IDDQ testing of VLSI circuits - Info and Reading Options
By Ravi K. Gulati
"IDDQ testing of VLSI circuits" was published by Kluwer Academic Publishers in 1993 - Boston, it has 120 pages and the language of the book is English.
“IDDQ testing of VLSI circuits” Metadata:
- Title: IDDQ testing of VLSI circuits
- Author: Ravi K. Gulati
- Language: English
- Number of Pages: 120
- Publisher: Kluwer Academic Publishers
- Publish Date: 1993
- Publish Location: Boston
“IDDQ testing of VLSI circuits” Subjects and Themes:
- Subjects: ➤ Complementary Metal oxide semiconductors - Very large scale integration - Testing - Integrated circuits - Iddq testing - Integrated circuits, very large scale integration - Metal oxide semiconductors, complementary
Edition Specifications:
- Pagination: 120 p. :
Edition Identifiers:
- The Open Library ID: OL1735011M - OL18276317W
- Library of Congress Control Number (LCCN): 92039926
- ISBN-10: 0792393155
- All ISBNs: 0792393155
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