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AI-Generated Overview About “entegre-devreler”:
Books Results
Source: The Open Library
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1Vlsi Testing
By Stanley L. Hurst
“Vlsi Testing” Metadata:
- Title: Vlsi Testing
- Author: Stanley L. Hurst
- Language: English
- Number of Pages: Median: 560
- Publisher: ➤ Institution of Electrical Engineers - Institution of Engineering & Technology
- Publish Date: 1999 - 2011
“Vlsi Testing” Subjects and Themes:
- Subjects: ➤ Prüftechnik - VLSI - Very large scale integration - Testing - Microélectronique - Çok büyük boyutta integrasyon - Circuits intégrés à très grande échelle - Entegre devreler - Test etme - Integrated circuits - Integrated circuits, very large scale integration
Edition Identifiers:
- The Open Library ID: OL11605196M - OL49287721M
- Online Computer Library Center (OCLC) ID: 38423379
- Library of Congress Control Number (LCCN): 2013387871
- All ISBNs: 9780852969014 - 1849191654 - 9781849191654 - 0852969015
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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