Explore: Automatic Test Equipment
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AI-Generated Overview About “automatic-test-equipment”:
Books Results
Source: The Open Library
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1The economics of automatic testing
By Brendan Davis
“The economics of automatic testing” Metadata:
- Title: ➤ The economics of automatic testing
- Author: Brendan Davis
- Language: English
- Number of Pages: Median: 400
- Publisher: ➤ McGraw-Hill - BookBaby - McGraw-Hill Book Co.(UK)
- Publish Date: 1982 - 1994 - 2013
- Publish Location: New York - London
“The economics of automatic testing” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Cost effectiveness - Electronic industries - Quality control - life-cycle costs - economic analysis - investment appraisal - financial analysis
Edition Identifiers:
- The Open Library ID: OL3492794M - OL1416758M - OL54114714M
- Online Computer Library Center (OCLC) ID: 8589529
- Library of Congress Control Number (LCCN): 82012664 - 93026333
- All ISBNs: ➤ 9780077077921 - 9780070845848 - 0070845840 - 9781626751224 - 007707792X - 1626751226
Access and General Info:
- First Year Published: 1982
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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21983 IEEE ATPG Workshop proceedings
By Automatic Test Program Generation Workshop (3rd 1983 San Francisco, Calif.)
“1983 IEEE ATPG Workshop proceedings” Metadata:
- Title: ➤ 1983 IEEE ATPG Workshop proceedings
- Author: ➤ Automatic Test Program Generation Workshop (3rd 1983 San Francisco, Calif.)
- Language: English
- Number of Pages: Median: 133
- Publisher: IEEE Computer Society Press
- Publish Date: 1983
- Publish Location: Silver Spring, MD
“1983 IEEE ATPG Workshop proceedings” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Software engineering
Edition Identifiers:
- The Open Library ID: OL11389679M - OL3194505M - OL11390607M
- Library of Congress Control Number (LCCN): 93078981 - 83080570
- All ISBNs: ➤ 0818604611 - 0818644613 - 0818684615 - 9780818644610 - 9780818684616 - 9780818604614
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
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3Nondestructive and Automated Testing for Soil and Rock Properties
By Calif.) ASTM Symposium on Nondestructive and Automated Testing for Soil and Rock Properties (1998 : San Diego
“Nondestructive and Automated Testing for Soil and Rock Properties” Metadata:
- Title: ➤ Nondestructive and Automated Testing for Soil and Rock Properties
- Author: ➤ Calif.) ASTM Symposium on Nondestructive and Automated Testing for Soil and Rock Properties (1998 : San Diego
- Language: English
- Number of Pages: Median: 323
- Publisher: ASTM - Astm Intl
- Publish Date: 1999
- Publish Location: West Conshohocken, PA
“Nondestructive and Automated Testing for Soil and Rock Properties” Subjects and Themes:
- Subjects: Soils - Rocks - Automatic test equipment - Testing - Nondestructive testing
Edition Identifiers:
- The Open Library ID: OL20764998M - OL11210996M
- Online Computer Library Center (OCLC) ID: 41090656
- Library of Congress Control Number (LCCN): 99023150
- All ISBNs: 0803124937 - 9780803124936
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
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4System Diagnosis and Prognosis
By Peter K. Willet
“System Diagnosis and Prognosis” Metadata:
- Title: System Diagnosis and Prognosis
- Author: Peter K. Willet
- Language: English
- Number of Pages: Median: 174
- Publisher: ➤ SPIE - SPIE-International Society for Optical Engine
- Publish Date: 2003
- Publish Location: Bellingham, Wash
“System Diagnosis and Prognosis” Subjects and Themes:
- Subjects: ➤ Medical technology - Electronic systems - Electronic apparatus and appliances, testing - System failures (engineering) - Automatic test equipment - Congresses - Testing - System failures (Engineering)
Edition Identifiers:
- The Open Library ID: OL11393448M - OL22569157M
- Online Computer Library Center (OCLC) ID: 52998075
- Library of Congress Control Number (LCCN): 2004271475
- All ISBNs: 0819449679 - 9780819449672
Access and General Info:
- First Year Published: 2003
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
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5Error detecting codes, self-checking circuits and applications
By John F. Wakerly
“Error detecting codes, self-checking circuits and applications” Metadata:
- Title: ➤ Error detecting codes, self-checking circuits and applications
- Author: John F. Wakerly
- Language: English
- Number of Pages: Median: 231
- Publisher: North-Holland
- Publish Date: 1978
- Publish Location: New York
“Error detecting codes, self-checking circuits and applications” Subjects and Themes:
- Subjects: Automatic test equipment - Design and construction - Electronic digital computers - Error-correcting codes (Information theory)
Edition Identifiers:
- The Open Library ID: OL4556326M
- Online Computer Library Center (OCLC) ID: 3516704
- Library of Congress Control Number (LCCN): 77026341
- All ISBNs: 0444002596 - 0444002561 - 9780444002563 - 9780444002594
Access and General Info:
- First Year Published: 1978
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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6Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida
“Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida” Metadata:
- Title: ➤ Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida
- Language: English
- Number of Pages: Median: 106
- Publisher: ➤ Society of Photo Optical - SPIE
- Publish Date: 1988
- Publish Location: Bellingham, Wash., USA
“Automated testing of electro-optical systems, 7-8 April 1988, Orlando, Florida” Subjects and Themes:
- Subjects: Congresses - Automatic test equipment - Testing - Electrooptical devices - Electrooptics
Edition Identifiers:
- The Open Library ID: OL2064694M - OL8231820M
- Online Computer Library Center (OCLC) ID: 18563234
- Library of Congress Control Number (LCCN): 88061021
- All ISBNs: 9780892529766 - 0892529768
Access and General Info:
- First Year Published: 1988
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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7IEEE guide to the use of ATLAS
By IEEE *GUIDE* TO and The Institute of Electrical and Electronics Engineers
“IEEE guide to the use of ATLAS” Metadata:
- Title: IEEE guide to the use of ATLAS
- Authors: ➤ IEEE *GUIDE* TOThe Institute of Electrical and Electronics Engineers
- Language: English
- Number of Pages: Median: 302
- Publisher: ➤ Institute of Electrical and Electronics Engineers - John Wiley & Sons Inc - Distributed in cooperation with Wiley-Interscience
- Publish Date: 1984 - 1985
- Publish Location: New York, NY
“IEEE guide to the use of ATLAS” Subjects and Themes:
- Subjects: ➤ Automatic checkout equipment - ATLAS (Computer program language) - Computers, handbooks, manuals, etc. - Automatic test equipment
Edition Identifiers:
- The Open Library ID: OL10337386M - OL17910431M
- Online Computer Library Center (OCLC) ID: 11858316 - 956670029
- Library of Congress Control Number (LCCN): 84043097
- All ISBNs: 0471827460 - 9780471827467
Access and General Info:
- First Year Published: 1984
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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8The use of microcomputers to improve Army ground vehicle readiness
By Richard G. Salter
“The use of microcomputers to improve Army ground vehicle readiness” Metadata:
- Title: ➤ The use of microcomputers to improve Army ground vehicle readiness
- Author: Richard G. Salter
- Language: English
- Number of Pages: Median: 46
- Publisher: Rand
- Publish Date: 1980
- Publish Location: Santa Monica, CA
“The use of microcomputers to improve Army ground vehicle readiness” Subjects and Themes:
- Subjects: Automatic test equipment - Maintenance and repair - Microcomputers - Military Vehicles - Testing
Edition Identifiers:
- The Open Library ID: OL4098003M
- Library of Congress Control Number (LCCN): 80012318
- All ISBNs: 9780833002075 - 0833002074
Access and General Info:
- First Year Published: 1980
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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9Logic analyzers for microprocessors
By John Kneen
“Logic analyzers for microprocessors” Metadata:
- Title: ➤ Logic analyzers for microprocessors
- Author: John Kneen
- Language: English
- Number of Pages: Median: 110
- Publisher: Hayden Book Co.
- Publish Date: 1980
- Publish Location: Rochelle Park, N.J
“Logic analyzers for microprocessors” Subjects and Themes:
- Subjects: Automatic test equipment - Logic circuits - Microprocessors - Testing
Edition Identifiers:
- The Open Library ID: OL4104015M
- Library of Congress Control Number (LCCN): 80018615
- All ISBNs: 9780810409538 - 0810409534
Access and General Info:
- First Year Published: 1980
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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10Design-for-Test for Digital IC's and Embedded Core Systems
By Alfred Crouch
“Design-for-Test for Digital IC's and Embedded Core Systems” Metadata:
- Title: ➤ Design-for-Test for Digital IC's and Embedded Core Systems
- Author: Alfred Crouch
- Language: English
- Number of Pages: Median: 348
- Publisher: ram - Prentice Hall PTR
- Publish Date: 1999 - 2015
“Design-for-Test for Digital IC's and Embedded Core Systems” Subjects and Themes:
- Subjects: ➤ Digital electronics - Electronic circuit design - Automatic test equipment - Embedded computer systems - Digital integrated circuits - Design and construction
Edition Identifiers:
- The Open Library ID: OL9288097M - OL7333447M - OL25881078M
- Library of Congress Control Number (LCCN): 99023871
- All ISBNs: 0130848271 - 9780130848277
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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11New frontiers in testing
By International Test Conference (1988 Washington, D.C.)
“New frontiers in testing” Metadata:
- Title: New frontiers in testing
- Author: ➤ International Test Conference (1988 Washington, D.C.)
- Language: English
- Number of Pages: Median: 1005
- Publisher: ➤ IEEE Computer Society Press - Computer Society Press of the IEEE - Ieee Computer Society
- Publish Date: 1988
- Publish Location: Washington, D.C
“New frontiers in testing” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Circuits - Congresses - Electronic digital computers - Integrated circuits - Semiconductors - Testing
Edition Identifiers:
- The Open Library ID: OL2067247M - OL11389188M - OL11390747M - OL11389735M - OL22085490M
- Library of Congress Control Number (LCCN): 88070912
- All ISBNs: ➤ 0818648708 - 9780818688706 - 9780818608704 - 081868870X - 0818608706 - 9780818648700
Access and General Info:
- First Year Published: 1988
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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12Integration of test with design and manufacturing
By International Test Conference (18th 1987 Washington, D.C.)
“Integration of test with design and manufacturing” Metadata:
- Title: ➤ Integration of test with design and manufacturing
- Author: ➤ International Test Conference (18th 1987 Washington, D.C.)
- Language: English
- Number of Pages: Median: 1151
- Publisher: ➤ IEEE Computer Society Press,U.S. - IEEE Computer Society Press - Order from Computer Society of the IEEE - Computer Society Press of the IEEE
- Publish Date: 1987
- Publish Location: ➤ Los Angeles, CA - Washington, D.C
“Integration of test with design and manufacturing” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Circuits - Congresses - Electronic digital computers - Integrated circuits - Semiconductors - Testing
Edition Identifiers:
- The Open Library ID: OL11389135M - OL2415052M - OL11390718M - OL11389726M - OL22174715M
- Library of Congress Control Number (LCCN): 87080439
- All ISBNs: ➤ 9780818647987 - 9780818607981 - 0818687983 - 081860798 - 081860798X - 9780818687983 - 0818647981
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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13Tutorial DSP-based testing of analog and mixed-signal circuits
By Matthew Mahoney
“Tutorial DSP-based testing of analog and mixed-signal circuits” Metadata:
- Title: ➤ Tutorial DSP-based testing of analog and mixed-signal circuits
- Author: Matthew Mahoney
- Language: English
- Number of Pages: Median: 257
- Publisher: ➤ Order from Computer Society of the IEEE - IEEE Computer Society Press
- Publish Date: 1987
- Publish Location: ➤ Los Angeles, CA - Washington, D.C
“Tutorial DSP-based testing of analog and mixed-signal circuits” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Digital techniques - Mixed signal circuits - Signal processing - Testing - Analog computers - Electric circuits
Edition Identifiers:
- The Open Library ID: OL2415048M
- Online Computer Library Center (OCLC) ID: 17188891
- Library of Congress Control Number (LCCN): 87080432
- All ISBNs: 0818607858 - 9780818607851 - 9780818647857 - 081864785X
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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14Designing, testing, and diagnostics--join them
By International Test Conference (1993 Baltimore, Md.)
“Designing, testing, and diagnostics--join them” Metadata:
- Title: ➤ Designing, testing, and diagnostics--join them
- Author: ➤ International Test Conference (1993 Baltimore, Md.)
- Language: English
- Number of Pages: Median: 1065
- Publisher: ➤ The Conference - Can be ordered from IEEE Service Center
- Publish Date: 1993
- Publish Location: Piscataway, NJ - Altoona, PA
“Designing, testing, and diagnostics--join them” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Testing
Edition Identifiers:
- The Open Library ID: OL8082628M - OL1444240M - OL8082630M
- Library of Congress Control Number (LCCN): 93080010
- All ISBNs: ➤ 9780780314290 - 9780780314306 - 9780780314313 - 078031431X - 0780314298 - 0780314301
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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15International Test Conference, 1991
By International Test Conference (22nd 1991 Nashville, Tenn.)
“International Test Conference, 1991” Metadata:
- Title: ➤ International Test Conference, 1991
- Author: ➤ International Test Conference (22nd 1991 Nashville, Tenn.)
- Language: English
- Number of Pages: Median: 1135
- Publisher: ➤ Ieee Computer Society - The Conference
- Publish Date: 1991
- Publish Location: Altoona, PA
“International Test Conference, 1991” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Testing
Edition Identifiers:
- The Open Library ID: OL1567867M - OL11389860M - OL11390831M
- Library of Congress Control Number (LCCN): 91055309
- All ISBNs: ➤ 0818661569 - 9780780302426 - 0818691565 - 9780818691560 - 0780302427 - 9780818661563
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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16Ate
By Allan C. Stover
“Ate” Metadata:
- Title: Ate
- Author: Allan C. Stover
- Language: English
- Number of Pages: Median: 239
- Publisher: ➤ McGraw-Hill Book Co. - McGraw-Hill Companies
- Publish Date: 1984
- Publish Location: New York
“Ate” Subjects and Themes:
- Subjects: Automatic test equipment
Edition Identifiers:
- The Open Library ID: OL9251718M - OL3172676M - OL7297015M
- Library of Congress Control Number (LCCN): 83014917
- All ISBNs: 0070617929 - 9780070617926
Access and General Info:
- First Year Published: 1984
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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17Competent expert systems
By E. T. Keravnou
“Competent expert systems” Metadata:
- Title: Competent expert systems
- Author: E. T. Keravnou
- Language: English
- Number of Pages: Median: 320
- Publisher: Kogan Page - MacGraw-Hill
- Publish Date: 1986
- Publish Location: London - New York
“Competent expert systems” Subjects and Themes:
- Subjects: ➤ Automatic checkout equipment - Automatic test equipment - Expert systems (Computer science)
Edition Identifiers:
- The Open Library ID: OL2727125M - OL22222312M - OL15368583M
- Online Computer Library Center (OCLC) ID: 14188925
- Library of Congress Control Number (LCCN): 86020969
- All ISBNs: 9780070341685 - 0070341680 - 9781850911524 - 1850911525
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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18Economic model of calibration improvements for automatic test equipment
By Stephen F. Weber
“Economic model of calibration improvements for automatic test equipment” Metadata:
- Title: ➤ Economic model of calibration improvements for automatic test equipment
- Author: Stephen F. Weber
- Language: English
- Number of Pages: Median: 84
- Publisher: ➤ For sale by the Supt. of Docs., U.S. G.P.O. - U.S. Dept. of Commerce, National Bureau of Standards - National Bureau of Standards
- Publish Date: 1984
- Publish Location: ➤ Washington, DC - Washington, D.C
“Economic model of calibration improvements for automatic test equipment” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL19059587M - OL17717296M - OL2998949M
- Library of Congress Control Number (LCCN): 84601027
Access and General Info:
- First Year Published: 1984
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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19ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993
By European Test Conference (3rd 1993 Rotterdam, Netherlands)
“ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993” Metadata:
- Title: ➤ ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993
- Author: ➤ European Test Conference (3rd 1993 Rotterdam, Netherlands)
- Language: English
- Number of Pages: Median: 548
- Publisher: IEEE Computer Society Press
- Publish Date: 1993
- Publish Location: Los Alamitos, Calif
“ETC 93, Third European Test Conference, Rotterdam, the Netherlands, April 19-22, 1993” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Testing
Edition Identifiers:
- The Open Library ID: OL11389564M - OL1751344M - OL11389563M
- Online Computer Library Center (OCLC) ID: 28333216
- Library of Congress Control Number (LCCN): 92074403
- All ISBNs: 0818633611 - 0818633603 - 9780818633614 - 9780818633607
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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20Automatic test equipment
By Keith Brindley
“Automatic test equipment” Metadata:
- Title: Automatic test equipment
- Author: Keith Brindley
- Language: English
- Number of Pages: Median: 178
- Publisher: ➤ Newnes - Elsevier Science & Technology Books
- Publish Date: 1991 - 2013
- Publish Location: Oxford - Boston
“Automatic test equipment” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Testing - Electronic apparatus and appliances - Technical & manufacturing industries & trades - Trades & technology -> technical trades -> technical & manufacturing industries & trades - 077 - 746 - P1117108368
Edition Identifiers:
- The Open Library ID: OL1640528M - OL39528580M
- Library of Congress Control Number (LCCN): 91193816
- All ISBNs: 0750601302 - 1483101150 - 9781483101156 - 9780750601306
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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212008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop
By IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (14th 2008 Vancouver, B.C.)
“2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop” Metadata:
- Title: ➤ 2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop
- Author: ➤ IEEE International Mixed-Signals, Sensors, and Systems Test Workshop (14th 2008 Vancouver, B.C.)
- Language: English
- Number of Pages: Median: 203
- Publisher: IEEE
- Publish Date: 2008
- Publish Location: Piscataway, N.J
“2008 IEEE 14th International Mixed-signals, Sensors, and Systems Test Workshop” Subjects and Themes:
- Subjects: ➤ Congresses - Automatic test equipment - Signal processing - Electronic apparatus and appliances - Biosensors - Testing - Detectors
Edition Identifiers:
- The Open Library ID: OL23961596M - OL23988366M - OL24032119M
- Library of Congress Control Number (LCCN): 2008903139
- All ISBNs: 1424423953 - 9781424423958
Access and General Info:
- First Year Published: 2008
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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22A designer's guide to built-in self-test
By Charles E. Stroud
“A designer's guide to built-in self-test” Metadata:
- Title: ➤ A designer's guide to built-in self-test
- Author: Charles E. Stroud
- Language: English
- Number of Pages: Median: 320
- Publisher: ➤ Kluwer Academic Publishers - Springer - Springer London, Limited
- Publish Date: 2002 - 2006 - 2014
- Publish Location: Boston
“A designer's guide to built-in self-test” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Design and construction - Electronic apparatus and appliances - Testing - Electronic apparatus and appliances, testing - Electronic apparatus and appliances, design and construction - Automatic checkout equipment - Electronic instruments
Edition Identifiers:
- The Open Library ID: OL37083943M - OL34383218M - OL20644878M
- Online Computer Library Center (OCLC) ID: 49356026
- Library of Congress Control Number (LCCN): 2002016230
- All ISBNs: ➤ 9781475776263 - 1402070500 - 1475776268 - 9780306475047 - 0306475049 - 9781402070501
Access and General Info:
- First Year Published: 2002
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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23Testability concepts for digital ICs
By F. P. M. Beenker
“Testability concepts for digital ICs” Metadata:
- Title: ➤ Testability concepts for digital ICs
- Author: F. P. M. Beenker
- Language: English
- Number of Pages: Median: 212
- Publisher: Kluwer Academic Publishers
- Publish Date: 1995
- Publish Location: Dordrecht - Boston
“Testability concepts for digital ICs” Subjects and Themes:
- Subjects: Automatic test equipment - Testing - Digital integrated circuits - Automatic checkout equipment
Edition Identifiers:
- The Open Library ID: OL803687M
- Library of Congress Control Number (LCCN): 95040166
- All ISBNs: 9780792396581 - 0792396588
Access and General Info:
- First Year Published: 1995
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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24Meeting the tests of time
By International Test Conference (20th 1989 Washington, DC)
“Meeting the tests of time” Metadata:
- Title: Meeting the tests of time
- Author: ➤ International Test Conference (20th 1989 Washington, DC)
- Language: English
- Number of Pages: Median: 977
- Publisher: ➤ IEEE Computer Society Press - Ieee Computer Society
- Publish Date: 1989
- Publish Location: Washington
“Meeting the tests of time” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Testing
Edition Identifiers:
- The Open Library ID: OL11390778M - OL2230096M
- Library of Congress Control Number (LCCN): 89083677
- All ISBNs: 9780818689628 - 0818689625
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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25Proceedings
By IEEE Workshop on Simulation & Test Generation Environments (1985 San Francisco, Calif.)
“Proceedings” Metadata:
- Title: Proceedings
- Author: ➤ IEEE Workshop on Simulation & Test Generation Environments (1985 San Francisco, Calif.)
- Language: English
- Number of Pages: Median: 179
- Publisher: ➤ IEEE Computer Society Press - Order from IEEE Computer Society - Ieee
- Publish Date: 1986
- Publish Location: ➤ Washington, D.C - Los Angeles, CA
“Proceedings” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Testing - Image processing
Edition Identifiers:
- The Open Library ID: OL11390704M - OL2747605M
- Library of Congress Control Number (LCCN): 86080457
- All ISBNs: ➤ 9780818607325 - 0818607327 - 9780818647321 - 0818687320 - 9780818687327 - 0818647329
Access and General Info:
- First Year Published: 1986
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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26Testing's changing role
By International Test Conference (14th 1983 Philadelphia, Pa.)
“Testing's changing role” Metadata:
- Title: Testing's changing role
- Author: ➤ International Test Conference (14th 1983 Philadelphia, Pa.)
- Language: English
- Number of Pages: Median: 806
- Publisher: ➤ IEEE Computer Society Press - IEEE Computer Society
- Publish Date: 1983
- Publish Location: ➤ Los Angeles - Silver Spring, MD
“Testing's changing role” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Circuits - Congresses - Electronic digital computers - Integrated circuits - Testing
Edition Identifiers:
- The Open Library ID: OL3195270M - OL22459982M
- Library of Congress Control Number (LCCN): 83081805
- All ISBNs: 0818605022 - 9780818605024
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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27Innovations in test
By ATE & Instrumentation Conference West (1989 Anaheim, Calif.)
“Innovations in test” Metadata:
- Title: Innovations in test
- Author: ➤ ATE & Instrumentation Conference West (1989 Anaheim, Calif.)
- Language: English
- Number of Pages: Median: 550
- Publisher: MG Expositions Group
- Publish Date: 1988
- Publish Location: Boston, MA
“Innovations in test” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Congresses - Electronic apparatus and appliances - Electronic instruments - Testing
Edition Identifiers:
- The Open Library ID: OL8128362M - OL2066352M
- Online Computer Library Center (OCLC) ID: 20267745
- Library of Congress Control Number (LCCN): 88063715
- All ISBNs: 9780879302122 - 0879302127
Access and General Info:
- First Year Published: 1988
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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281984 Academic Forum for Test Technology, October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneaplis
By Academic Forum for Test Technology (1984 Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis)
“1984 Academic Forum for Test Technology, October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneaplis” Metadata:
- Title: ➤ 1984 Academic Forum for Test Technology, October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneaplis
- Author: ➤ Academic Forum for Test Technology (1984 Center for Microelectronic and Information Sciences, University of Minnesota, Minneapolis)
- Language: English
- Number of Pages: Median: 65
- Publisher: ➤ Ieee Computer Society - IEEE Computer Society Press - Order from IEEE Computer Society
- Publish Date: 1984
- Publish Location: ➤ Los Angeles, CA - Silver Spring, MD
“1984 Academic Forum for Test Technology, October 19, 1984, Center for Microelectronic and Information Sciences, University of Minnesota, Minneaplis” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Semiconductors - Testing
Edition Identifiers:
- The Open Library ID: OL2330842M - OL11389014M
- Online Computer Library Center (OCLC) ID: 16579269
- Library of Congress Control Number (LCCN): 86218398
- All ISBNs: 9780818606090 - 0818606096
Access and General Info:
- First Year Published: 1984
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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29Winning test solutions for the '90s
By ATE & Instrumentation Conference East (1989 Boston, Mass.)
“Winning test solutions for the '90s” Metadata:
- Title: ➤ Winning test solutions for the '90s
- Author: ➤ ATE & Instrumentation Conference East (1989 Boston, Mass.)
- Language: English
- Number of Pages: Median: 561
- Publisher: MG Expositions Group
- Publish Date: 1989
- Publish Location: Boston, MA
“Winning test solutions for the '90s” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Congresses - Electronic apparatus and appliances - Electronic instruments - Testing
Edition Identifiers:
- The Open Library ID: OL8128363M - OL2223392M
- Online Computer Library Center (OCLC) ID: 22903443
- Library of Congress Control Number (LCCN): 89061749
- All ISBNs: 0879302135 - 9780879302139
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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30ETC91
By European Test Conference (2nd 1991 Munich, Germany)
“ETC91” Metadata:
- Title: ETC91
- Author: ➤ European Test Conference (2nd 1991 Munich, Germany)
- Language: English
- Number of Pages: Median: 532
- Publisher: VDE-Verlag
- Publish Date: 1991
- Publish Location: Berlin
“ETC91” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Testing
Edition Identifiers:
- The Open Library ID: OL8936973M - OL1898852M
- Online Computer Library Center (OCLC) ID: 25161438
- Library of Congress Control Number (LCCN): 90085783
- All ISBNs: 3800717786 - 9783800717781
Access and General Info:
- First Year Published: 1991
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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31The changing philosophy of test
By International Test Conference (21st 1990 Washington, D.C.)
“The changing philosophy of test” Metadata:
- Title: ➤ The changing philosophy of test
- Author: ➤ International Test Conference (21st 1990 Washington, D.C.)
- Language: English
- Number of Pages: Median: 1083
- Publisher: ➤ Ieee Computer Society - IEEE Computer Society Press
- Publish Date: 1990
- Publish Location: Los Alamitos, Calif
“The changing philosophy of test” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Circuits - Congresses - Electronic digital computers - Integrated circuits - Semiconductors - Testing
Edition Identifiers:
- The Open Library ID: OL1890522M - OL11390803M
- Library of Congress Control Number (LCCN): 90055486
- All ISBNs: 9780818690648 - 081869064X
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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32Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C
By Workshop on Industrial Applications of Machine Vision (1982 Research Triangle Park, N.C.)
“Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C” Metadata:
- Title: ➤ Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C
- Author: ➤ Workshop on Industrial Applications of Machine Vision (1982 Research Triangle Park, N.C.)
- Language: English
- Number of Pages: Median: 237
- Publisher: ➤ Published by IEEE Computer Society Press - IEEE Service Center [distributor] - Available from IEEE Computer Society
- Publish Date: 1982
- Publish Location: ➤ Piscataway, N.J - Silver Spring, MD - Los Angeles, CA
“Conference record, 1982 Workshop on Industrial Applications of Machine Vision, May 3-5, 1982, Research Triangle Park, N.C” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Image processing - Industrial applications
Edition Identifiers:
- The Open Library ID: OL3513676M - OL18846961M
- Online Computer Library Center (OCLC) ID: 8846387
- Library of Congress Control Number (LCCN): 82080368
Access and General Info:
- First Year Published: 1982
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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33IEEE guide to the use of ATLAS specification
“IEEE guide to the use of ATLAS specification” Metadata:
- Title: ➤ IEEE guide to the use of ATLAS specification
- Language: English
- Number of Pages: Median: 284
- Publisher: ➤ Institute of Electrical and Electronics Engineers - Inst of Elect & Electronic
- Publish Date: 1989 - 1998
- Publish Location: New York, NY
“IEEE guide to the use of ATLAS specification” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - ATLAS (Computer program language)
Edition Identifiers:
- The Open Library ID: OL10605058M - OL18708252M
- Online Computer Library Center (OCLC) ID: 40566464
- All ISBNs: 0738101958 - 9780738101958
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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34IEEE standard for digital test interchange format (DTIF)
“IEEE standard for digital test interchange format (DTIF)” Metadata:
- Title: ➤ IEEE standard for digital test interchange format (DTIF)
- Language: English
- Number of Pages: Median: 99
- Publisher: ➤ Institute of Electrical and Electronics Engineers - Inst of Elect & Electronic
- Publish Date: 1999
- Publish Location: New York
“IEEE standard for digital test interchange format (DTIF)” Subjects and Themes:
- Subjects: Digital electronics - Automatic test equipment - Standards
Edition Identifiers:
- The Open Library ID: OL10605108M - OL20508537M
- Online Computer Library Center (OCLC) ID: 41281316
- All ISBNs: 0738115533 - 9780738115535
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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35An engineer's guide to automated testing of high-speed interfaces
By José Moreira
“An engineer's guide to automated testing of high-speed interfaces” Metadata:
- Title: ➤ An engineer's guide to automated testing of high-speed interfaces
- Author: José Moreira
- Language: English
- Number of Pages: Median: 566
- Publisher: Artech House
- Publish Date: 2010
- Publish Location: Boston
“An engineer's guide to automated testing of high-speed interfaces” Subjects and Themes:
- Subjects: ➤ Very high speed integrated circuits - Automatic test equipment - Testing - Integrated circuits - Digital electronics
Edition Identifiers:
- The Open Library ID: OL25085339M
- Online Computer Library Center (OCLC) ID: 663437180
- Library of Congress Control Number (LCCN): 2010284789
- All ISBNs: 1607839830 - 9781607839835
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: Unclassified
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36Conference record
By Autotestcon '92 (1992 Dayton, Ohio), IEEE Instrumentation & Measurement Socie and IEEE Aerospace & Electronics Systems Soc
“Conference record” Metadata:
- Title: Conference record
- Authors: ➤ Autotestcon '92 (1992 Dayton, Ohio)IEEE Instrumentation & Measurement SocieIEEE Aerospace & Electronics Systems Soc
- Language: English
- Number of Pages: Median: 472
- Publisher: ➤ IEEE - Institute of Electrical & Electronics Enginee - May be obtained from IEEE Service Center
- Publish Date: 1992
- Publish Location: New York, NY - Piscataway, NJ
“Conference record” Subjects and Themes:
- Subjects: ➤ Congresses - Automatic test equipment - Avionics - Maintainability (Engineering) - Engineering (General) - Technology & Industrial Arts
Edition Identifiers:
- The Open Library ID: OL10998349M - OL20524406M
- Online Computer Library Center (OCLC) ID: 27672907
- Library of Congress Control Number (LCCN): 92053844
- All ISBNs: ➤ 9780780306448 - 9780780306431 - 0780306449 - 0780306430 - 9780780306455 - 0780306457
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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37Survey of Saturn/Apollo checkout automation, spring 1965
By L. T. Mast
“Survey of Saturn/Apollo checkout automation, spring 1965” Metadata:
- Title: ➤ Survey of Saturn/Apollo checkout automation, spring 1965
- Author: L. T. Mast
- Language: English
- Number of Pages: Median: 27
- Publisher: Rand Corporation - Rand Corp.
- Publish Date: 1966
- Publish Location: Santa Monica, Calif
“Survey of Saturn/Apollo checkout automation, spring 1965” Subjects and Themes:
- Subjects: Automatic test equipment - Saturn launch vehicles - Project Apollo (U.S.) - Saturn Project (U.S.)
Edition Identifiers:
- The Open Library ID: OL16648238M - OL5183781M
- Library of Congress Control Number (LCCN): 75001772
Access and General Info:
- First Year Published: 1966
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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38Advanced System for Automatically Detecting Faults Occurring in Bearings
By Peter W. Tse and Jacko C. Leung
“Advanced System for Automatically Detecting Faults Occurring in Bearings” Metadata:
- Title: ➤ Advanced System for Automatically Detecting Faults Occurring in Bearings
- Authors: Peter W. TseJacko C. Leung
- Language: English
- Number of Pages: Median: 80
- Publisher: ➤ Nova Science Publishers, Incorporated - Nova Novinka
- Publish Date: 2010 - 2021
“Advanced System for Automatically Detecting Faults Occurring in Bearings” Subjects and Themes:
- Subjects: Bearings (machinery) - Electronic instruments - Bearings - Testing - Automatic test equipment
Edition Identifiers:
- The Open Library ID: OL36290965M - OL27670047M
- Library of Congress Control Number (LCCN): 2010027134
- All ISBNs: 9781617612381 - 1617289531 - 1617612383 - 9781617289538
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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39IEEE standard for test equipment description language (TEDL)
“IEEE standard for test equipment description language (TEDL)” Metadata:
- Title: ➤ IEEE standard for test equipment description language (TEDL)
- Language: English
- Number of Pages: Median: 64
- Publisher: ➤ Inst of Elect & Electronic - Institute of Electrical and Electronics Engineers
- Publish Date: 1997 - 1998
- Publish Location: New York, NY
“IEEE standard for test equipment description language (TEDL)” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Electronic apparatus and appliances - Data processing - Testing - ATLAS (Computer program language) - Standards
Edition Identifiers:
- The Open Library ID: OL19013170M - OL12094011M
- Online Computer Library Center (OCLC) ID: 37514771
- All ISBNs: 1559379154 - 9781559379151
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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40Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machinery
By Paul S. Lederer
“Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machinery” Metadata:
- Title: ➤ Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machinery
- Author: Paul S. Lederer
- Language: English
- Number of Pages: Median: 436
- Publisher: ➤ For sale by the Supt. of Docs., U.S. G.P.O. - National Bureau of Standards - U.S. Dept. of Commerce, National Bureau of Standards
- Publish Date: 1981
- Publish Location: Washington, D.C
“Sensor handbook for automatic test, monitoring, diagnostic, and control systems applications to military vehicles and machinery” Subjects and Themes:
- Subjects: Automatic test equipment - Military Vehicles
Edition Identifiers:
- The Open Library ID: OL3919253M - OL18851031M
- Library of Congress Control Number (LCCN): 81600127
Access and General Info:
- First Year Published: 1981
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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41Fault detection in asynchronous sequential machines
By Aaron Ashkinazy
“Fault detection in asynchronous sequential machines” Metadata:
- Title: ➤ Fault detection in asynchronous sequential machines
- Author: Aaron Ashkinazy
- Language: English
- Number of Pages: Median: 191
- Publish Date: 1970
- Publish Location: [New York?]
“Fault detection in asynchronous sequential machines” Subjects and Themes:
- Subjects: Automatic test equipment
Edition Identifiers:
- The Open Library ID: OL5334396M
- Library of Congress Control Number (LCCN): 72187662
Access and General Info:
- First Year Published: 1970
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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42IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)
By Institute of Electrical and Electronics Engineers
“IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)” Metadata:
- Title: ➤ IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)
- Author: ➤ Institute of Electrical and Electronics Engineers
- Language: English
- Number of Pages: Median: 96
- Publisher: ➤ Institute of Electrical and Electronics Engineers - IEEE Standards Office
- Publish Date: 1990
- Publish Location: New York, NY
“IEEE Trial-Use Standard for Test Equipment Description Language (Tedl)” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Electronic apparatus and appliances - Data processing - Testing - ATLAS (Computer program language) - Standards
Edition Identifiers:
- The Open Library ID: OL12093520M - OL20525988M
- Online Computer Library Center (OCLC) ID: 22338549
- Library of Congress Control Number (LCCN): 90055419
- All ISBNs: 1559370297 - 9781559370295
Author's Alternative Names:
"Institute of Electrical and Electronics Engineers", "IEEE", "Ieee" and "Institute of Electrical & Electronics En"Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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43Computer controlled testing and instrumentation
By Martin Colloms
“Computer controlled testing and instrumentation” Metadata:
- Title: ➤ Computer controlled testing and instrumentation
- Author: Martin Colloms
- Language: English
- Number of Pages: Median: 151
- Publisher: Wiley - Pentech Press
- Publish Date: 1983
- Publish Location: New York - London
“Computer controlled testing and instrumentation” Subjects and Themes:
- Subjects: Computer interfaces - Automatic test equipment - IEEE-488 (Computer bus) - Computer engineering
Edition Identifiers:
- The Open Library ID: OL16567687M - OL3231260M
- Online Computer Library Center (OCLC) ID: 10321612 - 9646368
- Library of Congress Control Number (LCCN): 83143816
- All ISBNs: 9780727303103 - 0727303104 - 9780470274064 - 0470274069
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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44A description and analytic discussion of ten new concepts for electronics maintenance
By Edgar L. Shriver
“A description and analytic discussion of ten new concepts for electronics maintenance” Metadata:
- Title: ➤ A description and analytic discussion of ten new concepts for electronics maintenance
- Author: Edgar L. Shriver
- Language: English
- Number of Pages: Median: 136
- Publisher: ➤ George Washington University, Human Resources Research Office
- Publish Date: 1966
- Publish Location: Alexandria, Va
“A description and analytic discussion of ten new concepts for electronics maintenance” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Electronic apparatus and appliances - Electronics in military engineering - Maintenance and repair
Edition Identifiers:
- The Open Library ID: OL4204908M
- Library of Congress Control Number (LCCN): 80484123
Access and General Info:
- First Year Published: 1966
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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45International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton
By International Conference on New Developments in Automatic Testing Brighton, Eng. 1977.
“International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton” Metadata:
- Title: ➤ International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton
- Author: ➤ International Conference on New Developments in Automatic Testing Brighton, Eng. 1977.
- Language: English
- Number of Pages: Median: 107
- Publisher: The Institution
- Publish Date: 1977
- Publish Location: London
“International Conference on New Developments in Automatic Testing, 30 November-2 December 1977, venue Metropole Convention Centre, Brighton” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Electronic instruments
Edition Identifiers:
- The Open Library ID: OL4289059M
- Online Computer Library Center (OCLC) ID: 4134252
- Library of Congress Control Number (LCCN): 78316180
- All ISBNs: 9780852961841 - 0852961847
Access and General Info:
- First Year Published: 1977
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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46Diagnostyka systemów technicznych
By Konferencja Diagnostyka i Niezawodność Systemów Międzygórze, Poland 1976.
“Diagnostyka systemów technicznych” Metadata:
- Title: ➤ Diagnostyka systemów technicznych
- Author: ➤ Konferencja Diagnostyka i Niezawodność Systemów Międzygórze, Poland 1976.
- Language: pol
- Number of Pages: Median: 113
- Publisher: ➤ Wydawn. Politechniki Wrocławskiej
- Publish Date: 1976
- Publish Location: Wrocław
“Diagnostyka systemów technicznych” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL4178100M
- Library of Congress Control Number (LCCN): 80455772
Access and General Info:
- First Year Published: 1976
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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47Automated testing for electronics manufacturing, March 21-23, 1977 ... Cambridge, MA
By ATE Seminar Cambridge, Mass. 1977.
“Automated testing for electronics manufacturing, March 21-23, 1977 ... Cambridge, MA” Metadata:
- Title: ➤ Automated testing for electronics manufacturing, March 21-23, 1977 ... Cambridge, MA
- Author: ➤ ATE Seminar Cambridge, Mass. 1977.
- Language: English
- Number of Pages: Median: 187
- Publisher: Benwill Pub. Corp.
- Publish Date: 1977
- Publish Location: [s.l.]
“Automated testing for electronics manufacturing, March 21-23, 1977 ... Cambridge, MA” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Congresses - Electronic apparatus and appliances - Electronic industries - Testing
Edition Identifiers:
- The Open Library ID: OL4580670M
- Library of Congress Control Number (LCCN): 77153315
Access and General Info:
- First Year Published: 1977
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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48Selecting and sequencing tests in an adaptive countdown
By Richard D. Wollmer
“Selecting and sequencing tests in an adaptive countdown” Metadata:
- Title: ➤ Selecting and sequencing tests in an adaptive countdown
- Author: Richard D. Wollmer
- Language: English
- Number of Pages: Median: 66
- Publisher: Rand Corporation
- Publish Date: 1966
- Publish Location: Santa Monica, Calif
“Selecting and sequencing tests in an adaptive countdown” Subjects and Themes:
- Subjects: Automatic test equipment - Project Apollo (U.S.)
Edition Identifiers:
- The Open Library ID: OL16648374M
Access and General Info:
- First Year Published: 1966
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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49Automatic test equipment for electronic components
By William A. Heffner
“Automatic test equipment for electronic components” Metadata:
- Title: ➤ Automatic test equipment for electronic components
- Author: William A. Heffner
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration; [for sale by the National Technical Information Service, Springfield, Va.]
- Publish Date: 1971
- Publish Location: Washington
“Automatic test equipment for electronic components” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Electronic apparatus and appliances - Testing
Edition Identifiers:
- The Open Library ID: OL5168795M
- Library of Congress Control Number (LCCN): 74611397
Access and General Info:
- First Year Published: 1971
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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50Automatic testing of electronic devices
By Meyer Cook
“Automatic testing of electronic devices” Metadata:
- Title: ➤ Automatic testing of electronic devices
- Author: Meyer Cook
- Language: English
- Number of Pages: Median: 57
- Publisher: ICS
- Publish Date: 1972
- Publish Location: Scranton, Pa
“Automatic testing of electronic devices” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Electronic apparatus and appliances - Testing
Edition Identifiers:
- The Open Library ID: OL5319596M
- Library of Congress Control Number (LCCN): 72170014
Access and General Info:
- First Year Published: 1972
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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