2000 IEEE International Workshop on Defect Based Testing - Info and Reading Options
April 30, 2000, Montreal, Canada : proceedings
By IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec), Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon and Quebec) IEEE VLSI Test Symposium (2000 : Montreal
"2000 IEEE International Workshop on Defect Based Testing" was published by IEEE Computer Society in 2000 - Los Alamitos, Calif, it has 82 pages and the language of the book is English.
“2000 IEEE International Workshop on Defect Based Testing” Metadata:
- Title: ➤ 2000 IEEE International Workshop on Defect Based Testing
- Authors: ➤ IEEE International Workshop on Defect Based Testing (2000 Montréal, Québec)Yashwant K. MalaiyaManoj SachdevSankaran M. MenonQuebec) IEEE VLSI Test Symposium (2000 : Montreal
- Language: English
- Number of Pages: 82
- Publisher: IEEE Computer Society
- Publish Date: 2000
- Publish Location: Los Alamitos, Calif
“2000 IEEE International Workshop on Defect Based Testing” Subjects and Themes:
- Subjects: ➤ Complementary Metal oxide semiconductors - Congresses - Defects - Iddq testing - Integrated circuits - Electronics engineering - Systems analysis & design - Systems management - Digital Computer Hardware - Metal oxide semiconductors, Complementary - Computers - Technology & Industrial Arts - Computer Books: General - General - Metal oxide semiconductors, Co - Computer Engineering - Testing
Edition Specifications:
- Pagination: ix, 82 p. :
Edition Identifiers:
- The Open Library ID: OL6798331M - OL7799246W
- Online Computer Library Center (OCLC) ID: 44935580
- Library of Congress Control Number (LCCN): 00102862
- ISBN-10: 0769506372
- All ISBNs: 0769506372
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