Explore: Microscopy Handbooks

Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen

Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique

Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated

microscopy: optical, electron, and scanning probe microscopy, along with the emerging field of X-ray microscopy.[citation needed] Optical microscopy and

Tunneling Spectroscopy (STS)", Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy, NanoScience and Technology, Berlin, Heidelberg:

Aberration-corrected transmission electron microscopy (AC-TEM) is the general term for using electron microscopes where electro optical components are

used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope

Peter W.; Spence, John C. H., eds. (2019). Springer Handbook of Microscopy. Springer Handbooks. Cham: Springer International Publishing. doi:10.1007/978-3-030-00069-1

for light microscopy. Glass knives are used to slice sections for light microscopy and to slice very thin sections for electron microscopy. Industrial

Two-photon excitation microscopy (TPEF or 2PEF) is a fluorescence imaging technique that is particularly well-suited to image scattering living tissue