standards
                    • Publish Date:
                    • Publish Location: ➤  Gaithersburg, MD - Washington, DC - Washington, D.C

                    “Analytic analysis of ellipsometric errors” Subjects and Themes:

                    Edition Identifiers:

                    Access and General Info:

                    • First Year Published: 1986
                    • Is Full Text Available: No
                    • Is The Book Public: No
                    • Access Status: No_ebook

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                    14Wstęp do elipsometrii

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                    “Wstęp do elipsometrii” Metadata:

                    • Title: Wstęp do elipsometrii
                    • Author:
                    • Language: pol
                    • Number of Pages: Median: 184
                    • Publisher: ➤  Wydawnictwa Politechniki Warszawskiej
                    • Publish Date:
                    • Publish Location: Warszawa

                    “Wstęp do elipsometrii” Subjects and Themes:

                    Edition Identifiers:

                    • The Open Library ID: OL2570824M
                    • Online Computer Library Center (OCLC) ID: 12971310
                    • Library of Congress Control Number (LCCN): 85114319

                    Access and General Info:

                    • First Year Published: 1983
                    • Is Full Text Available: No
                    • Is The Book Public: No
                    • Access Status: No_ebook

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                    15A software program for aiding the analysis of ellipsometric measurements, simple models

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                    “A software program for aiding the analysis of ellipsometric measurements, simple models” Metadata:

                    • Title: ➤  A software program for aiding the analysis of ellipsometric measurements, simple models
                    • Author:
                    • Language: English
                    • Number of Pages: Median: 246
                    • Publisher: ➤  U.S. Dept. of Commerce, National Institute of Standards and Technology - For sale by the Supt. of Docs., U.S. G.P.O.
                    • Publish Date:
                    • Publish Location: ➤  Gaithersburg, MD - Washington, DC

                    “A software program for aiding the analysis of ellipsometric measurements, simple models” Subjects and Themes:

                    Edition Identifiers:

                    Access and General Info:

                    • First Year Published: 1989
                    • Is Full Text Available: No
                    • Is The Book Public: No
                    • Access Status: No_ebook

                    Online Access

                    Downloads Are Not Available:

                    The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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                      16Materials, structures, and devices for high-speed electronics

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                      “Materials, structures, and devices for high-speed electronics” Metadata:

                      • Title: ➤  Materials, structures, and devices for high-speed electronics
                      • Author:
                      • Language: English
                      • Publisher: ➤  National Aeronautics and Space Administration - National Technical Information Service, distributor
                      • Publish Date:
                      • Publish Location: ➤  [Washington, DC - Springfield, Va

                      “Materials, structures, and devices for high-speed electronics” Subjects and Themes:

                      Edition Identifiers:

                      Access and General Info:

                      • First Year Published: 1992
                      • Is Full Text Available: No
                      • Is The Book Public: No
                      • Access Status: No_ebook

                      Online Access

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                        17Proceedings of the Symposium on Recent Developments in Ellipsometry

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                        “Proceedings of the Symposium on Recent Developments in Ellipsometry” Metadata:

                        • Title: ➤  Proceedings of the Symposium on Recent Developments in Ellipsometry
                        • Author: ➤  
                        • Language: English
                        • Number of Pages: Median: 452
                        • Publisher: North-Holland Pub. Co.
                        • Publish Date:
                        • Publish Location: Amsterdam

                        “Proceedings of the Symposium on Recent Developments in Ellipsometry” Subjects and Themes:

                        Edition Identifiers:

                        Access and General Info:

                        • First Year Published: 1969
                        • Is Full Text Available: No
                        • Is The Book Public: No
                        • Access Status: No_ebook

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                        18The study of surface reactions in biological systems by ellipsometry

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                        Book's cover

                        “The study of surface reactions in biological systems by ellipsometry” Metadata:

                        • Title: ➤  The study of surface reactions in biological systems by ellipsometry
                        • Author:
                        • Language: English
                        • Number of Pages: Median: 232
                        • Publisher: Pergamon Press
                        • Publish Date:
                        • Publish Location: New York - Oxford

                        “The study of surface reactions in biological systems by ellipsometry” Subjects and Themes:

                        Edition Identifiers:

                        Access and General Info:

                        • First Year Published: 1972
                        • Is Full Text Available: No
                        • Is The Book Public: No
                        • Access Status: No_ebook

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                        19Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines

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                        “Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines” Metadata:

                        • Title: ➤  Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines
                        • Author:
                        • Language: English
                        • Number of Pages: Median: 160
                        • Publisher: Akademiai Kiadó
                        • Publish Date:
                        • Publish Location: Budapest

                        “Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines” Subjects and Themes:

                        Edition Identifiers:

                        Access and General Info:

                        • First Year Published: 1971
                        • Is Full Text Available: No
                        • Is The Book Public: No
                        • Access Status: No_ebook

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                        20Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)

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                        “Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)” Metadata:

                        • Title: ➤  Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)
                        • Author:
                        • Language: English
                        • Number of Pages: Median: 752
                        • Publisher: John Wiley & Sons Inc
                        • Publish Date:

                        “Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)” Subjects and Themes:

                        Edition Identifiers:

                        Access and General Info:

                        • First Year Published: 1971
                        • Is Full Text Available: Yes
                        • Is The Book Public: No
                        • Access Status: Printdisabled

                        Online Access

                        Downloads Are Not Available:

                        The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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                          21Null ellipsometry and protein adsorption to model biomaterials

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                          “Null ellipsometry and protein adsorption to model biomaterials” Metadata:

                          • Title: ➤  Null ellipsometry and protein adsorption to model biomaterials
                          • Author:
                          • Language: English
                          • Publisher: ➤  Forum Scientum & Applied Physics, Dept. of Physics and Measurement Technology, Biology and Chemistry
                          • Publish Date:
                          • Publish Location: Linköping

                          “Null ellipsometry and protein adsorption to model biomaterials” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 2001
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          22Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry

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                          “Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry” Metadata:

                          • Title: ➤  Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry
                          • Author:
                          • Language: English
                          • Number of Pages: Median: 237
                          • Publish Date:

                          “Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1973
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          23Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii

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                          “Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii” Metadata:

                          • Title: ➤  Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii
                          • Authors:
                          • Language: rus
                          • Number of Pages: Median: 189
                          • Publisher: ➤  Izd-vo "Nauka," Sibirskoe otd-nie
                          • Publish Date:
                          • Publish Location: Novosibirsk

                          “Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1980
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          24Osnovy ėllipsometrii

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                          “Osnovy ėllipsometrii” Metadata:

                          • Title: Osnovy ėllipsometrii
                          • Author:
                          • Language: rus
                          • Number of Pages: Median: 418
                          • Publisher: Nauka, Sibirskoe otd-nie
                          • Publish Date:
                          • Publish Location: Novosibirsk

                          “Osnovy ėllipsometrii” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1979
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          25Ellipsometry for industrial applications

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                          Book's cover

                          “Ellipsometry for industrial applications” Metadata:

                          • Title: ➤  Ellipsometry for industrial applications
                          • Author:
                          • Language: English
                          • Number of Pages: Median: 99
                          • Publisher: Springer-Verlag
                          • Publish Date:
                          • Publish Location: Wien - New York

                          “Ellipsometry for industrial applications” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1988
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          26Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces

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                          “Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces” Metadata:

                          • Title: ➤  Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces
                          • Author: ➤  
                          • Language: English
                          • Number of Pages: Median: 533
                          • Publisher: Éditions de physique
                          • Publish Date:
                          • Publish Location: Les Ulis, France

                          “Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1983
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          27Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur

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                          “Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur” Metadata:

                          • Title: ➤  Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur
                          • Author:
                          • Language: rus
                          • Number of Pages: Median: 132
                          • Publisher: "Nauka i tekhnika"
                          • Publish Date:
                          • Publish Location: Minsk

                          “Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1989
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          28Vvedenie v ėllipsometrii͡u︡

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                          “Vvedenie v ėllipsometrii͡u︡” Metadata:

                          • Title: Vvedenie v ėllipsometrii͡u︡
                          • Author:
                          • Language: rus
                          • Number of Pages: Median: 190
                          • Publisher: ➤  Izd-vo Leningradskogo universiteta
                          • Publish Date:
                          • Publish Location: Leningrad

                          “Vvedenie v ėllipsometrii͡u︡” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1986
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          29Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a

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                          “Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a” Metadata:

                          • Title: ➤  Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a
                          • Author: ➤  
                          • Language: rus
                          • Number of Pages: Median: 191
                          • Publisher: ➤  Izd-vo "Nauka," Sibirskoe otd-nie
                          • Publish Date:
                          • Publish Location: Novosibirsk

                          “Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a” Subjects and Themes:

                          Edition Identifiers:

                          • The Open Library ID: OL2464609M
                          • Online Computer Library Center (OCLC) ID: 17953618
                          • Library of Congress Control Number (LCCN): 87172586

                          Access and General Info:

                          • First Year Published: 1987
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          30Photoelastic properties of aluminium and copper studied by ellipsometry

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                          “Photoelastic properties of aluminium and copper studied by ellipsometry” Metadata:

                          • Title: ➤  Photoelastic properties of aluminium and copper studied by ellipsometry
                          • Author:
                          • Language: English
                          • Number of Pages: Median: 116
                          • Publisher: ➤  Physics Laboratory, Aalborg universitetscenter
                          • Publish Date:
                          • Publish Location: Aalborg Øst, Denmark

                          “Photoelastic properties of aluminium and copper studied by ellipsometry” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1986
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          31Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh

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                          “Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh” Metadata:

                          • Title: ➤  Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh
                          • Author:
                          • Language: rus
                          • Number of Pages: Median: 151
                          • Publisher: ➤  "Khimii͡a," Leningradskoe otd-nie
                          • Publish Date:
                          • Publish Location: Leningrad

                          “Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1986
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          32Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu

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                          “Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu” Metadata:

                          • Title: ➤  Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu
                          • Author:
                          • Language: pol
                          • Number of Pages: Median: 83
                          • Publisher: ➤  Wydawn. Politechniki Warszawskiej
                          • Publish Date:
                          • Publish Location: Warszawa

                          “Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu” Subjects and Themes:

                          Edition Identifiers:

                          • The Open Library ID: OL3808802M
                          • Online Computer Library Center (OCLC) ID: 18379314
                          • Library of Congress Control Number (LCCN): 81115225

                          Access and General Info:

                          • First Year Published: 1980
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          33A Fortran program for analysis of ellipsometer measurements

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                          “A Fortran program for analysis of ellipsometer measurements” Metadata:

                          • Title: ➤  A Fortran program for analysis of ellipsometer measurements
                          • Author:
                          • Language: English
                          • Number of Pages: Median: 79
                          • Publisher: U.S. Govt. Print. Office
                          • Publish Date:
                          • Publish Location: Washington, D.C

                          “A Fortran program for analysis of ellipsometer measurements” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1969
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          34Selected papers on ellipsometry

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                          “Selected papers on ellipsometry” Metadata:

                          • Title: ➤  Selected papers on ellipsometry
                          • Author:
                          • Language: English
                          • Number of Pages: Median: 707
                          • Publisher: SPIE Optical Engineering Press
                          • Publish Date:
                          • Publish Location: Bellingham, WA

                          “Selected papers on ellipsometry” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1990
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          35Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon

                          “Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon” Metadata:

                          • Title: ➤  Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon
                          • Language: English
                          • Number of Pages: Median: 37
                          • Publisher: ➤  U.S. Dept. of Commerce, National Institute of Standards and Technology - For sale by the Supt. of Docs., U.S. G.P.O.
                          • Publish Date:
                          • Publish Location: ➤  Washington, DC - Gaithersburg, MD

                          “Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon” Subjects and Themes:

                          Edition Identifiers:

                          • The Open Library ID: OL2148074M
                          • Online Computer Library Center (OCLC) ID: 20609002
                          • Library of Congress Control Number (LCCN): 88600591

                          Access and General Info:

                          • First Year Published: 1988
                          • Is Full Text Available: No
                          • Is The Book Public: No
                          • Access Status: No_ebook

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                          36Polarimetry and ellipsometry

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                          Book's cover

                          “Polarimetry and ellipsometry” Metadata:

                          • Title: Polarimetry and ellipsometry
                          • Authors:
                          • Language: English
                          • Number of Pages: Median: 374
                          • Publisher: SPIE
                          • Publish Date:
                          • Publish Location: Bellingham, Wash., USA

                          “Polarimetry and ellipsometry” Subjects and Themes:

                          Edition Identifiers:

                          Access and General Info:

                          • First Year Published: 1997
                          • Is Full Text Available: Yes
                          • Is The Book Public: No
                          • Access Status: Printdisabled

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                            37Ėllipsometrii︠a︡

                            “Ėllipsometrii︠a︡” Metadata:

                            • Title: Ėllipsometrii︠a︡
                            • Language: rus
                            • Number of Pages: Median: 251
                            • Publisher: "Nauka," Sibirskoe otd-nie
                            • Publish Date:
                            • Publish Location: Novosibirsk

                            “Ėllipsometrii︠a︡” Subjects and Themes:

                            Edition Identifiers:

                            Access and General Info:

                            • First Year Published: 1991
                            • Is Full Text Available: No
                            • Is The Book Public: No
                            • Access Status: No_ebook

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                            38Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces

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                            “Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces” Metadata:

                            • Title: ➤  Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces
                            • Author:
                            • Language: English
                            • Number of Pages: Median: 133
                            • Publisher: Forschungszentrum Jülich
                            • Publish Date:
                            • Publish Location: Jülich

                            “Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces” Subjects and Themes:

                            Edition Identifiers:

                            Access and General Info:

                            • First Year Published: 2004
                            • Is Full Text Available: No
                            • Is The Book Public: No
                            • Access Status: No_ebook

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                            39Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry

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                            “Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry” Metadata:

                            • Title: ➤  Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
                            • Author:
                            • Language: English
                            • Publisher: ➤  National Aeronautics and Space Administration - National Technical Information Service, distributor
                            • Publish Date:
                            • Publish Location: ➤  [Washington, D.C - Springfield, Va

                            “Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry” Subjects and Themes:

                            Edition Identifiers:

                            Access and General Info:

                            • First Year Published: 1996
                            • Is Full Text Available: No
                            • Is The Book Public: No
                            • Access Status: No_ebook

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                              40Techniques innovantes pour la caractérisation optique microstructurale de couches minces

                              “Techniques innovantes pour la caractérisation optique microstructurale de couches minces” Metadata:

                              • Title: ➤  Techniques innovantes pour la caractérisation optique microstructurale de couches minces
                              • Language: fre
                              • Number of Pages: Median: 181
                              • Publisher: CNRS
                              • Publish Date:
                              • Publish Location: Paris

                              “Techniques innovantes pour la caractérisation optique microstructurale de couches minces” Subjects and Themes:

                              Edition Identifiers:

                              Access and General Info:

                              • First Year Published: 2006
                              • Is Full Text Available: No
                              • Is The Book Public: No
                              • Access Status: No_ebook

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                              41Infrared spectroscopic ellipsometry

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                              “Infrared spectroscopic ellipsometry” Metadata:

                              • Title: ➤  Infrared spectroscopic ellipsometry
                              • Author:
                              • Language: English
                              • Number of Pages: Median: 160
                              • Publisher: Akademie-Verlag
                              • Publish Date:
                              • Publish Location: Berlin

                              “Infrared spectroscopic ellipsometry” Subjects and Themes:

                              Edition Identifiers:

                              Access and General Info:

                              • First Year Published: 1990
                              • Is Full Text Available: No
                              • Is The Book Public: No
                              • Access Status: No_ebook

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                              42Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer

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                              “Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer” Metadata:

                              • Title: ➤  Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer
                              • Author:
                              • Language: English
                              • Number of Pages: Median: 96
                              • Publisher: ➤  Dept. of Energy, Lawrence Berkeley Laboratory, Materials and Molecular Research Division - for sale by the National Technical Information Service]
                              • Publish Date:
                              • Publish Location: ➤  [Springfield, Va - Berkeley Calif

                              “Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer” Subjects and Themes:

                              Edition Identifiers:

                              Access and General Info:

                              • First Year Published: 1978
                              • Is Full Text Available: No
                              • Is The Book Public: No
                              • Access Status: No_ebook

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                              43Ėllipsometriia

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                              “Ėllipsometriia” Metadata:

                              • Title: Ėllipsometriia
                              • Author:
                              • Language: rus
                              • Number of Pages: Median: 200
                              • Publisher: "Sov. radio"
                              • Publish Date:
                              • Publish Location: Moskva

                              “Ėllipsometriia” Subjects and Themes:

                              Edition Identifiers:

                              Access and General Info:

                              • First Year Published: 1974
                              • Is Full Text Available: No
                              • Is The Book Public: No
                              • Access Status: No_ebook

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                              44Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry

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                              “Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry” Metadata:

                              • Title: ➤  Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry
                              • Author:
                              • Language: English
                              • Publisher: ➤  National Aeronautics and Space Administration - National Technical Information Service, distributor
                              • Publish Date:
                              • Publish Location: ➤  [Washington, D.C - Springfield, Va

                              “Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry” Subjects and Themes:

                              Edition Identifiers:

                              Access and General Info:

                              • First Year Published: 1995
                              • Is Full Text Available: No
                              • Is The Book Public: No
                              • Access Status: No_ebook

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                                45The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon

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                                “The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon” Metadata:

                                • Title: ➤  The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon
                                • Author:
                                • Language: English
                                • Number of Pages: Median: 51
                                • Publish Date:

                                “The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon” Subjects and Themes:

                                Edition Identifiers:

                                Access and General Info:

                                • First Year Published: 1990
                                • Is Full Text Available: No
                                • Is The Book Public: No
                                • Access Status: No_ebook

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                                46The use of polarized light for the study of adsorbed molecules

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                                “The use of polarized light for the study of adsorbed molecules” Metadata:

                                • Title: ➤  The use of polarized light for the study of adsorbed molecules
                                • Author:
                                • Language: English
                                • Number of Pages: Median: 164
                                • Publisher: Sine nomine
                                • Publish Date:
                                • Publish Location: [Toronto

                                “The use of polarized light for the study of adsorbed molecules” Subjects and Themes:

                                Edition Identifiers:

                                Access and General Info:

                                • First Year Published: 1976
                                • Is Full Text Available: No
                                • Is The Book Public: No
                                • Access Status: No_ebook

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                                47Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces

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                                “Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces” Metadata:

                                • Title: ➤  Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces
                                • Author:
                                • Language: English
                                • Number of Pages: Median: 82
                                • Publish Date:

                                “Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces” Subjects and Themes:

                                Edition Identifiers:

                                Access and General Info:

                                • First Year Published: 1994
                                • Is Full Text Available: No
                                • Is The Book Public: No
                                • Access Status: No_ebook

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                                48Experimental methods in ellipsometry

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                                “Experimental methods in ellipsometry” Metadata:

                                • Title: ➤  Experimental methods in ellipsometry
                                • Author:
                                • Language: English
                                • Number of Pages: Median: 82
                                • Publisher: ➤  University of San Carlos; [distribution by the Cellar Book Shop, Detroit
                                • Publish Date:
                                • Publish Location: Cebu City, Philippines

                                “Experimental methods in ellipsometry” Subjects and Themes:

                                Edition Identifiers:

                                Access and General Info:

                                • First Year Published: 1966
                                • Is Full Text Available: No
                                • Is The Book Public: No
                                • Access Status: No_ebook

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                                49The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon

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                                “The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon” Metadata:

                                • Title: ➤  The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon
                                • Author:
                                • Language: English
                                • Number of Pages: Median: 26
                                • Publisher: ➤  For sale by the Supt. of Docs., U.S. G.P.O. - U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
                                • Publish Date:
                                • Publish Location: ➤  Washington, DC - Gaithersburg, MD

                                “The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon” Subjects and Themes:

                                Edition Identifiers:

                                Access and General Info:

                                • First Year Published: 1997
                                • Is Full Text Available: No
                                • Is The Book Public: No
                                • Access Status: No_ebook

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                                50Handbook of the polariscope and its pracitcal applications

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                                Book's cover

                                “Handbook of the polariscope and its pracitcal applications” Metadata:

                                • Title: ➤  Handbook of the polariscope and its pracitcal applications
                                • Author:
                                • Language: English
                                • Number of Pages: Median: 262
                                • Publisher: Macmillan
                                • Publish Date:
                                • Publish Location: London

                                “Handbook of the polariscope and its pracitcal applications” Subjects and Themes:

                                Edition Identifiers:

                                Access and General Info:

                                • First Year Published: 1882
                                • Is Full Text Available: Yes
                                • Is The Book Public: Yes
                                • Access Status: Public

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