Explore: Testbarkeit
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Books Results
Source: The Open Library
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Search results from The Open Library
1Digital systems testing and testable design
By Miron Abramovici
“Digital systems testing and testable design” Metadata:
- Title: ➤ Digital systems testing and testable design
- Author: Miron Abramovici
- Language: English
- Number of Pages: Median: 653
- Publisher: ➤ IEEE Press - Institute of Electrical & Electronics Enginee - Computer Science Press
- Publish Date: 1990 - 1994 - 1999
- Publish Location: ➤ New York, NY - Piscataway, NJ - New York
“Digital systems testing and testable design” Subjects and Themes:
- Subjects: ➤ Circuitos integrados - Design and construction - Digital integrated circuits - Testing - Schaltungsentwurf - Digitales System - Pruftechnik - Testbarkeit - VLSI - Systementwurf - Prufung - Digital electronics - Electronic digital computers
Edition Identifiers:
- The Open Library ID: OL2203459M - OL1231884M - OL9383069M - OL18227247M
- Online Computer Library Center (OCLC) ID: 20594770
- Library of Congress Control Number (LCCN): 94233953 - 89025259
- All ISBNs: ➤ 0780310543 - 9780780310544 - 0780310624 - 9780780310629 - 0716781794 - 9780716781790
First Setence:
"Testing of a system is an experiment in which the system is exercised and its resulting response is analyzed to ascertain whether it behaved correctly."
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
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2Testverfahren in der Mikroelektronik
By Wilfried Daehn
“Testverfahren in der Mikroelektronik” Metadata:
- Title: ➤ Testverfahren in der Mikroelektronik
- Author: Wilfried Daehn
- Language: ger
- Publisher: Springer Berlin Heidelberg
- Publish Date: 1997
- Publish Location: Berlin, Heidelberg
“Testverfahren in der Mikroelektronik” Subjects and Themes:
- Subjects: ➤ Testmuster - Selbsttest - Algorithmus - Logische Schaltung - Digitale integrierte Schaltung - Testbarkeit - Fehlererkennung
Edition Identifiers:
- The Open Library ID: OL27091447M
- Online Computer Library Center (OCLC) ID: 863736310
- All ISBNs: 3642605591 - 9783642605598
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
Online Borrowing:
Online Marketplaces
Find Testverfahren in der Mikroelektronik at online marketplaces:
- Amazon: Audiable, Kindle and printed editions.
- Ebay: New & used books.