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1A Treatise on Electricity in Theory and Practice

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“A Treatise on Electricity in Theory and Practice” Metadata:

  • Title: ➤  A Treatise on Electricity in Theory and Practice
  • Authors:
  • Number of Pages: Median: 637
  • Publisher: ➤  Longman, Brown, Green , and Longmans
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“A Treatise on Electricity in Theory and Practice” Subjects and Themes:

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Access and General Info:

  • First Year Published: 1853
  • Is Full Text Available: Yes
  • Is The Book Public: Yes
  • Access Status: Public

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    Electromagnetic induction

    "flux through the circuit". Lenz's law gives the direction of the induced emf and current resulting from electromagnetic induction. Faraday's law of induction

    Geomagnetically induced current

    Geomagnetically induced currents (GICs) are electrical currents induced at the Earth's surface by rapid changes in the geomagnetic field caused by space

    Stress-induced leakage current

    Stress-induced leakage current (SILC) is an increase in the gate leakage current of a MOSFET, used in semiconductor physics. It occurs due to defects

    Electron beam-induced current

    Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission

    Eddy current

    In electromagnetism, an eddy current (also called Foucault's current) is a loop of electric current induced within conductors by a changing magnetic field

    Telluric current

    underground or through the sea, resulting from natural and human-induced causes. These currents have extremely low frequency and traverse large areas near or

    Lenz's law

    the electric current induced in a conductor by a changing magnetic field is such that the magnetic field created by the induced current opposes changes

    Electromotive force

    closed loop C {\displaystyle C} may be nonzero. Then, the "induced emf" (often called the "induced voltage") in the loop is: E C = ∮ C E ⋅ d ℓ = − d Φ C d

    Optical beam-induced current

    Optical beam induced current (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique uses a scanning laser

    Faraday's law of induction

    deformation of its shape. The direction of the induced emf is given by Lenz's law, which states that the induced current will flow in such a way that its magnetic