Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays - Info and Reading Options
8-9 August 1996, Denver, Colorado
By John C. Stover
"Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays" was published by SPIE-The International Society for Optical Engineering in 1996 - Bellingham, Wash, it has 188 pages and the language of the book is English.
“Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays” Metadata:
- Title: ➤ Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays
- Author: John C. Stover
- Language: English
- Number of Pages: 188
- Publisher: ➤ SPIE-The International Society for Optical Engineering
- Publish Date: 1996
- Publish Location: Bellingham, Wash
“Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays” Subjects and Themes:
- Subjects: ➤ Flatness measurement - Surface roughness - Congresses - Semiconductor wafers - Measurement - Computer vision - Computer input-output equipment
Edition Specifications:
- Pagination: vii, 188 p. :
Edition Identifiers:
- The Open Library ID: OL1015639M - OL23613308W
- Online Computer Library Center (OCLC) ID: 36228964
- Library of Congress Control Number (LCCN): 96068360
- ISBN-10: 0819422509
- All ISBNs: 0819422509
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