Explore: Field Ion Microscopy

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Books Results

Source: The Open Library

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1Field emission and field ionization

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Book's cover

“Field emission and field ionization” Metadata:

  • Title: ➤  Field emission and field ionization
  • Author:
  • Language: English
  • Number of Pages: Median: 195
  • Publisher: ➤  Harvard University Press - American Institute of Physics
  • Publish Date:
  • Publish Location: Cambridge - New York

“Field emission and field ionization” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1961
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Borrowable

Online Access

Downloads Are Not Available:

The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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2Field ion microscopy

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Book's cover

“Field ion microscopy” Metadata:

  • Title: Field ion microscopy
  • Authors:
  • Language: English
  • Number of Pages: Median: 347
  • Publisher: ➤  Elsevier - American Elsevier Pub. Co.
  • Publish Date:
  • Publish Location: New York

“Field ion microscopy” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1969
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Borrowable

Online Access

Downloads Are Not Available:

The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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3Field-ion microscopy

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“Field-ion microscopy” Metadata:

  • Title: Field-ion microscopy
  • Author:
  • Language: English
  • Number of Pages: Median: 244
  • Publisher: ➤  Plenum Press - Springer London, Limited
  • Publish Date:
  • Publish Location: New York

“Field-ion microscopy” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1968
  • Is Full Text Available: No
  • Is The Book Public: No
  • Access Status: No_ebook

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4Electron and ion microscopy and microanalysis

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Book's cover

“Electron and ion microscopy and microanalysis” Metadata:

  • Title: ➤  Electron and ion microscopy and microanalysis
  • Author:
  • Language: English
  • Number of Pages: Median: 815
  • Publisher: ➤  Marcel Dekker - CRC Press - M. Dekker - Taylor & Francis Group
  • Publish Date:
  • Publish Location: New York

“Electron and ion microscopy and microanalysis” Subjects and Themes:

Edition Identifiers:

Access and General Info:

  • First Year Published: 1982
  • Is Full Text Available: Yes
  • Is The Book Public: No
  • Access Status: Printdisabled

Online Access

Downloads Are Not Available:

The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.

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    5Field-ion microscopy

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    Book's cover

    “Field-ion microscopy” Metadata:

    • Title: Field-ion microscopy
    • Author:
    • Language: English
    • Number of Pages: Median: 257
    • Publisher: ➤  North-Holland Pub. Co. - North-Holland
    • Publish Date:
    • Publish Location: Amsterdam

    “Field-ion microscopy” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1970
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    6Field emission and field ionization

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    “Field emission and field ionization” Metadata:

    • Title: ➤  Field emission and field ionization
    • Author:
    • Language: English
    • Number of Pages: Median: 195
    • Publisher: ➤  Harvard University Press - American Institute of Physics
    • Publish Date:
    • Publish Location: New York - Cambridge

    “Field emission and field ionization” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1961
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    7Field emission and related topics

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    “Field emission and related topics” Metadata:

    • Title: ➤  Field emission and related topics
    • Author:
    • Language: English
    • Number of Pages: Median: 702
    • Publisher: North-Holland Pub. Co.
    • Publish Date:
    • Publish Location: Amsterdam

    “Field emission and related topics” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1978
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    8A field ion microscope study of short-range order in 2 a/o AU-PT and 2 a/o NI-PT

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    “A field ion microscope study of short-range order in 2 a/o AU-PT and 2 a/o NI-PT” Metadata:

    • Title: ➤  A field ion microscope study of short-range order in 2 a/o AU-PT and 2 a/o NI-PT
    • Author:
    • Language: English
    • Number of Pages: Median: 44
    • Publish Date:
    • Publish Location: [New York]

    “A field ion microscope study of short-range order in 2 a/o AU-PT and 2 a/o NI-PT” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1967
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    9Avtoionnai͡a︡ mikroskopii͡a︡ splavov

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    “Avtoionnai͡a︡ mikroskopii͡a︡ splavov” Metadata:

    • Title: ➤  Avtoionnai͡a︡ mikroskopii͡a︡ splavov
    • Author:
    • Language: rus
    • Number of Pages: Median: 191
    • Publisher: Metallurgii͡a︡
    • Publish Date:
    • Publish Location: Moskva

    “Avtoionnai͡a︡ mikroskopii͡a︡ splavov” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1987
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    10Avtoionnai͡a︡ mikroskopii͡a︡ radiat͡s︡ionnykh defektov v metallakh

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    “Avtoionnai͡a︡ mikroskopii͡a︡ radiat͡s︡ionnykh defektov v metallakh” Metadata:

    • Title: ➤  Avtoionnai͡a︡ mikroskopii͡a︡ radiat͡s︡ionnykh defektov v metallakh
    • Author:
    • Language: rus
    • Number of Pages: Median: 164
    • Publisher: Ėnergoizdat
    • Publish Date:
    • Publish Location: Moskva

    “Avtoionnai͡a︡ mikroskopii͡a︡ radiat͡s︡ionnykh defektov v metallakh” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1982
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    11Field-ion microscopy

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    “Field-ion microscopy” Metadata:

    • Title: Field-ion microscopy
    • Author:
    • Language: English
    • Number of Pages: Median: 115
    • Publisher: Springer-Verlag
    • Publish Date:
    • Publish Location: Berlin - New York

    “Field-ion microscopy” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1982
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    12Field-ion microscopy and related techniques

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    “Field-ion microscopy and related techniques” Metadata:

    • Title: ➤  Field-ion microscopy and related techniques
    • Author:
    • Language: English
    • Number of Pages: Median: 165
    • Publisher: Warwick Publishing
    • Publish Date:
    • Publish Location: Birmingham

    “Field-ion microscopy and related techniques” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1980
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    13Helium ion microscopy

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    “Helium ion microscopy” Metadata:

    • Title: Helium ion microscopy
    • Author:
    • Language: English
    • Number of Pages: Median: 64
    • Publisher: Springer
    • Publish Date:
    • Publish Location: New York

    “Helium ion microscopy” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 2013
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    14Field ion microscopy, field ionization, and field evaporation

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    “Field ion microscopy, field ionization, and field evaporation” Metadata:

    • Title: ➤  Field ion microscopy, field ionization, and field evaporation
    • Author:
    • Language: English
    • Number of Pages: Median: 139
    • Publisher: Pergamon Press
    • Publish Date:
    • Publish Location: Oxford - New York

    “Field ion microscopy, field ionization, and field evaporation” Subjects and Themes:

    Edition Identifiers:

    Access and General Info:

    • First Year Published: 1973
    • Is Full Text Available: No
    • Is The Book Public: No
    • Access Status: No_ebook

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    Wiki

    Source: Wikipedia

    Wikipedia Results

    Search Results from Wikipedia

    Field ion microscope

    BUTTERWORTH-Heinemann 1992. Wikimedia Commons has media related to Field-ion microscopy. Northwestern University Center for Atom-Probe Tomography Photograph

    Atom probe

    make definitive identification impossible. Field ion microscopy is a modification of field emission microscopy where a stream of tunneling electrons is

    List of materials analysis methods

    – Atomic force microscopy AFS – Atomic fluorescence spectroscopy Analytical ultracentrifugation APFIM – Atom probe field ion microscopy APS – Appearance

    Characterization (materials science)

    Optical microscopy Scanning electron microscopy (SEM) Transmission electron microscopy (TEM) Field ion microscopy (FIM) Scanning probe microscopy (SPM)

    Guinier–Preston zone

    Age Hardening in Aluminium Alloys: Atom Probe Field-Ion Microscopy and Transmission Electron Microscopy Studies" (PDF). Archived from the original (PDF)

    Focused ion beam

    transmission electron microscopy can also be used to select a micro area of a sample, extract it and prepare it for analysis using secondary ion mass spectrometry

    Field-emission microscopy

    Electron microscope Field ion microscope List of surface analysis methods "Intro to Field Emission". Field Emission / Ion Microscopy Laboratory, Purdue

    Scanning ion-conductance microscopy

    Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. SICM allows for the determination

    Scanning electron microscope

    history of scanning electron microscopy has been presented by McMullan. Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling

    Ion milling machine

    microscopy (TEM). The accurate and damage-free surface ion milling provides makes it perfect for the precise fabrication of semiconductors. Using ion


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