Simulation and Test Generation Environments, IEEE Workshop - Info and Reading Options
Proceedings/86Ch2296-2
By IEEE Workshop on Simulation & Test Generation Environments (1985 San Francisco, Calif.)
"Simulation and Test Generation Environments, IEEE Workshop" was published by Ieee in December 1986 and the language of the book is English.
“Simulation and Test Generation Environments, IEEE Workshop” Metadata:
- Title: ➤ Simulation and Test Generation Environments, IEEE Workshop
- Author: ➤ IEEE Workshop on Simulation & Test Generation Environments (1985 San Francisco, Calif.)
- Language: English
- Publisher: Ieee
- Publish Date: December 1986
“Simulation and Test Generation Environments, IEEE Workshop” Subjects and Themes:
- Subjects: Automatic test equipment - Congresses - Integrated circuits - Testing - Image processing
Edition Specifications:
- Format: Hardcover
Edition Identifiers:
- The Open Library ID: OL11390704M - OL5285349W
- Library of Congress Control Number (LCCN): 86080457
- ISBN-13: 9780818687327
- ISBN-10: 0818687320
- All ISBNs: 0818687320 - 9780818687327
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