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Source: The Open Library
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1Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method
By Massood Tabib-Azar
“Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method” Metadata:
- Title: ➤ Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method
- Author: Massood Tabib-Azar
- Language: English
- Publisher: ➤ National Technical Information Service, distributor - National Aeronautics and Space Administration
- Publish Date: 1997
- Publish Location: ➤ Springfield, Va - [Washington, DC
“Effect of crystal defects on minority carrier diffusion length in 6H SiC measured using the electron beam induced current method” Subjects and Themes:
- Subjects: Diffusion length - Minority carriers - Silicon carbides - Crystal defects
Edition Identifiers:
- The Open Library ID: OL15491546M
Access and General Info:
- First Year Published: 1997
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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