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Source: The Open Library
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1Spectroscopic ellipsometry and reflectometry
By Harland G. Tompkins

“Spectroscopic ellipsometry and reflectometry” Metadata:
- Title: ➤ Spectroscopic ellipsometry and reflectometry
- Author: Harland G. Tompkins
- Language: English
- Number of Pages: Median: 238
- Publisher: ➤ Wiley - Wiley & Sons, Incorporated, John
- Publish Date: 1999 - 2008
- Publish Location: New York
“Spectroscopic ellipsometry and reflectometry” Subjects and Themes:
- Subjects: ➤ Optical properties - Reflectometer - Materials - Surfaces (Technology) - Ellipsometry - Thin films - Reflectance spectroscopy - Phase transformations (statistical physics) - Surfaces (technologie) - Ellipsométrie - Réflectomètres - Matériaux - Propriétés optiques - Couches minces - Espectrometria - Propriedades óticas - Filmes finos - Materiais - Dünne Schicht - Ellipsometrie - Oberflächeneigenschaft - Reflektometrie - Werkstoff
Edition Identifiers:
- The Open Library ID: OL29228908M - OL376278M
- Online Computer Library Center (OCLC) ID: 39546046
- Library of Congress Control Number (LCCN): 98038199
- All ISBNs: 9780470349113 - 0471181722 - 0470349115 - 9780471181729
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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