Explore: Caractérisation
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AI-Generated Overview About “caract%C3%A9risation”:
Books Results
Source: The Open Library
The Open Library Search Results
Search results from The Open Library
1Characterization Of Semiconductor Heterostructures And Nanostructures
By Carlo Lamberti
“Characterization Of Semiconductor Heterostructures And Nanostructures” Metadata:
- Title: ➤ Characterization Of Semiconductor Heterostructures And Nanostructures
- Author: Carlo Lamberti
- Language: English
- Number of Pages: Median: 662
- Publisher: ➤ Elsevier Science & Technology Books - Elsevier Science & Technology - Elsevier Science
- Publish Date: 2008 - 2011 - 2013
“Characterization Of Semiconductor Heterostructures And Nanostructures” Subjects and Themes:
- Subjects: ➤ Semiconductors - Heterostructures - Nanostructures - Characterization - Semiconducteurs - Caractérisation - Hétérostructures
Edition Identifiers:
- The Open Library ID: OL35754862M - OL28450425M - OL33477265M - OL26179260M
- Online Computer Library Center (OCLC) ID: 214306811
- Library of Congress Control Number (LCCN): 2012554873 - 2010293073
- All ISBNs: ➤ 0444595511 - 0080558151 - 9780444595492 - 0444530991 - 9780080558158 - 044459549X - 9780444595515 - 9780444530998
Access and General Info:
- First Year Published: 2008
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
- Borrowing from Open Library: Borrowing link
- Borrowing from Archive.org: Borrowing link
Online Marketplaces
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2Conveyance of residuals from water and wastewater treatment
By Asce
“Conveyance of residuals from water and wastewater treatment” Metadata:
- Title: ➤ Conveyance of residuals from water and wastewater treatment
- Author: Asce
- Language: English
- Number of Pages: Median: 182
- Publisher: ➤ American Society of Civil Engineers - Amer Society of Civil Engineers
- Publish Date: 2000
“Conveyance of residuals from water and wastewater treatment” Subjects and Themes:
- Subjects: ➤ Management - Sewage sludge - Water treatment plant residuals - Characterization - Sewage disposal plants - Design and construction - Boues d'épuration - Gestion - Caractérisation - TECHNOLOGY & ENGINEERING - Environmental - General
Edition Identifiers:
- The Open Library ID: OL8097537M
- Online Computer Library Center (OCLC) ID: 708564355
- Library of Congress Control Number (LCCN): 99059471
- All ISBNs: 9780784404386 - 0784404380
Access and General Info:
- First Year Published: 2000
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
- Borrowing from Open Library: Borrowing link
- Borrowing from Archive.org: Borrowing link
Online Marketplaces
Find Conveyance of residuals from water and wastewater treatment at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.
3On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
By Andrej Rumiantsev
“On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond” Metadata:
- Title: ➤ On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
- Author: Andrej Rumiantsev
- Language: English
- Publisher: River Publishers
- Publish Date: 2019 - 2022
“On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond” Subjects and Themes:
- Subjects: ➤ Semiconductors - Characterization - Semiconductor wafers - Calibration - Semi-conducteurs - Caractérisation - Plaquettes à gravure en semi-conducteurs - Étalonnage - SCIENCE / Energy - TECHNOLOGY / Lasers
Edition Identifiers:
- The Open Library ID: OL34657806M - OL40123703M - OL40133678M - OL40133661M
- Online Computer Library Center (OCLC) ID: 1109817429
- All ISBNs: ➤ 9781000796391 - 9781003338994 - 1000796396 - 1000792854 - 877022112X - 9781000792850 - 9788770221122 - 1003338992
Access and General Info:
- First Year Published: 2019
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Marketplaces
Find On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.