Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon - Info and Reading Options
"Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon" was published by U.S. Dept. of Commerce, National Institute of Standards and Technology in 1988 - Gaithersburg, MD, it has 37 pages and the language of the book is English.
“Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon” Metadata:
- Title: ➤ Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon
- Language: English
- Number of Pages: 37
- Publisher: ➤ U.S. Dept. of Commerce, National Institute of Standards and Technology
- Publish Date: 1988
- Publish Location: Gaithersburg, MD
“Preparation and certification of SRM-2530, ellipsometric parameters [delta] and [psi] and derived thickness and refractive index of a silicon dioxide layer on silicon” Subjects and Themes:
- Subjects: ➤ Silicon - Refractive index - Ellipsometry - Mathematical models - Silica - Evaluation
Edition Specifications:
- Pagination: x, 37 p. :
Edition Identifiers:
- The Open Library ID: OL2148074M - OL23050395W
- Online Computer Library Center (OCLC) ID: 20609002
- Library of Congress Control Number (LCCN): 88600591
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