International Test Conference 1990 - Info and Reading Options
Changing the Philosophy of Tests (International Test Conference//Proceedings)
By International Test Conference (21st 1990 Washington, D.C.)
"International Test Conference 1990" was published by Ieee Computer Society in June 1990, it has 1083 pages and the language of the book is English.
“International Test Conference 1990” Metadata:
- Title: ➤ International Test Conference 1990
- Author: ➤ International Test Conference (21st 1990 Washington, D.C.)
- Language: English
- Number of Pages: 1083
- Publisher: Ieee Computer Society
- Publish Date: June 1990
“International Test Conference 1990” Subjects and Themes:
- Subjects: ➤ Automatic test equipment - Circuits - Congresses - Electronic digital computers - Integrated circuits - Semiconductors - Testing
Edition Specifications:
- Format: Hardcover
Edition Identifiers:
- The Open Library ID: OL11390803M - OL4484244W
- Library of Congress Control Number (LCCN): 90055486
- ISBN-13: 9780818690648
- ISBN-10: 081869064X
- All ISBNs: 081869064X - 9780818690648
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