Explore: Ellipsometry
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AI-Generated Overview About “ellipsometry”:
Books Results
Source: The Open Library
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Search results from The Open Library
1International Conference on Modulation Spectroscopy
By International Conference on Modulation Spectroscopy (1990 San Diego, Calif.)

“International Conference on Modulation Spectroscopy” Metadata:
- Title: ➤ International Conference on Modulation Spectroscopy
- Author: ➤ International Conference on Modulation Spectroscopy (1990 San Diego, Calif.)
- Language: English
- Number of Pages: Median: 416
- Publisher: The Society
- Publish Date: 1990
- Publish Location: Bellingham, Wash., USA
“International Conference on Modulation Spectroscopy” Subjects and Themes:
- Subjects: ➤ Congresses - Ellipsometry - Modulation spectroscopy - Optical properties - Quantum wells - Semiconductors - Superlattices as materials - Thin films - Spectra
Edition Identifiers:
- The Open Library ID: OL1889907M
- Online Computer Library Center (OCLC) ID: 22756610
- Library of Congress Control Number (LCCN): 90053290
- All ISBNs: 0819403377 - 9780819403377
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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- Borrowing from Archive.org: Borrowing link
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2Optical polarimetry
By R. M. A. Azzam

“Optical polarimetry” Metadata:
- Title: Optical polarimetry
- Author: R. M. A. Azzam
- Language: English
- Number of Pages: Median: 226
- Publisher: The Society
- Publish Date: 1977
- Publish Location: Bellingham, Wash
“Optical polarimetry” Subjects and Themes:
- Subjects: ➤ Polariscope - Congresses - Polarimetry - Ellipsometry - Optics and Photonics - Instrumentation
Edition Identifiers:
- The Open Library ID: OL4754734M
- Online Computer Library Center (OCLC) ID: 3915361
- Library of Congress Control Number (LCCN): 78100602
- All ISBNs: 9780892521395 - 0892521392
Access and General Info:
- First Year Published: 1977
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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- Borrowing from Archive.org: Borrowing link
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3A User's Guide to Ellipsometry
By Harland G. Tompkins

“A User's Guide to Ellipsometry” Metadata:
- Title: A User's Guide to Ellipsometry
- Author: Harland G. Tompkins
- Language: English
- Number of Pages: Median: 266
- Publisher: ➤ Dover Publications, Incorporated - Dover Publications - Academic Press - Elsevier Science & Technology Books
- Publish Date: 1993 - 2006 - 2012 - 2013
- Publish Location: Boston
“A User's Guide to Ellipsometry” Subjects and Themes:
- Subjects: Ellipsometry - Case studies - Polarization (light) - Surfaces (technology)
Edition Identifiers:
- The Open Library ID: OL38360783M - OL1723315M - OL38283400M - OL7640072M - OL40407004M
- Online Computer Library Center (OCLC) ID: 26503363
- Library of Congress Control Number (LCCN): 2006040253 - 92026866
- All ISBNs: ➤ 1306366070 - 0486151921 - 0486450287 - 9780486450285 - 9780126939507 - 9781306366076 - 0323140009 - 9780486151922 - 9780323140003 - 0126939500
First Setence:
"Electromagnetic waves and polarized light are treated in textbooks and reference books on optics."
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
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4Spectroscopic Ellipsometry
By Hiroyuki Fujiwara

“Spectroscopic Ellipsometry” Metadata:
- Title: Spectroscopic Ellipsometry
- Author: Hiroyuki Fujiwara
- Language: English
- Number of Pages: Median: 388
- Publisher: ➤ Wiley & Sons, Limited, John - Wiley & Sons, Incorporated, John - Wiley
- Publish Date: 2007
“Spectroscopic Ellipsometry” Subjects and Themes:
- Subjects: Spectrum analysis - Ellipsometry - Materials - Optical properties - Materials, optical properties
Edition Identifiers:
- The Open Library ID: OL29025064M - OL7594524M - OL39894412M - OL33363308M
- Library of Congress Control Number (LCCN): 2006030741
- All ISBNs: ➤ 0470060190 - 0470016086 - 9780470060186 - 9781281002112 - 9780470060193 - 1281002119 - 9780470016084 - 0470060182
Access and General Info:
- First Year Published: 2007
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: Unclassified
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5A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models
By J. F. Marchiando
“A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models” Metadata:
- Title: ➤ A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models
- Author: J. F. Marchiando
- Language: English
- Number of Pages: Median: 334
- Publisher: ➤ National Institute of Standards and Technology - U.S. Dept. of Commerce, National Institute of Standards and Technology - For sale by the Supt. of Docs., U.S. G.P.O. - U.S. G.P.O.
- Publish Date: 1990
- Publish Location: ➤ Washington - Gaithersburg, MD - Washington, D.C
“A software program for aiding the analysis of ellipsometric measurements, simple spectroscopic models” Subjects and Themes:
- Subjects: Computer programs - Ellipsometry
Edition Identifiers:
- The Open Library ID: OL1985908M - OL13942408M - OL17717242M
- Library of Congress Control Number (LCCN): 90601201
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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6Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN
By Mark E. Little
“Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN” Metadata:
- Title: ➤ Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN
- Author: Mark E. Little
- Language: English
- Publisher: ➤ Available from NASA Center for AeroSpace Information - National Aeronautics and Space Administration, Langley Research Center
- Publish Date: 2001
- Publish Location: Hanover, MD - Hampton, Va
“Band-gap engineering in sputter deposited amorphous/microcrystalline ScxGa1-xN” Subjects and Themes:
- Subjects: ➤ Scandium - Gallium nitrides - Microcrystals - Ellipsometry - Sputtering - Energy gaps (Solid state) - Amorphous materials
Edition Identifiers:
- The Open Library ID: OL17719831M - OL17621405M - OL21770307M - OL18178313M
- Online Computer Library Center (OCLC) ID: 54544434
Access and General Info:
- First Year Published: 2001
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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7Ellipsometry and polarized light
By R. M. A. Azzam

“Ellipsometry and polarized light” Metadata:
- Title: ➤ Ellipsometry and polarized light
- Author: R. M. A. Azzam
- Language: English
- Number of Pages: Median: 529
- Publisher: ➤ sole distributors for the U.S.A. and Canada, Elsevier North-Holland - North-Holland Pub. Co.
- Publish Date: 1977
- Publish Location: New York - Amsterdam
“Ellipsometry and polarized light” Subjects and Themes:
- Subjects: Ellipsometry - Polarization (Light)
Edition Identifiers:
- The Open Library ID: OL4907472M
- Online Computer Library Center (OCLC) ID: 2633111
- Library of Congress Control Number (LCCN): 76055761
- All ISBNs: 0720406943 - 9780720406948
Access and General Info:
- First Year Published: 1977
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: Unclassified
Online Access
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8Handbook of ellipsometry
By Harland G. Tompkins and Eugene A. Irene

“Handbook of ellipsometry” Metadata:
- Title: Handbook of ellipsometry
- Authors: Harland G. TompkinsEugene A. Irene
- Language: English
- Number of Pages: Median: 878
- Publisher: ➤ Elsevier Science & Technology Books - Noyes Data Corporation/Noyes Publications
- Publish Date: 2004 - 2005
“Handbook of ellipsometry” Subjects and Themes:
- Subjects: Ellipsometry - Physics - Ellipsométrie - SCIENCE - Nanoscience
Edition Identifiers:
- The Open Library ID: OL51660367M - OL34462736M - OL8048880M
- Online Computer Library Center (OCLC) ID: 55887386 - 310147997
- Library of Congress Control Number (LCCN): 2004014676
- All ISBNs: ➤ 9780815514992 - 0815514999 - 0815517475 - 9783540274889 - 9780815517474 - 354027488X
First Setence:
"Polarization is a fundamental property of light."
Access and General Info:
- First Year Published: 2004
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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9Ellipsometry and polarized light
By R. M. A. Azzam, R.M.A. Azzam and N.M. Bashara‡

“Ellipsometry and polarized light” Metadata:
- Title: ➤ Ellipsometry and polarized light
- Authors: R. M. A. AzzamR.M.A. AzzamN.M. Bashara‡
- Language: English
- Number of Pages: Median: 549
- Publisher: North-Holland - North Holland
- Publish Date: 1987
- Publish Location: Amsterdam - Oxford
“Ellipsometry and polarized light” Subjects and Themes:
- Subjects: ➤ Ellipsometry - Condensed matter physics (liquids & solids) - Optics (light) - Science - Science/Mathematics - Optics - Physics - Science / Optics - Polarization (Light)
Edition Identifiers:
- The Open Library ID: OL9861834M - OL22324766M
- Online Computer Library Center (OCLC) ID: 15742574
- All ISBNs: 9780444870162 - 0444870164
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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10Spectroscopic ellipsometry and reflectometry
By Harland G. Tompkins

“Spectroscopic ellipsometry and reflectometry” Metadata:
- Title: ➤ Spectroscopic ellipsometry and reflectometry
- Author: Harland G. Tompkins
- Language: English
- Number of Pages: Median: 238
- Publisher: ➤ Wiley - Wiley & Sons, Incorporated, John
- Publish Date: 1999 - 2008
- Publish Location: New York
“Spectroscopic ellipsometry and reflectometry” Subjects and Themes:
- Subjects: ➤ Optical properties - Reflectometer - Materials - Surfaces (Technology) - Ellipsometry - Thin films - Reflectance spectroscopy - Phase transformations (statistical physics) - Surfaces (technologie) - Ellipsométrie - Réflectomètres - Matériaux - Propriétés optiques - Couches minces - Espectrometria - Propriedades óticas - Filmes finos - Materiais - Dünne Schicht - Ellipsometrie - Oberflächeneigenschaft - Reflektometrie - Werkstoff
Edition Identifiers:
- The Open Library ID: OL29228908M - OL376278M
- Online Computer Library Center (OCLC) ID: 39546046
- Library of Congress Control Number (LCCN): 98038199
- All ISBNs: 9780470349113 - 0471181722 - 0470349115 - 9780471181729
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
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11Ellipsometric surface analysis of wear tacks produced by different lubricants
By James L. Lauer
“Ellipsometric surface analysis of wear tacks produced by different lubricants” Metadata:
- Title: ➤ Ellipsometric surface analysis of wear tacks produced by different lubricants
- Author: James L. Lauer
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - For sale by the National Technical Information Service
- Publish Date: 1985
- Publish Location: ➤ [Washington, D.C.?] - [Springfield, Va
“Ellipsometric surface analysis of wear tacks produced by different lubricants” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL14661988M - OL17658300M
Access and General Info:
- First Year Published: 1985
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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12Radiovolnovai︠a︡ ėllipsometrii︠a︡
By V. A. Konev
“Radiovolnovai︠a︡ ėllipsometrii︠a︡” Metadata:
- Title: ➤ Radiovolnovai︠a︡ ėllipsometrii︠a︡
- Author: V. A. Konev
- Language: rus
- Number of Pages: Median: 103
- Publisher: ➤ Nauka i tekhnika - "Nauka i tekhnika"
- Publish Date: 1985
- Publish Location: Minsk
“Radiovolnovai︠a︡ ėllipsometrii︠a︡” Subjects and Themes:
- Subjects: Ellipsometry - Radio waves
Edition Identifiers:
- The Open Library ID: OL2962975M - OL14760804M
- Library of Congress Control Number (LCCN): 84207595
Access and General Info:
- First Year Published: 1985
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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13Analytic analysis of ellipsometric errors
By Deane Chandler-Horowitz
“Analytic analysis of ellipsometric errors” Metadata:
- Title: ➤ Analytic analysis of ellipsometric errors
- Author: Deane Chandler-Horowitz
- Language: English
- Number of Pages: Median: 32
- Publisher: ➤ For sale by the Supt. of Docs., U.S. G.P.O. - National Bureau of Standards - U.S. Dept. of Commerce, National Bureau of Standards
- Publish Date: 1986
- Publish Location: ➤ Gaithersburg, MD - Washington, DC - Washington, D.C
“Analytic analysis of ellipsometric errors” Subjects and Themes:
- Subjects: ➤ Data processing - Ellipsometry - FORTRAN (Computer program language)
Edition Identifiers:
- The Open Library ID: OL2343431M - OL19139679M
- Library of Congress Control Number (LCCN): 86600541
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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14Wstęp do elipsometrii
By Kazimierz Brudzewski
“Wstęp do elipsometrii” Metadata:
- Title: Wstęp do elipsometrii
- Author: Kazimierz Brudzewski
- Language: pol
- Number of Pages: Median: 184
- Publisher: ➤ Wydawnictwa Politechniki Warszawskiej
- Publish Date: 1983
- Publish Location: Warszawa
“Wstęp do elipsometrii” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL2570824M
- Online Computer Library Center (OCLC) ID: 12971310
- Library of Congress Control Number (LCCN): 85114319
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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15A software program for aiding the analysis of ellipsometric measurements, simple models
By J. F. Marchiando
“A software program for aiding the analysis of ellipsometric measurements, simple models” Metadata:
- Title: ➤ A software program for aiding the analysis of ellipsometric measurements, simple models
- Author: J. F. Marchiando
- Language: English
- Number of Pages: Median: 246
- Publisher: ➤ U.S. Dept. of Commerce, National Institute of Standards and Technology - For sale by the Supt. of Docs., U.S. G.P.O.
- Publish Date: 1989
- Publish Location: ➤ Gaithersburg, MD - Washington, DC
“A software program for aiding the analysis of ellipsometric measurements, simple models” Subjects and Themes:
- Subjects: Data processing - Ellipsometry
Edition Identifiers:
- The Open Library ID: OL17679079M - OL1811468M
- Library of Congress Control Number (LCCN): 89600743
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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16Materials, structures, and devices for high-speed electronics
By John A. Woollam
“Materials, structures, and devices for high-speed electronics” Metadata:
- Title: ➤ Materials, structures, and devices for high-speed electronics
- Author: John A. Woollam
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1992
- Publish Location: ➤ [Washington, DC - Springfield, Va
“Materials, structures, and devices for high-speed electronics” Subjects and Themes:
- Subjects: ➤ Quantum wells - Dielectrics - Superlattices - Spectroscopy - Ellipsometry - Semiconducting films - Thin films
Edition Identifiers:
- The Open Library ID: OL15413824M - OL17791653M
- Online Computer Library Center (OCLC) ID: 33420621
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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17Proceedings of the Symposium on Recent Developments in Ellipsometry
By Symposium on Recent Developments in Ellipsometry University of Nebraska 1968.
“Proceedings of the Symposium on Recent Developments in Ellipsometry” Metadata:
- Title: ➤ Proceedings of the Symposium on Recent Developments in Ellipsometry
- Author: ➤ Symposium on Recent Developments in Ellipsometry University of Nebraska 1968.
- Language: English
- Number of Pages: Median: 452
- Publisher: North-Holland Pub. Co.
- Publish Date: 1969
- Publish Location: Amsterdam
“Proceedings of the Symposium on Recent Developments in Ellipsometry” Subjects and Themes:
- Subjects: Congresses - Ellipsometry
Edition Identifiers:
- The Open Library ID: OL5773743M
- Library of Congress Control Number (LCCN): 71562053
Access and General Info:
- First Year Published: 1969
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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18The study of surface reactions in biological systems by ellipsometry
By George Poste

“The study of surface reactions in biological systems by ellipsometry” Metadata:
- Title: ➤ The study of surface reactions in biological systems by ellipsometry
- Author: George Poste
- Language: English
- Number of Pages: Median: 232
- Publisher: Pergamon Press
- Publish Date: 1972
- Publish Location: New York - Oxford
“The study of surface reactions in biological systems by ellipsometry” Subjects and Themes:
- Subjects: Cell membranes - Ellipsometry - Surface chemistry
Edition Identifiers:
- The Open Library ID: OL5319678M
- Online Computer Library Center (OCLC) ID: 524640
- Library of Congress Control Number (LCCN): 72170100
- All ISBNs: 0080169449 - 9780080169446
Access and General Info:
- First Year Published: 1972
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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19Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines
By G. Gergely
“Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines” Metadata:
- Title: ➤ Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines
- Author: G. Gergely
- Language: English
- Number of Pages: Median: 160
- Publisher: Akademiai Kiadó
- Publish Date: 1971
- Publish Location: Budapest
“Ellipsometric tables of the Si-Sio₂ system for mercury and HeNe laser spectral lines” Subjects and Themes:
- Subjects: ➤ Ellipsometry - Gas lasers - Mercury - Silicates - Spectra - Tables
Edition Identifiers:
- The Open Library ID: OL5343467M
- Library of Congress Control Number (LCCN): 72197646
Access and General Info:
- First Year Published: 1971
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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20Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)
By Arnoly Weissberger

“Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)” Metadata:
- Title: ➤ Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)
- Author: Arnoly Weissberger
- Language: English
- Number of Pages: Median: 752
- Publisher: John Wiley & Sons Inc
- Publish Date: 1971
“Physical Methods of Chemistry, Electrochemical Methods, Vol. 1, Pt. 2A (Techniques of Chemistry Ser.)” Subjects and Themes:
- Subjects: ➤ Electroluminescence - Electrochemical apparatus - Polarographs - Photoelectron spectroscopy - Kerr effect - Molecular beams - Technique - Thermodynamics - Methodology - Scientific apparatus and instruments - Interferometry - Neutrons - Optical rotation - Positron annihilation - Chimie - X-ray crystallography - Data processing - Manipulation - Electromagnetic waves - Faraday effect - Polarimetry - Radioactivity - Mossbauer spectroscopy - Light - Diffraction - Double Refraction - Analysis - Electrons - Electrochemistry - Magnetic resonance imaging - Chemistry - Microwave spectroscopy - Surfaces (Technology) - Microscopy - Ellipsometry - Gamma ray spectrometry - Experiments - Measurement - Nuclear activation analysis - Scattering
Edition Identifiers:
- The Open Library ID: OL10340595M
- Online Computer Library Center (OCLC) ID: 168355
- Library of Congress Control Number (LCCN): 77114920
- All ISBNs: 0471927279 - 9780471927273
Access and General Info:
- First Year Published: 1971
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
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21Null ellipsometry and protein adsorption to model biomaterials
By Johan Benesch
“Null ellipsometry and protein adsorption to model biomaterials” Metadata:
- Title: ➤ Null ellipsometry and protein adsorption to model biomaterials
- Author: Johan Benesch
- Language: English
- Publisher: ➤ Forum Scientum & Applied Physics, Dept. of Physics and Measurement Technology, Biology and Chemistry
- Publish Date: 2001
- Publish Location: Linköping
“Null ellipsometry and protein adsorption to model biomaterials” Subjects and Themes:
- Subjects: Biomedical materials - Ellipsometry - Adsorption (Biology)
Edition Identifiers:
- The Open Library ID: OL53827306M
- Online Computer Library Center (OCLC) ID: 48689613
- All ISBNs: 9789173730860 - 9173730866
Access and General Info:
- First Year Published: 2001
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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22Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry
By Wilma Jean Horkans
“Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry” Metadata:
- Title: ➤ Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry
- Author: Wilma Jean Horkans
- Language: English
- Number of Pages: Median: 237
- Publish Date: 1973
“Modulated ellipsometric spectroscopy and its application to surface studies in electrochemistry” Subjects and Themes:
- Subjects: Ellipsometry - Electrodes - Surface chemistry - Electrochemistry
Edition Identifiers:
- The Open Library ID: OL52756089M
- Online Computer Library Center (OCLC) ID: 506262823
Access and General Info:
- First Year Published: 1973
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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23Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii
By I. G. Burykin and Anatoliĭ Vasilʹevich Rzhanov
“Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii” Metadata:
- Title: ➤ Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii
- Authors: I. G. BurykinAnatoliĭ Vasilʹevich Rzhanov
- Language: rus
- Number of Pages: Median: 189
- Publisher: ➤ Izd-vo "Nauka," Sibirskoe otd-nie
- Publish Date: 1980
- Publish Location: Novosibirsk
“Algoritmy i programmy dli͡a chislennogo reshenii͡a nekotorykh zadach ėllipsometrii” Subjects and Themes:
- Subjects: Ellipsometry - Algorithms
Edition Identifiers:
- The Open Library ID: OL47965536M
- Online Computer Library Center (OCLC) ID: 27090871
Access and General Info:
- First Year Published: 1980
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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24Osnovy ėllipsometrii
By Anatoliĭ Vasilʹevich Rzhanov
“Osnovy ėllipsometrii” Metadata:
- Title: Osnovy ėllipsometrii
- Author: Anatoliĭ Vasilʹevich Rzhanov
- Language: rus
- Number of Pages: Median: 418
- Publisher: Nauka, Sibirskoe otd-nie
- Publish Date: 1979
- Publish Location: Novosibirsk
“Osnovy ėllipsometrii” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL47966130M
- Online Computer Library Center (OCLC) ID: 10254257
Access and General Info:
- First Year Published: 1979
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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25Ellipsometry for industrial applications
By Karl Riedling

“Ellipsometry for industrial applications” Metadata:
- Title: ➤ Ellipsometry for industrial applications
- Author: Karl Riedling
- Language: English
- Number of Pages: Median: 99
- Publisher: Springer-Verlag
- Publish Date: 1988
- Publish Location: Wien - New York
“Ellipsometry for industrial applications” Subjects and Themes:
- Subjects: Ellipsometry - Industrial applications - Measurement - Thin films
Edition Identifiers:
- The Open Library ID: OL2402141M
- Online Computer Library Center (OCLC) ID: 17261756
- Library of Congress Control Number (LCCN): 87032413
- All ISBNs: 038782040X - 9780387820408
Access and General Info:
- First Year Published: 1988
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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26Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces
By France) Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces (1983 Paris
“Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces” Metadata:
- Title: ➤ Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces
- Author: ➤ France) Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces (1983 Paris
- Language: English
- Number of Pages: Median: 533
- Publisher: Éditions de physique
- Publish Date: 1983
- Publish Location: Les Ulis, France
“Conférence internationale sur ellipsométrie et autres méthodes optiques pour l'analyse des surfaces et films minces” Subjects and Themes:
- Subjects: Ellipsometry - Congresses
Edition Identifiers:
- The Open Library ID: OL57358140M
- Online Computer Library Center (OCLC) ID: 10587366
- All ISBNs: 9782902731695 - 2902731698
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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27Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur
By V. A. Konev
“Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur” Metadata:
- Title: ➤ Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur
- Author: V. A. Konev
- Language: rus
- Number of Pages: Median: 132
- Publisher: "Nauka i tekhnika"
- Publish Date: 1989
- Publish Location: Minsk
“Radiovolnovai͡a︡ ėllipsometrii͡a︡ diėlektricheskikh struktur” Subjects and Themes:
- Subjects: Dielectrics - Ellipsometry - Radio waves
Edition Identifiers:
- The Open Library ID: OL2090323M
- Online Computer Library Center (OCLC) ID: 21079366
- Library of Congress Control Number (LCCN): 88133376
- All ISBNs: 5343000592 - 9785343000597
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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28Vvedenie v ėllipsometrii͡u︡
By V. K. Gromov
“Vvedenie v ėllipsometrii͡u︡” Metadata:
- Title: Vvedenie v ėllipsometrii͡u︡
- Author: V. K. Gromov
- Language: rus
- Number of Pages: Median: 190
- Publisher: ➤ Izd-vo Leningradskogo universiteta
- Publish Date: 1986
- Publish Location: Leningrad
“Vvedenie v ėllipsometrii͡u︡” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL2441799M
- Library of Congress Control Number (LCCN): 87136382
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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29Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a
By Vsesoi͡uznai͡a konferent͡sii͡a "Ėllipsometrii͡a--teorii͡a, metody prilozhenii͡a" (3rd 1985 Novosibirsk, R.S.F.S.R.)
“Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a” Metadata:
- Title: ➤ Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a
- Author: ➤ Vsesoi͡uznai͡a konferent͡sii͡a "Ėllipsometrii͡a--teorii͡a, metody prilozhenii͡a" (3rd 1985 Novosibirsk, R.S.F.S.R.)
- Language: rus
- Number of Pages: Median: 191
- Publisher: ➤ Izd-vo "Nauka," Sibirskoe otd-nie
- Publish Date: 1987
- Publish Location: Novosibirsk
“Ėllipsometrii͡a--teorii͡a, metody, prilozhenii͡a” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL2464609M
- Online Computer Library Center (OCLC) ID: 17953618
- Library of Congress Control Number (LCCN): 87172586
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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30Photoelastic properties of aluminium and copper studied by ellipsometry
By Kjeld Pedersen
“Photoelastic properties of aluminium and copper studied by ellipsometry” Metadata:
- Title: ➤ Photoelastic properties of aluminium and copper studied by ellipsometry
- Author: Kjeld Pedersen
- Language: English
- Number of Pages: Median: 116
- Publisher: ➤ Physics Laboratory, Aalborg universitetscenter
- Publish Date: 1986
- Publish Location: Aalborg Øst, Denmark
“Photoelastic properties of aluminium and copper studied by ellipsometry” Subjects and Themes:
- Subjects: Aluminum - Copper - Ellipsometry - Photoelasticity - Testing
Edition Identifiers:
- The Open Library ID: OL2418439M
- Library of Congress Control Number (LCCN): 87101084
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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31Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh
By V. I. Pshenit͡syn
“Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh” Metadata:
- Title: ➤ Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh
- Author: V. I. Pshenit͡syn
- Language: rus
- Number of Pages: Median: 151
- Publisher: ➤ "Khimii͡a," Leningradskoe otd-nie
- Publish Date: 1986
- Publish Location: Leningrad
“Ėllipsometrii͡a v fiziko-khimicheskikh issledovanii͡akh” Subjects and Themes:
- Subjects: Ellipsometry - Surface chemistry
Edition Identifiers:
- The Open Library ID: OL2595435M
- Library of Congress Control Number (LCCN): 85149929
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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32Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu
By Kazimierz Brudzewski
“Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu” Metadata:
- Title: ➤ Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu
- Author: Kazimierz Brudzewski
- Language: pol
- Number of Pages: Median: 83
- Publisher: ➤ Wydawn. Politechniki Warszawskiej
- Publish Date: 1980
- Publish Location: Warszawa
“Elipsometryczna analiza zjawisk mechanooptycznych indukowanych w cienkich warstwach silnym polem elektrycznym na przykładzie tlenków wolframu” Subjects and Themes:
- Subjects: Electric properties - Ellipsometry - Thin films
Edition Identifiers:
- The Open Library ID: OL3808802M
- Online Computer Library Center (OCLC) ID: 18379314
- Library of Congress Control Number (LCCN): 81115225
Access and General Info:
- First Year Published: 1980
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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33A Fortran program for analysis of ellipsometer measurements
By Frank L. McCrackin
“A Fortran program for analysis of ellipsometer measurements” Metadata:
- Title: ➤ A Fortran program for analysis of ellipsometer measurements
- Author: Frank L. McCrackin
- Language: English
- Number of Pages: Median: 79
- Publisher: U.S. Govt. Print. Office
- Publish Date: 1969
- Publish Location: Washington, D.C
“A Fortran program for analysis of ellipsometer measurements” Subjects and Themes:
- Subjects: ➤ Computer programming - FORTRAN (Computer program language) - Ellipsometry - Polarization (Light)
Edition Identifiers:
- The Open Library ID: OL57366430M
- Online Computer Library Center (OCLC) ID: 9815932
Access and General Info:
- First Year Published: 1969
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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34Selected papers on ellipsometry
By R. M. A. Azzam
“Selected papers on ellipsometry” Metadata:
- Title: ➤ Selected papers on ellipsometry
- Author: R. M. A. Azzam
- Language: English
- Number of Pages: Median: 707
- Publisher: SPIE Optical Engineering Press
- Publish Date: 1990
- Publish Location: Bellingham, WA
“Selected papers on ellipsometry” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL1864012M
- Library of Congress Control Number (LCCN): 90021882
- All ISBNs: 0819405701 - 9780819405715 - 9780819405708 - 081940571X
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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35Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon
“Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon” Metadata:
- Title: ➤ Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon
- Language: English
- Number of Pages: Median: 37
- Publisher: ➤ U.S. Dept. of Commerce, National Institute of Standards and Technology - For sale by the Supt. of Docs., U.S. G.P.O.
- Publish Date: 1988
- Publish Location: ➤ Washington, DC - Gaithersburg, MD
“Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon” Subjects and Themes:
- Subjects: ➤ Silicon - Refractive index - Ellipsometry - Mathematical models - Silica - Evaluation
Edition Identifiers:
- The Open Library ID: OL2148074M
- Online Computer Library Center (OCLC) ID: 20609002
- Library of Congress Control Number (LCCN): 88600591
Access and General Info:
- First Year Published: 1988
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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36Polarimetry and ellipsometry
By Maksymilian Pluta and Mariusz Szyjer

“Polarimetry and ellipsometry” Metadata:
- Title: Polarimetry and ellipsometry
- Authors: Maksymilian PlutaMariusz Szyjer
- Language: English
- Number of Pages: Median: 374
- Publisher: SPIE
- Publish Date: 1997
- Publish Location: Bellingham, Wash., USA
“Polarimetry and ellipsometry” Subjects and Themes:
- Subjects: ➤ Ellipsometry - Congresses - Polarization (Light) - Polarimetry - Optics - Ellipse
Edition Identifiers:
- The Open Library ID: OL295141M
- Online Computer Library Center (OCLC) ID: 36810655
- Library of Congress Control Number (LCCN): 97200960
- All ISBNs: 0819425095 - 9780819425096
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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37Ėllipsometrii︠a︡
“Ėllipsometrii︠a︡” Metadata:
- Title: Ėllipsometrii︠a︡
- Language: rus
- Number of Pages: Median: 251
- Publisher: "Nauka," Sibirskoe otd-nie
- Publish Date: 1991
- Publish Location: Novosibirsk
“Ėllipsometrii︠a︡” Subjects and Themes:
- Subjects: Ellipsometry - Congresses
Edition Identifiers:
- The Open Library ID: OL1469338M
- Online Computer Library Center (OCLC) ID: 30920254
- Library of Congress Control Number (LCCN): 93131019
- All ISBNs: 5020299162 - 9785020299160
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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38Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces
By Felix Linke
“Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces” Metadata:
- Title: ➤ Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces
- Author: Felix Linke
- Language: English
- Number of Pages: Median: 133
- Publisher: Forschungszentrum Jülich
- Publish Date: 2004
- Publish Location: Jülich
“Development of ellipsometric microscopy as a quantitative high-resolution technique for the investigation of thin films at glass-water and silicon-air interfaces” Subjects and Themes:
- Subjects: Ellipsometry - Thin films - Analysis - Thin film devices
Edition Identifiers:
- The Open Library ID: OL31666113M
- Library of Congress Control Number (LCCN): 2005424909
- All ISBNs: 9783893363735 - 3893363734
Access and General Info:
- First Year Published: 2004
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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39Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
By A. R. Heyd
“Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry” Metadata:
- Title: ➤ Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
- Author: A. R. Heyd
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1996
- Publish Location: ➤ [Washington, D.C - Springfield, Va
“Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry” Subjects and Themes:
- Subjects: ➤ Strain measurement - Superlattices - Spectroscopic analysis - Germanium compounds - Ellipsometry - Silicon compounds - Thickness
Edition Identifiers:
- The Open Library ID: OL17834454M
- Online Computer Library Center (OCLC) ID: 39647979
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
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40Techniques innovantes pour la caractérisation optique microstructurale de couches minces
“Techniques innovantes pour la caractérisation optique microstructurale de couches minces” Metadata:
- Title: ➤ Techniques innovantes pour la caractérisation optique microstructurale de couches minces
- Language: fre
- Number of Pages: Median: 181
- Publisher: CNRS
- Publish Date: 2006
- Publish Location: Paris
“Techniques innovantes pour la caractérisation optique microstructurale de couches minces” Subjects and Themes:
- Subjects: Ellipsometry - Reflectance spectroscopy - Thin films - Congresses
Edition Identifiers:
- The Open Library ID: OL22511875M
- Library of Congress Control Number (LCCN): 2007353897
- All ISBNs: 2271064309 - 9782271064301
Access and General Info:
- First Year Published: 2006
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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41Infrared spectroscopic ellipsometry
By Arnulf Röseler
“Infrared spectroscopic ellipsometry” Metadata:
- Title: ➤ Infrared spectroscopic ellipsometry
- Author: Arnulf Röseler
- Language: English
- Number of Pages: Median: 160
- Publisher: Akademie-Verlag
- Publish Date: 1990
- Publish Location: Berlin
“Infrared spectroscopic ellipsometry” Subjects and Themes:
- Subjects: ➤ Ellipsometry - Fourier transform infrared spectoscopy
Edition Identifiers:
- The Open Library ID: OL20053950M
- All ISBNs: 9783055006234 - 3055006232
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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42Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer
By Craig G Smith
“Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer” Metadata:
- Title: ➤ Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer
- Author: Craig G Smith
- Language: English
- Number of Pages: Median: 96
- Publisher: ➤ Dept. of Energy, Lawrence Berkeley Laboratory, Materials and Molecular Research Division - for sale by the National Technical Information Service]
- Publish Date: 1978
- Publish Location: ➤ [Springfield, Va - Berkeley Calif
“Corrections for component imperfections and azimuth errors in an automatic self-compensating ellipsometer” Subjects and Themes:
- Subjects: ➤ Ellipsometry - Error-correcting codes (Information theory) - Azimuth
Edition Identifiers:
- The Open Library ID: OL14880625M
Access and General Info:
- First Year Published: 1978
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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43Ėllipsometriia
By Mikhail Mikhaĭlovich Gorshkov
“Ėllipsometriia” Metadata:
- Title: Ėllipsometriia
- Author: Mikhail Mikhaĭlovich Gorshkov
- Language: rus
- Number of Pages: Median: 200
- Publisher: "Sov. radio"
- Publish Date: 1974
- Publish Location: Moskva
“Ėllipsometriia” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL18528831M
Access and General Info:
- First Year Published: 1974
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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44Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry
By A. R. Heyd
“Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry” Metadata:
- Title: ➤ Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry
- Author: A. R. Heyd
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1995
- Publish Location: ➤ [Washington, D.C - Springfield, Va
“Characterization of high Ge content SiGe heterostructures and graded alloy layers using spectroscopic ellipsometry” Subjects and Themes:
- Subjects: ➤ Germanium - Algorithms - Dielectrics - Ellipsometry - Silicon compounds - Substrates
Edition Identifiers:
- The Open Library ID: OL15501911M
Access and General Info:
- First Year Published: 1995
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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45The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon
By Ja-Kael Luey
“The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon” Metadata:
- Title: ➤ The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon
- Author: Ja-Kael Luey
- Language: English
- Number of Pages: Median: 51
- Publish Date: 1990
“The effect of pH and ionic strength on the adsorption of Ý-lactoglobulin onto well-characterized silicon” Subjects and Themes:
- Subjects: Absorption and adsorption - Ellipsometry - Proteins - Thin films
Edition Identifiers:
- The Open Library ID: OL15195735M
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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46The use of polarized light for the study of adsorbed molecules
By Robert William Stobie
“The use of polarized light for the study of adsorbed molecules” Metadata:
- Title: ➤ The use of polarized light for the study of adsorbed molecules
- Author: Robert William Stobie
- Language: English
- Number of Pages: Median: 164
- Publisher: Sine nomine
- Publish Date: 1976
- Publish Location: [Toronto
“The use of polarized light for the study of adsorbed molecules” Subjects and Themes:
- Subjects: Ellipsometry - Polarization (Light) - Molecules - Chemisorption
Edition Identifiers:
- The Open Library ID: OL20115702M
Access and General Info:
- First Year Published: 1976
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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47Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces
By Lakamraju Muralidhara
“Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces” Metadata:
- Title: ➤ Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces
- Author: Lakamraju Muralidhara
- Language: English
- Number of Pages: Median: 82
- Publish Date: 1994
“Resistance of adsorbed nisin to exchange with bovine serum albumin, Ü-lactalbumin, Ý-lactoglobulin, and Ý-casein at silanized silica surfaces” Subjects and Themes:
- Subjects: Ellipsometry - Hydrophobic surfaces - Nisin - Surface contamination
Edition Identifiers:
- The Open Library ID: OL15401015M
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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48Experimental methods in ellipsometry
By Michael Richartz
“Experimental methods in ellipsometry” Metadata:
- Title: ➤ Experimental methods in ellipsometry
- Author: Michael Richartz
- Language: English
- Number of Pages: Median: 82
- Publisher: ➤ University of San Carlos; [distribution by the Cellar Book Shop, Detroit
- Publish Date: 1966
- Publish Location: Cebu City, Philippines
“Experimental methods in ellipsometry” Subjects and Themes:
- Subjects: Ellipsometry
Edition Identifiers:
- The Open Library ID: OL5242498M
- Library of Congress Control Number (LCCN): 75314031
Access and General Info:
- First Year Published: 1966
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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49The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon
By Barbara J. Belzer
“The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon” Metadata:
- Title: ➤ The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon
- Author: Barbara J. Belzer
- Language: English
- Number of Pages: Median: 26
- Publisher: ➤ For sale by the Supt. of Docs., U.S. G.P.O. - U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology
- Publish Date: 1997
- Publish Location: ➤ Washington, DC - Gaithersburg, MD
“The results of an interlaboratory study of ellipsometric measurements of thin film silicon dioxide on silicon” Subjects and Themes:
- Subjects: Measurement - Ellipsometry - Semiconductor films - Thin films
Edition Identifiers:
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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50Handbook of the polariscope and its pracitcal applications
By H. Landolt

“Handbook of the polariscope and its pracitcal applications” Metadata:
- Title: ➤ Handbook of the polariscope and its pracitcal applications
- Author: H. Landolt
- Language: English
- Number of Pages: Median: 262
- Publisher: Macmillan
- Publish Date: 1882
- Publish Location: London
“Handbook of the polariscope and its pracitcal applications” Subjects and Themes:
- Subjects: Ellipsometry - Polariscope - Polarization (Light)
Edition Identifiers:
- The Open Library ID: OL25920120M
- Online Computer Library Center (OCLC) ID: 4204169
Access and General Info:
- First Year Published: 1882
- Is Full Text Available: Yes
- Is The Book Public: Yes
- Access Status: Public
Online Access
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- Borrowing from Open Library: Borrowing link
- Borrowing from Archive.org: Borrowing link
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