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Analog Digital Simulation Of Transient Induced Logic Errors And Upset Susceptibility Of An Advanced Control System
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1Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
By Victor A. Carreño
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Metadata:
- Title: ➤ Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
- Author: Victor A. Carreño
- Language: English
- Publisher: ➤ National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division - National Technical Information Service, distributor]
- Publish Date: 1990
- Publish Location: ➤ [Washington, DC] - [Springfield, Va
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Subjects and Themes:
- Subjects: ➤ Logic programming - Fault tolerance - Digital simulation - Latch-up - Analog simulation - Error analysis - Single event upsets
Edition Identifiers:
- The Open Library ID: OL18077194M - OL15405376M
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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2Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
By Victor A. Carreno
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Metadata:
- Title: ➤ Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
- Author: Victor A. Carreno
- Language: English
- Number of Pages: Median: 10
- Publisher: ➤ Langley Research Center - National Aeronautics and Space Administration, Office of Management, Scientific and Technical Information Division - National Technical Information Service, distributor]
- Publish Date: 1990
- Publish Location: ➤ [Springfield, Va - [Washington, DC] - Hampton, Va
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Subjects and Themes:
- Subjects: ➤ Errors - Avionics - Digital simulation - Latch-up - Error analysis - Logic programming - Control system - Analog simulation - Fault tolerance - Single event upsets
Edition Identifiers:
- The Open Library ID: OL21334050M - OL17114174M
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
Find Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
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