Test Conference - Info and Reading Options
By International Test Conference (18th 1987 Washington, D.C.)
"Test Conference" was published by IEEE Computer Society Press,U.S. in September 1987, it has 1050 pages and the language of the book is English.
“Test Conference” Metadata:
- Title: Test Conference
- Author: ➤ International Test Conference (18th 1987 Washington, D.C.)
- Language: English
- Number of Pages: 1050
- Publisher: ➤ IEEE Computer Society Press,U.S.
- Publish Date: September 1987
“Test Conference” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Circuits - Congresses - Electronic digital computers - Integrated circuits - Semiconductors - Testing
Edition Specifications:
- Format: Hardcover
Edition Identifiers:
- The Open Library ID: OL11389135M - OL4993662W
- Library of Congress Control Number (LCCN): 87080439
- ISBN-13: 9780818607981
- ISBN-10: 081860798X
- All ISBNs: 081860798X - 9780818607981
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