Vlsi Testing - Info and Reading Options
Digital and Mixed Analogue/Digital Techniques (Circuits, Devices and Systems Series)
By Stanley L. Hurst
"Vlsi Testing" was published by Institution of Electrical Engineers in February 1999, it has 560 pages and the language of the book is English.
“Vlsi Testing” Metadata:
- Title: Vlsi Testing
- Author: Stanley L. Hurst
- Language: English
- Number of Pages: 560
- Publisher: ➤ Institution of Electrical Engineers
- Publish Date: February 1999
“Vlsi Testing” Subjects and Themes:
- Subjects: ➤ Prüftechnik - VLSI - Very large scale integration - Testing - Microélectronique - Çok büyük boyutta integrasyon - Circuits intégrés à très grande échelle - Entegre devreler - Test etme - Integrated circuits - Integrated circuits, very large scale integration
Edition Specifications:
- Format: Hardcover
- Weight: 2.3 pounds
- Dimensions: 9.3 x 6.1 x 1.5 inches
Edition Identifiers:
- The Open Library ID: OL11605196M - OL8561234W
- Online Computer Library Center (OCLC) ID: 38423379
- Library of Congress Control Number (LCCN): 2013387871
- ISBN-13: 9780852969014
- ISBN-10: 0852969015
- All ISBNs: 0852969015 - 9780852969014
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