High resolution electron microscopy of defects in materials - Info and Reading Options
symposium held April 16-18, 1990, San Francisco, California, U.S.A.
By Robert Sinclair and David J. Smith (undifferentiated)
"High resolution electron microscopy of defects in materials" was published by Materials Research Society in 1990 - Pittsburgh, Pa, it has 391 pages and the language of the book is English.
“High resolution electron microscopy of defects in materials” Metadata:
- Title: ➤ High resolution electron microscopy of defects in materials
- Authors: ➤ Robert SinclairDavid J. Smith (undifferentiated)
- Language: English
- Number of Pages: 391
- Publisher: Materials Research Society
- Publish Date: 1990
- Publish Location: Pittsburgh, Pa
“High resolution electron microscopy of defects in materials” Subjects and Themes:
- Subjects: ➤ Materials - Congresses - Defects - Microscopy - High resolution electron microscopy - Non-Destructive Testing Of Materials - Science/Mathematics - High resolution electron micro - Materials, microscopy - Electron microscopes - Electron microscopy
Edition Specifications:
- Pagination: xi, 391 p. :
Edition Identifiers:
- The Open Library ID: OL1880885M - OL19027142W
- Online Computer Library Center (OCLC) ID: 22117610
- Library of Congress Control Number (LCCN): 90041466
- ISBN-10: 1558990720
- All ISBNs: 1558990720
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