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1Design and analysis of multilayer x-ray/XUV microscope

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“Design and analysis of multilayer x-ray/XUV microscope” Metadata:

  • Title: ➤  Design and analysis of multilayer x-ray/XUV microscope
  • Author:
  • Language: English
  • Publisher: ➤  National Aeronautics and Space Administration - National Technical Information Service, distributor - University of Alabama at Birmingham, Dept. of Physics ; [Washington, D.C.
  • Publish Date:
  • Publish Location: ➤  Springfield, Va - Birmingham, AL

“Design and analysis of multilayer x-ray/XUV microscope” Subjects and Themes:

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Access and General Info:

  • First Year Published: 1990
  • Is Full Text Available: No
  • Is The Book Public: No
  • Access Status: No_ebook

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    Optical microscope

    are two basic types of optical microscopes: simple microscopes and compound microscopes. A simple microscope uses the optical power of a single lens or

    Microscope

    optical microscopes, scanning electron microscopes and scanning probe microscopes) or analyze the sample all at once (wide field optical microscopes and

    Confocal microscopy

    is recorded. Four types of confocal microscopes are commercially available: Confocal laser scanning microscopes use multiple mirrors (typically 2 or

    Fluorescence microscope

    combining several single-color images. Most fluorescence microscopes in use are epifluorescence microscopes, where excitation of the fluorophore and detection

    Stereo microscope

    quality control. Stereo microscopes are essential tools in entomology. Although a binocular microscope with two separate optical paths had been designed

    Near-field scanning optical microscope

    to study physical properties inaccessible to near-field scanning optical microscopes including the spatial dependence of intramolecular vibrations in

    Magnification

    around 800×. For details, see limitations of optical microscopes. Small, cheap telescopes and microscopes are sometimes supplied with the eyepieces that

    Petrographic microscope

    grade of observation required, petrographic microscopes are derived from conventional brightfield microscopes of similar basic capabilities by: Adding a

    Surface metrology

    a phonograph. Atomic force microscope are sometimes also considered contact profilers operating at atomic scale. Optical measurement instruments have

    Timeline of microscope technology

    aberration. 1846: Carl Zeiss founded Carl Zeiss AG, to mass-produce microscopes and other optical instruments. 1850s: John Leonard Riddell, Professor of Chemistry