Memory technology, design and testing - Info and Reading Options
proceedings : International Workshop on Memory Technology, Design, and Testing
By IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)
"Memory technology, design and testing" was published by IEEE Computer Society Press in 1998 - Los Alamitos, California, it has 131 pages and the language of the book is English.
“Memory technology, design and testing” Metadata:
- Title: ➤ Memory technology, design and testing
- Author: ➤ IEEE International Workshop on Memory Technology, Design, and Testing (1998 San Jose, California)
- Language: English
- Number of Pages: 131
- Publisher: IEEE Computer Society Press
- Publish Date: 1998
- Publish Location: Los Alamitos, California
“Memory technology, design and testing” Subjects and Themes:
- Subjects: ➤ Congresses - Semiconductor storage devices - Testing - Random access memory - Cardiology - Data processing - Electrocardiography - Patient monitoring
Edition Specifications:
- Pagination: ix, 131 p. :
Edition Identifiers:
- The Open Library ID: OL22308438M - OL13569606W
- ISBN-10: 0818684941 - 0818684968
- All ISBNs: 0818684941 - 0818684968
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