Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry - Info and Reading Options
By A. R. Heyd
“Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry” Metadata:
- Title: ➤ Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
- Author: A. R. Heyd
“Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry” Subjects and Themes:
- Subjects: ➤ Strain measurement - Superlattices - Spectroscopic analysis - Germanium compounds - Ellipsometry - Silicon compounds - Thickness
Edition Identifiers:
- The Open Library ID: OL18517922W
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