Explore: Flatness Measurement

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Source: The Open Library

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1Shape control

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Book's cover

“Shape control” Metadata:

  • Title: Shape control
  • Author:
  • Language: English
  • Number of Pages: Median: 126
  • Publisher: Metals Society
  • Publish Date:
  • Publish Location: London

“Shape control” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1976
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Borrowable

Online Access

Downloads Are Not Available:

The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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2Surface Characterization for Computer Disc Wafers

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Book's cover

“Surface Characterization for Computer Disc Wafers” Metadata:

  • Title: ➤  Surface Characterization for Computer Disc Wafers
  • Author:
  • Language: English
  • Number of Pages: Median: 136
  • Publisher: ➤  SPIE - Society of Photo Optical
  • Publish Date:
  • Publish Location: Bellingham, Wash., USA

“Surface Characterization for Computer Disc Wafers” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1999
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Printdisabled

Online Access

Downloads Are Not Available:

The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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    3Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays

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    Book's cover

    “Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays” Metadata:

    • Title: ➤  Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays
    • Author:
    • Language: English
    • Number of Pages: Median: 188
    • Publisher: ➤  SPIE-The International Society for Optical Engineering
    • Publish Date:
    • Publish Location: Bellingham, Wash

    “Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1996
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    4Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II

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    Book's cover

    “Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II” Metadata:

    • Title: ➤  Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II
    • Author:
    • Language: English
    • Number of Pages: Median: 186
    • Publisher: SPIE
    • Publish Date:
    • Publish Location: Bellingham, Wash., USA

    “Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1998
    • Is Full Text Available: Yes
    • Is The Book Public: No
    • Access Status: Printdisabled

    Online Access

    Downloads Are Not Available:

    The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

    Online Borrowing:

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      5Calculation of the flatness of surfaces by electronic computer

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      “Calculation of the flatness of surfaces by electronic computer” Metadata:

      • Title: ➤  Calculation of the flatness of surfaces by electronic computer
      • Author:
      • Language: English
      • Number of Pages: Median: 43
      • Publisher: ➤  Commonwealth Scientific and Industrial Research Organization
      • Publish Date:
      • Publish Location: Melbourne

      “Calculation of the flatness of surfaces by electronic computer” Subjects and Themes:

      Edition Identifiers:

      Access and General Info:

      • First Year Published: 1968
      • Is Full Text Available: No
      • Is The Book Public: No
      • Access Status: No_ebook

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