Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system - Info and Reading Options
By Victor A. Carreno
"Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system" was published by Langley Research Center in 1990 - Hampton, Va and it has 10 pages.
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Metadata:
- Title: ➤ Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system
- Author: Victor A. Carreno
- Number of Pages: 10
- Publisher: Langley Research Center
- Publish Date: 1990
- Publish Location: Hampton, Va
“Analog-digital simulation of transient-induced logic errors and upset susceptibility of an advanced control system” Subjects and Themes:
- Subjects: ➤ Errors - Avionics - Digital simulation - Latch-up - Error analysis - Logic programming - Control system - Analog simulation - Fault tolerance - Single event upsets
Edition Specifications:
- Pagination: 10 p. :
Edition Identifiers:
- The Open Library ID: OL21334050M - OL12053227W
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