Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system - Info and Reading Options
By Victor A. Carreño
"Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system" was published by National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division in 1990 - [Washington, DC] and the language of the book is English.
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Metadata:
- Title: ➤ Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
- Author: Victor A. Carreño
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division
- Publish Date: 1990
- Publish Location: [Washington, DC]
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Subjects and Themes:
- Subjects: ➤ Logic programming - Fault tolerance - Digital simulation - Latch-up - Analog simulation - Error analysis - Single event upsets
Edition Specifications:
- Format: Microform
- Pagination: 1 v.
Edition Identifiers:
- The Open Library ID: OL15405376M - OL11545173W
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