Explore: Single Event Upsets
Discover books, insights, and more — all in one place.
Learn more about Single Event Upsets with top reads curated from trusted sources — all in one place.
AI-Generated Overview About “single-event-upsets”:
Books Results
Source: The Open Library
The Open Library Search Results
Search results from The Open Library
1Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
By Victor A. Carreño
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Metadata:
- Title: ➤ Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
- Author: Victor A. Carreño
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division - National Technical Information Service, distributor]
- Publish Date: 1990
- Publish Location: ➤ [Washington, DC] - [Springfield, Va
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Subjects and Themes:
- Subjects: ➤ Logic programming - Fault tolerance - Digital simulation - Latch-up - Analog simulation - Error analysis - Single event upsets
Edition Identifiers:
- The Open Library ID: OL18077194M - OL15405376M
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
Find Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
2Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
By Victor A. Carreno
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Metadata:
- Title: ➤ Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
- Author: Victor A. Carreno
- Language: English
- Number of Pages: Median: 10
- Publisher: ➤ Langley Research Center - National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division - National Technical Information Service, distributor]
- Publish Date: 1990
- Publish Location: ➤ [Springfield, Va - [Washington, DC] - Hampton, Va
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Subjects and Themes:
- Subjects: ➤ Errors - Avionics - Digital simulation - Latch-up - Error analysis - Logic programming - Control system - Analog simulation - Fault tolerance - Single event upsets
Edition Identifiers:
- The Open Library ID: OL21334050M - OL17114174M
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
Find Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
3Upper bound SEU rate for devices in an isotropic or nonisotropic flux
By Larry D. Edmonds
“Upper bound SEU rate for devices in an isotropic or nonisotropic flux” Metadata:
- Title: ➤ Upper bound SEU rate for devices in an isotropic or nonisotropic flux
- Author: Larry D. Edmonds
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration, Jet Propulsion Laboratory, California Institute of Technology - National Technical Information Service, distributor
- Publish Date: 1992
- Publish Location: ➤ Pasadena, Calif - [Springfield, Va
“Upper bound SEU rate for devices in an isotropic or nonisotropic flux” Subjects and Themes:
- Subjects: ➤ Fluence - Radiation shielding - Directivity - Mathematical models - Energy transfer - Single event upsets
Edition Identifiers:
- The Open Library ID: OL15500355M
Access and General Info:
- First Year Published: 1992
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
Find Upper bound SEU rate for devices in an isotropic or nonisotropic flux at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
4The single event effect characteristics of the 486-DX4 microprocessor
By Coy Kouba
“The single event effect characteristics of the 486-DX4 microprocessor” Metadata:
- Title: ➤ The single event effect characteristics of the 486-DX4 microprocessor
- Author: Coy Kouba
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration - National Technical Information Service, distributor
- Publish Date: 1996
- Publish Location: ➤ [Washington, DC - Springfield, Va
“The single event effect characteristics of the 486-DX4 microprocessor” Subjects and Themes:
- Subjects: ➤ Radiation tolerance - Aerospace environments - Computers - Reliability - Microprocessors - Semiconductors (Materials) - Single event upsets - Space flight - Disrupting
Edition Identifiers:
- The Open Library ID: OL15506836M
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
Find The single event effect characteristics of the 486-DX4 microprocessor at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.