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1High resolution electron microscopy of defects in materials

By Robert Sinclair and David J. Smith (undifferentiated)

“High resolution electron microscopy of defects in materials” Metadata:

Title: ➤ High resolution electron microscopy of defects in materials
Authors: ➤ Robert SinclairDavid J. Smith (undifferentiated)
Language: English
Number of Pages: Median: 391
Publisher: ➤ Cambridge University Press - Materials Research Society - University of Cambridge ESOL Examinations
Publish Date: 1990 - 2014
Publish Location: Pittsburgh, Pa

“High resolution electron microscopy of defects in materials” Subjects and Themes:

Subjects: ➤ Materials - Congresses - Defects - Microscopy - High resolution electron microscopy - Non-Destructive Testing Of Materials - Science/Mathematics - High resolution electron micro - Materials, microscopy - Electron microscopes - Electron microscopy

Edition Identifiers:

The Open Library ID: OL29205696M - OL8608751M - OL1880885M
Online Computer Library Center (OCLC) ID: 22117610
Library of Congress Control Number (LCCN): 90041466
All ISBNs: 9781558990722 - 1558990720 - 1107410150 - 9781107410152

Access and General Info:

First Year Published: 1990
Is Full Text Available: No
Is The Book Public: No
Access Status: No_ebook

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