Explore: Soft Errors (computer Science)
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AI-Generated Overview About “soft-errors-%28computer-science%29”:
Books Results
Source: The Open Library
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Search results from The Open Library
1Soft Errors
By Jean-Luc Autran and Daniela Munteanu
“Soft Errors” Metadata:
- Title: Soft Errors
- Authors: Jean-Luc AutranDaniela Munteanu
- Language: English
- Number of Pages: Median: 439
- Publisher: Taylor & Francis Group
- Publish Date: 2015 - 2017 - 2020
“Soft Errors” Subjects and Themes:
- Subjects: ➤ Digital integrated circuits - Electronic circuit design - Computer science - Particles - Atmospheric radiation - Cosmic rays - Soft errors (Computer science) - Erreurs temporaires (Informatique) - Rayonnement atmosphérique - Rayonnement cosmique - Particules (Matière) - BUSINESS & ECONOMICS - Infrastructure - SOCIAL SCIENCE - General
Edition Identifiers:
- The Open Library ID: ➤ OL28762142M - OL33616214M - OL33670329M - OL34681296M - OL33535939M - OL33758507M - OL33506168M
- Online Computer Library Center (OCLC) ID: 903644086
- Library of Congress Control Number (LCCN): 2015297036
- All ISBNs: ➤ 9781315215662 - 1466590831 - 1322999023 - 9780367655990 - 0367655993 - 9781351822862 - 1351822861 - 9781466590847 - 1315215667 - 9781322999029 - 146659084X - 9781466590830 - 1351831550 - 9781351831550
Access and General Info:
- First Year Published: 2015
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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2Dependability in electronic systems
By Nobuyasu Kanekawa
“Dependability in electronic systems” Metadata:
- Title: ➤ Dependability in electronic systems
- Author: Nobuyasu Kanekawa
- Language: English
- Number of Pages: Median: 218
- Publisher: Springer - Springer New York
- Publish Date: 2010 - 2011 - 2014
- Publish Location: New York
“Dependability in electronic systems” Subjects and Themes:
- Subjects: ➤ Computer systems - Reliability - Electronic apparatus and appliances - Electronic systems - System failures (Engineering) - Systems engineering - Engineering - Computer-aided design - power - current - voltage - neutron - frequency - data - noise - system - mcu - power supply - power integrity - supply noise - junction current - semiconductor devices - magnetic field - soft error - time diversity - bypass capacitor - current distribution - Soft errors (Computer science) - Electronic digital computers, reliability
Edition Identifiers:
- The Open Library ID: OL37124980M - OL36212674M - OL28142177M - OL25004104M
- Online Computer Library Center (OCLC) ID: 646114049
- Library of Congress Control Number (LCCN): 2010937189
- All ISBNs: ➤ 1489985948 - 144196715X - 1441967168 - 1441967141 - 9781489985941 - 9781441967169 - 9781441967152 - 9781441967145
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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3Soft errors in modern electronic systems
By Michael Nicolaidis
“Soft errors in modern electronic systems” Metadata:
- Title: ➤ Soft errors in modern electronic systems
- Author: Michael Nicolaidis
- Language: English
- Number of Pages: Median: 318
- Publisher: ➤ Springer - Springer London, Limited
- Publish Date: 2010 - 2011 - 2012
- Publish Location: New York
“Soft errors in modern electronic systems” Subjects and Themes:
- Subjects: ➤ Electronic systems - Integrated circuits, very large scale integration - System failures (engineering) - Electronic apparatus and appliances, effect of radiation on - Soft errors (Computer science)
Edition Identifiers:
- The Open Library ID: OL34375208M - OL30582704M - OL25403207M
- Online Computer Library Center (OCLC) ID: 699778302
- Library of Congress Control Number (LCCN): 2010933852
- All ISBNs: ➤ 9781441969941 - 1461426898 - 9781441969934 - 9781461426899 - 9781441969927 - 1441969926 - 1441969934 - 1441969942
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
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4Architecture Design for Soft Errors
By Shubu Mukherjee
“Architecture Design for Soft Errors” Metadata:
- Title: ➤ Architecture Design for Soft Errors
- Author: Shubu Mukherjee
- Language: English
- Number of Pages: Median: 360
- Publisher: ➤ Elsevier Science & Technology Books - Morgan Kaufmann
- Publish Date: 2008 - 2011
“Architecture Design for Soft Errors” Subjects and Themes:
- Subjects: ➤ Electronic circuit design - Integrated circuits - Effect of radiation on - Soft errors (Computer science) - Computer architecture - System design
Edition Identifiers:
- The Open Library ID: OL35753999M - OL10071885M
- Online Computer Library Center (OCLC) ID: 822336285
- Library of Congress Control Number (LCCN): 2007048527
- All ISBNs: 9780080558325 - 9780123695291 - 0123695295 - 0080558321
Author's Alternative Names:
"Shubhendu Mukherjee" and "Shubhendu S. Mukherjee"Access and General Info:
- First Year Published: 2008
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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5Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)
By Daniel M. Fleetwood
“Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)” Metadata:
- Title: ➤ Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)
- Author: Daniel M. Fleetwood
- Language: English
- Number of Pages: Median: 348
- Publisher: ➤ World Scientific Publishing Company
- Publish Date: 2004
“Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems)” Subjects and Themes:
- Subjects: Electronic circuits - Effect of radiation on - Integrated circuits - Soft errors (Computer science) - Electronic apparatus and appliances, effect of radiation on
Edition Identifiers:
- The Open Library ID: OL9501400M
- Library of Congress Control Number (LCCN): 2006273469
- All ISBNs: 9789812389404 - 9812389407
First Setence:
"Radiation effects have long been one of the most serious issues in spacecraft and aviation electronics."
Access and General Info:
- First Year Published: 2004
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
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6Terrestrial neutron-induced soft errors in advanced memory devices
By Takashi Nakamura
“Terrestrial neutron-induced soft errors in advanced memory devices” Metadata:
- Title: ➤ Terrestrial neutron-induced soft errors in advanced memory devices
- Author: Takashi Nakamura
- Language: English
- Number of Pages: Median: 343
- Publisher: World Scientific
- Publish Date: 2008
- Publish Location: Hackensack, NJ
“Terrestrial neutron-induced soft errors in advanced memory devices” Subjects and Themes:
- Subjects: ➤ Radiation dosimetry - Semiconductor storage devices - Neutron irradiation - Nuclear physics - Soft errors (Computer science) - Computer storage devices - Semiconductors
Edition Identifiers:
- The Open Library ID: OL17104636M
- Library of Congress Control Number (LCCN): 2008298667
- All ISBNs: 9812778810 - 9789812778819
Access and General Info:
- First Year Published: 2008
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
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