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Source: The Open Library

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1Digest of papers

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Book's cover

“Digest of papers” Metadata:

  • Title: Digest of papers
  • Author: ➤  
  • Language: English
  • Number of Pages: Median: 105
  • Publisher: IEEE Computer Society Press
  • Publish Date:
  • Publish Location: Los Alamitos, Calif

“Digest of papers” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1996
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Borrowable

Online Access

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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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2Iddq testing for CMOS VLSI

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Book's cover

“Iddq testing for CMOS VLSI” Metadata:

  • Title: Iddq testing for CMOS VLSI
  • Author:
  • Language: English
  • Number of Pages: Median: 193
  • Publisher: Artech House
  • Publish Date:
  • Publish Location: Boston

“Iddq testing for CMOS VLSI” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1995
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Borrowable

Online Access

Downloads Are Not Available:

The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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3IEEE International Workshop on IDDQ Testing

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Book's cover

“IEEE International Workshop on IDDQ Testing” Metadata:

  • Title: ➤  IEEE International Workshop on IDDQ Testing
  • Authors: ➤  
  • Language: English
  • Number of Pages: Median: 119
  • Publisher: ➤  IEEE Computer Society Press - Institute of Electrical & Electronics Enginee
  • Publish Date:
  • Publish Location: Los Alamitos, Calif

“IEEE International Workshop on IDDQ Testing” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1997
  • Is Full Text Available: No
  • Is The Book Public: No
  • Access Status: No_ebook

Online Access

Downloads Are Not Available:

The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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    41998 IEEE International Workshop on IDDQ Testing

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    “1998 IEEE International Workshop on IDDQ Testing” Metadata:

    • Title: ➤  1998 IEEE International Workshop on IDDQ Testing
    • Authors: ➤  
    • Language: English
    • Number of Pages: Median: 82
    • Publisher: ➤  IEEE Computer Society Press - Institute of Electrical & Electronics Enginee
    • Publish Date:
    • Publish Location: Los Alamitos, California

    “1998 IEEE International Workshop on IDDQ Testing” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1998
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

    Online Access

    Downloads Are Not Available:

    The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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      5IDDQ testing of VLSI circuits

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      Book's cover

      “IDDQ testing of VLSI circuits” Metadata:

      • Title: IDDQ testing of VLSI circuits
      • Author:
      • Language: English
      • Number of Pages: Median: 124
      • Publisher: ➤  Kluwer Academic Publishers - Springer
      • Publish Date:
      • Publish Location: Boston

      “IDDQ testing of VLSI circuits” Subjects and Themes:

      Edition Identifiers:

      First Setence:

      "It is natural to be skeptical when someone says it is possible to determine the state-of-health of a complex integrated circuit with a few simple tests."

      Access and General Info:

      • First Year Published: 1992
      • Is Full Text Available: No
      • Is The Book Public: No
      • Access Status: No_ebook

      Online Access

      Downloads Are Not Available:

      The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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        62000 IEEE International Workshop on Defect Based Testing

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        Book's cover

        “2000 IEEE International Workshop on Defect Based Testing” Metadata:

        • Title: ➤  2000 IEEE International Workshop on Defect Based Testing
        • Authors: ➤  
        • Language: English
        • Number of Pages: Median: 84
        • Publisher: ➤  IEEE Computer Society - Institute of Electrical & Electronics Enginee
        • Publish Date:
        • Publish Location: Los Alamitos, Calif

        “2000 IEEE International Workshop on Defect Based Testing” Subjects and Themes:

        Edition Identifiers:

        Access and General Info:

        • First Year Published: 2000
        • Is Full Text Available: No
        • Is The Book Public: No
        • Access Status: No_ebook

        Online Access

        Downloads Are Not Available:

        The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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          7Bridging faults and IDDQ testing

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          “Bridging faults and IDDQ testing” Metadata:

          • Title: ➤  Bridging faults and IDDQ testing
          • Authors:
          • Language: English
          • Number of Pages: Median: 128
          • Publisher: IEEE Computer Society Press
          • Publish Date:
          • Publish Location: Los Alamitos, Calif

          “Bridging faults and IDDQ testing” Subjects and Themes:

          Edition Identifiers:

          Access and General Info:

          • First Year Published: 1992
          • Is Full Text Available: No
          • Is The Book Public: No
          • Access Status: No_ebook

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          8Introduction to ID̳D̳Q̳ testing

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          Book's cover

          “Introduction to ID̳D̳Q̳ testing” Metadata:

          • Title: ➤  Introduction to ID̳D̳Q̳ testing
          • Author:
          • Language: English
          • Number of Pages: Median: 322
          • Publisher: Kluwer Academic Publishers
          • Publish Date:
          • Publish Location: Boston

          “Introduction to ID̳D̳Q̳ testing” Subjects and Themes:

          Edition Identifiers:

          Access and General Info:

          • First Year Published: 1997
          • Is Full Text Available: No
          • Is The Book Public: No
          • Access Status: No_ebook

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          9DBT 2004

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          “DBT 2004” Metadata:

          • Title: DBT 2004
          • Author: ➤  
          • Language: English
          • Number of Pages: Median: 112
          • Publisher: IEEE
          • Publish Date:
          • Publish Location: Piscataway, N.J

          “DBT 2004” Subjects and Themes:

          Edition Identifiers:

          Access and General Info:

          • First Year Published: 2004
          • Is Full Text Available: No
          • Is The Book Public: No
          • Access Status: No_ebook

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