Terrestrial neutron-induced soft errors in advanced memory devices - Info and Reading Options
By Takashi Nakamura
"Terrestrial neutron-induced soft errors in advanced memory devices" was published by World Scientific in 2008 - Hackensack, NJ, it has 343 pages and the language of the book is English.
“Terrestrial neutron-induced soft errors in advanced memory devices” Metadata:
- Title: ➤ Terrestrial neutron-induced soft errors in advanced memory devices
- Author: Takashi Nakamura
- Language: English
- Number of Pages: 343
- Publisher: World Scientific
- Publish Date: 2008
- Publish Location: Hackensack, NJ
“Terrestrial neutron-induced soft errors in advanced memory devices” Subjects and Themes:
- Subjects: ➤ Radiation dosimetry - Semiconductor storage devices - Neutron irradiation - Nuclear physics - Soft errors (Computer science) - Computer storage devices - Semiconductors
Edition Specifications:
- Pagination: xxii, 343 p. :
Edition Identifiers:
- The Open Library ID: OL17104636M - OL16940512W
- Library of Congress Control Number (LCCN): 2008298667
- ISBN-13: 9789812778819
- ISBN-10: 9812778810
- All ISBNs: 9812778810 - 9789812778819
AI-generated Review of “Terrestrial neutron-induced soft errors in advanced memory devices”:
"Terrestrial neutron-induced soft errors in advanced memory devices" Table Of Contents:
- 1- Introduction
- 2- Terrestrial neutron spectrometry and dosimetry
- 3- Irradiation testing in the terrestrial field
- 4- Neutron irradiation test facilities
- 5- Review and discussion of experimental data
- 6- Monte Carlo simulation methods
- 7- Simulation results and their implications
- 8- International standardization of the neutron test method
- 9- Summary and challenges.
Read “Terrestrial neutron-induced soft errors in advanced memory devices”:
Read “Terrestrial neutron-induced soft errors in advanced memory devices” by choosing from the options below.
Search for “Terrestrial neutron-induced soft errors in advanced memory devices” downloads:
Visit our Downloads Search page to see if downloads are available.
Find “Terrestrial neutron-induced soft errors in advanced memory devices” in Libraries Near You:
Read or borrow “Terrestrial neutron-induced soft errors in advanced memory devices” from your local library.
- The WorldCat Libraries Catalog: Find a copy of “Terrestrial neutron-induced soft errors in advanced memory devices” at a library near you.
Buy “Terrestrial neutron-induced soft errors in advanced memory devices” online:
Shop for “Terrestrial neutron-induced soft errors in advanced memory devices” on popular online marketplaces.
- Ebay: New and used books.