On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond - Info and Reading Options
By Andrej Rumiantsev
"On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond" was published by River Publishers in 2022 and the language of the book is English.
“On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond” Metadata:
- Title: ➤ On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond
- Author: Andrej Rumiantsev
- Language: English
- Publisher: River Publishers
- Publish Date: 2022
“On-Wafer Calibration Techniques Enabling Accurate Characterization of High-Performance Silicon Devices at the Mm-Wave Range and Beyond” Subjects and Themes:
- Subjects: ➤ Semiconductors - Characterization - Semiconductor wafers - Calibration - Semi-conducteurs - Caractérisation - Plaquettes à gravure en semi-conducteurs - Étalonnage - SCIENCE / Energy - TECHNOLOGY / Lasers
Edition Specifications:
- Pagination: 156
Edition Identifiers:
- The Open Library ID: OL40133678M - OL25753008W
- ISBN-13: 9781003338994
- All ISBNs: 9781003338994
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