Explore: Défauts
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Books Results
Source: The Open Library
The Open Library Search Results
Search results from The Open Library
1Developments in Pressure Vessel Technology
By R. W. Nichols

“Developments in Pressure Vessel Technology” Metadata:
- Title: ➤ Developments in Pressure Vessel Technology
- Author: R. W. Nichols
- Number of Pages: Median: 277
- Publisher: ➤ Intl Ideas - Elsevier Science Publishing Company
- Publish Date: 1979 - 1980 - 1983
“Developments in Pressure Vessel Technology” Subjects and Themes:
- Subjects: ➤ Pressure vessels - Defects - Testing - Récipients sous pression - Défauts - Essais
Edition Identifiers:
- The Open Library ID: OL11607522M - OL11607396M - OL11607485M
- Library of Congress Control Number (LCCN): 79315061
- All ISBNs: ➤ 9780853342236 - 0853348065 - 0853342237 - 9780853348061 - 9780853349228 - 0853349223
Access and General Info:
- First Year Published: 1979
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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2Colour centres and imperfections in insulators and semiconductors
By P. D. Townsend

“Colour centres and imperfections in insulators and semiconductors” Metadata:
- Title: ➤ Colour centres and imperfections in insulators and semiconductors
- Author: P. D. Townsend
- Language: English
- Number of Pages: Median: 229
- Publisher: ➤ Crane, Russak - Chatto and Windus for Sussex University Press
- Publish Date: 1973
- Publish Location: London - New York
“Colour centres and imperfections in insulators and semiconductors” Subjects and Themes:
- Subjects: ➤ Color centers - Defects - Electric insulators and insulation - Semiconductors - Centres colorés - Isolation électrique - Défauts - Semiconducteurs
Edition Identifiers:
- The Open Library ID: OL5430397M - OL5473158M
- Online Computer Library Center (OCLC) ID: 737243
- Library of Congress Control Number (LCCN): 73076960 - 73176372
- All ISBNs: ➤ 0856210102 - 0856210226 - 9780856210228 - 9780856210105 - 0844802093 - 9780844802091
Access and General Info:
- First Year Published: 1973
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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3Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series)
By Monemar

“Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series)” Metadata:
- Title: ➤ Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series)
- Author: Monemar
- Language: English
- Number of Pages: Median: 588
- Publisher: ➤ Institute of Physics - Taylor & Francis
- Publish Date: 1989
- Publish Location: ➤ Bristol, England - Philadelphia
“Shallow Impurities in Semiconductors, Proceedings of the 3rd INT Conference on Shallow Impurities in Semiconductors held at Linkoping, Sweden, 10-12 August ... (Institute of Physics Conference Series)” Subjects and Themes:
- Subjects: ➤ Impurity distribution - Semiconductors - Congresses - Defects - Semi-conducteurs - Défauts - Congrès - Diffusion des impuretés - Semiconducteurs - Halvledere - Kongresser - Krystallfeil - Feil og skader
Edition Identifiers:
- The Open Library ID: OL17971148M - OL11612466M
- Online Computer Library Center (OCLC) ID: 19518659
- Library of Congress Control Number (LCCN): 89002234
- All ISBNs: 0854981896 - 9780854981892
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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4Corrosion of reinforcement in concrete construction
By C. L. W. Page, P. B. Bamforth and J. W. Figg

“Corrosion of reinforcement in concrete construction” Metadata:
- Title: ➤ Corrosion of reinforcement in concrete construction
- Authors: C. L. W. PageP. B. BamforthJ. W. Figg
- Language: English
- Number of Pages: Median: 679
- Publisher: ➤ Royal Society of Chemistry, Information Services - Royal Society of Chemistry
- Publish Date: 1996
- Publish Location: Cambridge
“Corrosion of reinforcement in concrete construction” Subjects and Themes:
- Subjects: ➤ Reinforced concrete - Congresses - Reinforced concrete construction - Deterioration - Béton armé - Congrès - Corrosion - Constructions en béton armé - Barres d'armature - Acier - Chlorures - Ciment - Adjuvants - Estruturas de concreto - Estruturas diversas de concreto - Construction en béton armé - Détérioration - Génie civil - Construction en béton - Défauts
Edition Identifiers:
- The Open Library ID: OL11609916M - OL18087491M
- Online Computer Library Center (OCLC) ID: 35233292
- All ISBNs: 085404731X - 9780854047314
Access and General Info:
- First Year Published: 1996
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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5Atlas of Polymer Damage
By Lothar Engel

“Atlas of Polymer Damage” Metadata:
- Title: Atlas of Polymer Damage
- Author: Lothar Engel
- Language: English
- Number of Pages: Median: 256
- Publisher: Prentice-Hall - Prentice Hall
- Publish Date: 1981
- Publish Location: Englewood Cliffs, N.J
“Atlas of Polymer Damage” Subjects and Themes:
- Subjects: ➤ Polymers - Plastics - Defects - Scanning electron microscopes - Polymers and polymerization - Matières plastiques - Défauts - Microscopes électroniques à balayage
Edition Identifiers:
- The Open Library ID: OL10076666M - OL17900455M
- Online Computer Library Center (OCLC) ID: 7756301
- Library of Congress Control Number (LCCN): 80083878
- All ISBNs: 9780130500137 - 0130500135
Access and General Info:
- First Year Published: 1981
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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6Shallow Impurities in Semiconductors V
By T. Taguchi

“Shallow Impurities in Semiconductors V” Metadata:
- Title: ➤ Shallow Impurities in Semiconductors V
- Author: T. Taguchi
- Language: English
- Number of Pages: Median: 540
- Publisher: Trans Tech Publications
- Publish Date: 1993
“Shallow Impurities in Semiconductors V” Subjects and Themes:
- Subjects: ➤ Semiconductors - Congresses - Impurity distribution - Defects - Semi-conducteurs - Congrès - Diffusion des impuretés - Défauts - Halbleiter - Kongress - Verunreinigung
Edition Identifiers:
- The Open Library ID: OL11174020M
- Online Computer Library Center (OCLC) ID: 27704826
- All ISBNs: 0878496548 - 9780878496549
Access and General Info:
- First Year Published: 1993
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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7Quenching and cooling, residual stress and distortion control
By Lauralice de Campos Franceschini Canale and Michiharu Narazaki

“Quenching and cooling, residual stress and distortion control” Metadata:
- Title: ➤ Quenching and cooling, residual stress and distortion control
- Authors: ➤ Lauralice de Campos Franceschini CanaleMichiharu Narazaki
- Language: English
- Number of Pages: Median: 1084
- Publisher: ASTM International
- Publish Date: 2010
- Publish Location: West Conshohocken, PA
“Quenching and cooling, residual stress and distortion control” Subjects and Themes:
Edition Identifiers:
- The Open Library ID: OL31106827M
- Online Computer Library Center (OCLC) ID: 639939758 - 853663861
- Library of Congress Control Number (LCCN): 2010021122
- All ISBNs: 0803175094 - 9780803175099
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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8Atomic diffusion in semiconductors
By Shaw, D.

“Atomic diffusion in semiconductors” Metadata:
- Title: ➤ Atomic diffusion in semiconductors
- Author: Shaw, D.
- Language: English
- Number of Pages: Median: 607
- Publisher: Plenum Press
- Publish Date: 1973
- Publish Location: New York - London
“Atomic diffusion in semiconductors” Subjects and Themes:
- Subjects: ➤ Crystals - Defects - Diffusion - Semiconductors - Thermal properties - 33.26 statistical physics - Propriétés thermiques - Cristaux - Semiconducteurs - Diffusie (natuurwetenschappen) - Atom - Halfgeleiders - Défauts - Halbleiter
Edition Identifiers:
- The Open Library ID: OL5106438M
- Online Computer Library Center (OCLC) ID: 674324
- Library of Congress Control Number (LCCN): 74178779
- All ISBNs: 9780306304552 - 0306304554
Access and General Info:
- First Year Published: 1973
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Borrowable
Online Access
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9Understanding Building Failures
By James Douglas and Bill Ransom

“Understanding Building Failures” Metadata:
- Title: ➤ Understanding Building Failures
- Authors: James DouglasBill Ransom
- Language: English
- Number of Pages: Median: 342
- Publisher: ➤ Routledge - CRC Press LLC - Taylor & Francis Group
- Publish Date: 2010 - 2013
“Understanding Building Failures” Subjects and Themes:
- Subjects: ➤ Building failures - Buildings, repair and reconstruction - Buildings - Defects - Repair and reconstruction - TECHNOLOGY & ENGINEERING / Engineering (General) - TECHNOLOGY & ENGINEERING / Construction / General - TECHNOLOGY & ENGINEERING / Drafting & Mechanical Drawing - Structural failures - Constructions - Effondrement - Défauts - TECHNOLOGY & ENGINEERING - Construction - General - Drafting & Mechanical Drawing - Engineering (General)
Edition Identifiers:
- The Open Library ID: ➤ OL38288799M - OL33755662M - OL28744743M - OL28769749M - OL39259516M - OL46034346M - OL33660279M - OL38307707M - OL46029623M - OL50595600M
- Online Computer Library Center (OCLC) ID: 840416007
- Library of Congress Control Number (LCCN): 2012031319
- All ISBNs: ➤ 9781136448768 - 9781136448782 - 0415508789 - 1136448780 - 113644873X - 1299469256 - 9780415508797 - 0415508797 - 1136448764 - 9781136448744 - 9780203125175 - 9781136448737 - 9780415508780 - 0203125177 - 1280858397 - 1136448799 - 1136448748 - 9781136448799 - 9781280858390 - 9781299469259
Access and General Info:
- First Year Published: 2010
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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10Investigation of Aeronautical and Engineering Component Failures
By A. Venugopal Reddy

“Investigation of Aeronautical and Engineering Component Failures” Metadata:
- Title: ➤ Investigation of Aeronautical and Engineering Component Failures
- Author: A. Venugopal Reddy
- Language: English
- Number of Pages: Median: 368
- Publisher: Taylor & Francis Group - CRC
- Publish Date: 2004
“Investigation of Aeronautical and Engineering Component Failures” Subjects and Themes:
- Subjects: ➤ Airplanes - Metals - Parts - Defects - Fracture - System failures (Engineering) - Materials - Aerospace engineering - Aeronautics - Machine parts - Avions - Pièces - Défauts - Aérospatiale (Ingénierie) - Pannes - Métaux - Rupture - Matériaux - TRANSPORTATION - Aviation - General
Edition Identifiers:
- The Open Library ID: ➤ OL34586619M - OL33790161M - OL33761200M - OL33745465M - OL33713497M - OL33476011M - OL8259614M
- Online Computer Library Center (OCLC) ID: 78082649
- Library of Congress Control Number (LCCN): 2004045163
- All ISBNs: ➤ 1280516992 - 9781136968662 - 1136968520 - 1136968660 - 1136968598 - 9780429208881 - 0849323142 - 042920888X - 9780203492093 - 0203492099 - 9781280516993 - 9781136968594 - 9780849323140 - 9781136968525
First Setence:
"The abundant availability of raw materials in nature is the gift of God to humanity."
Access and General Info:
- First Year Published: 2004
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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11Defects and radiation damage in metals
By M. W. Thompson

“Defects and radiation damage in metals” Metadata:
- Title: ➤ Defects and radiation damage in metals
- Author: M. W. Thompson
- Language: English
- Number of Pages: Median: 384
- Publisher: ➤ Cambridge U.P. - Cambridge University Press
- Publish Date: 1969
- Publish Location: London
“Defects and radiation damage in metals” Subjects and Themes:
- Subjects: ➤ Effect of radiation on - Defects - Metals - Metals, defects - Metals, effect of radiation on - Métaux - Effets du rayonnement sur - Défauts
Edition Identifiers:
- The Open Library ID: OL20744186M - OL5679304M - OL21323611M
- Online Computer Library Center (OCLC) ID: 1109982360 - 11604
- Library of Congress Control Number (LCCN): 69010434
- All ISBNs: 9780521070683 - 0521070686
Access and General Info:
- First Year Published: 1969
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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12Extended defects in semiconductors
By D. B. Holt

“Extended defects in semiconductors” Metadata:
- Title: ➤ Extended defects in semiconductors
- Author: D. B. Holt
- Language: English
- Number of Pages: Median: 644
- Publisher: Cambridge University Press
- Publish Date: 2003 - 2007 - 2009 - 2014
“Extended defects in semiconductors” Subjects and Themes:
- Subjects: ➤ Semiconductors - Défauts - Semiconducteurs - Defects - Semi-conducteurs - TECHNOLOGY & ENGINEERING - Electronics - Solid State - Gitterbaufehler - Halbleiter
Edition Identifiers:
- The Open Library ID: ➤ OL40675672M - OL40481427M - OL40469598M - OL40461259M - OL34441208M - OL28540570M - OL10437299M
- Online Computer Library Center (OCLC) ID: 701832671 - 76167306
- Library of Congress Control Number (LCCN): 2006037298
- All ISBNs: ➤ 9780511276293 - 051127629X - 9780521819343 - 051153485X - 0511279280 - 0511277512 - 9780511277511 - 9780511279287 - 0521819342 - 9781107424142 - 1107424143 - 0511278101 - 9780511278105 - 9780511534850
Access and General Info:
- First Year Published: 2003
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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13Laser-induced damage of optical materials
By Roger M. Wood

“Laser-induced damage of optical materials” Metadata:
- Title: ➤ Laser-induced damage of optical materials
- Author: Roger M. Wood
- Language: English
- Number of Pages: Median: 241
- Publisher: ➤ CRC Press - Taylor & Francis Group - Institute of Physics
- Publish Date: 2003
- Publish Location: Bristol
“Laser-induced damage of optical materials” Subjects and Themes:
- Subjects: ➤ Defects - Effect of radiation on - Laser beams - Optical materials - Matériaux optiques - Effets du rayonnement sur - Défauts - Faisceaux laser - TECHNOLOGY & ENGINEERING - Lasers & Photonics
Edition Identifiers:
- The Open Library ID: ➤ OL33663325M - OL33434130M - OL29007391M - OL33742769M - OL3318147M - OL33726703M
- Online Computer Library Center (OCLC) ID: 51779491 - 99997303
- Library of Congress Control Number (LCCN): 2004268325
- All ISBNs: ➤ 9780750308458 - 1420034057 - 9780429140129 - 9781420034059 - 0750308451 - 9781000689815 - 9781000687330 - 1000687333 - 9781280650833 - 1000689816 - 1280650834 - 0429140126
Access and General Info:
- First Year Published: 2003
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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14Defects and Damage in Composite Materials and Structures
By Rikard Benton Heslehurst

“Defects and Damage in Composite Materials and Structures” Metadata:
- Title: ➤ Defects and Damage in Composite Materials and Structures
- Author: Rikard Benton Heslehurst
- Language: English
- Number of Pages: Median: 214
- Publisher: ➤ CRC Press - Taylor & Francis Group
- Publish Date: 2014 - 2017
“Defects and Damage in Composite Materials and Structures” Subjects and Themes:
- Subjects: ➤ Composite materials - Defects - TECHNOLOGY & ENGINEERING / Mechanical - TECHNOLOGY & ENGINEERING / Material Science - Composites - Défauts - TECHNOLOGY & ENGINEERING - Engineering (General) - Reference
Edition Identifiers:
- The Open Library ID: OL34614641M - OL33541340M - OL28849974M - OL28772726M - OL33733059M
- Online Computer Library Center (OCLC) ID: 875095649 - 859584203
- Library of Congress Control Number (LCCN): 2013049509
- All ISBNs: ➤ 9781138073692 - 0429188773 - 9781466580480 - 9781466580473 - 146658047X - 9780429188770 - 130656798X - 9781306567985 - 1138073695 - 1466580488
Access and General Info:
- First Year Published: 2014
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
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15Poor-quality cost
By H. J. Harrington

“Poor-quality cost” Metadata:
- Title: Poor-quality cost
- Author: H. J. Harrington
- Language: English
- Number of Pages: Median: 211
- Publisher: ➤ M. Dekker - CRC Press - Taylor & Francis Group - ASQC Quality Press
- Publish Date: 1987 - 2020
- Publish Location: Milwaukee - New York
“Poor-quality cost” Subjects and Themes:
- Subjects: ➤ Costs - Quality control - Commercial products - Defects - Qualité - Contrôle - Coût - Produits commerciaux - Défauts - TECHNOLOGY - Engineering - General - Industrial - Quality Control
Edition Identifiers:
- The Open Library ID: OL34686005M - OL2734936M
- Online Computer Library Center (OCLC) ID: 1103441099
- Library of Congress Control Number (LCCN): 86029277
- All ISBNs: 0367451514 - 9780824777432 - 0824777433 - 9780367451516
Access and General Info:
- First Year Published: 1987
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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16Alkali-Aggregate Reaction in Concrete
By Alan B. Poole and Ian Sims
“Alkali-Aggregate Reaction in Concrete” Metadata:
- Title: ➤ Alkali-Aggregate Reaction in Concrete
- Authors: Alan B. PooleIan Sims
- Language: English
- Number of Pages: Median: 768
- Publisher: Taylor & Francis Group
- Publish Date: 2017
“Alkali-Aggregate Reaction in Concrete” Subjects and Themes:
- Subjects: ➤ Concrete - Composite materials - Defects - Alkali-aggregate reactions - Béton - Défauts - Réactions alcalis-granulats - TECHNOLOGY & ENGINEERING - Construction - General - Structural
Edition Identifiers:
- The Open Library ID: OL29402810M - OL29279418M - OL28826713M - OL29432018M - OL29402784M
- Online Computer Library Center (OCLC) ID: 993964745
- All ISBNs: ➤ 1317484428 - 131748441X - 9781138027565 - 9781315708959 - 9781317484424 - 1315708957 - 9781317484400 - 9781317484417 - 1317484401 - 1138027561
Access and General Info:
- First Year Published: 2017
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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17Random, non-random, and periodic faulting incrystals
By M. T. Sebastian and P. Krishna

“Random, non-random, and periodic faulting incrystals” Metadata:
- Title: ➤ Random, non-random, and periodic faulting incrystals
- Authors: M. T. SebastianP. Krishna
- Language: English
- Number of Pages: Median: 383
- Publisher: ➤ Routledge - CRC Press LLC - Gordon and Breach Science Publishers - Gordon and Breach
- Publish Date: 1994 - 2017
- Publish Location: ➤ Yverdon - Langhorne, Penn - Reading - Yverdon, Switzerland
“Random, non-random, and periodic faulting incrystals” Subjects and Themes:
- Subjects: ➤ Crystals - Defects - Polymorphism (Crystallography) - Crystallography - Science/Mathematics - Physical Properties Of Crystals - Science - Physics - Science / Physics - Cristaux - Défauts - Polymorphisme (Cristallographie)
Edition Identifiers:
- The Open Library ID: OL21810713M - OL40307887M - OL9005886M - OL1417665M
- Online Computer Library Center (OCLC) ID: 28675101 - 994205902
- Library of Congress Control Number (LCCN): 93027315
- All ISBNs: 135155235X - 9781351552356 - 2881249256 - 9782881249259
First Setence:
"Scientists may prefer order but nature seems to prefer disorder."
Access and General Info:
- First Year Published: 1994
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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18Defect Recognition and Image Processing in Semiconductors 1997
By J. Doneker
“Defect Recognition and Image Processing in Semiconductors 1997” Metadata:
- Title: ➤ Defect Recognition and Image Processing in Semiconductors 1997
- Author: J. Doneker
- Language: English
- Publisher: CRC Press LLC
- Publish Date: 2017
“Defect Recognition and Image Processing in Semiconductors 1997” Subjects and Themes:
- Subjects: ➤ Image processing - Congresses - Semiconductors - Defects - Traitement d'images - Congrès - Semi-conducteurs - Défauts - SCIENCE / Physics - SCIENCE / Solid State Physics - Traitement des Image - Semiconducteurs
Edition Identifiers:
- The Open Library ID: OL34750364M - OL40089423M - OL34731346M - OL40084170M
- Online Computer Library Center (OCLC) ID: 1028819838
- All ISBNs: ➤ 9781351456463 - 1351456474 - 1315140810 - 9781315140810 - 9781351456470 - 1351456466 - 1351456458 - 9781351456456
Access and General Info:
- First Year Published: 2017
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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19Defects in microelectronic materials and devices
By Daniel Fleetwood, Sokrates Pantolides and Ronald D. Schrimpf

“Defects in microelectronic materials and devices” Metadata:
- Title: ➤ Defects in microelectronic materials and devices
- Authors: Daniel FleetwoodSokrates PantolidesRonald D. Schrimpf
- Language: English
- Number of Pages: Median: 762
- Publisher: Taylor & Francis Group - CRC
- Publish Date: 2008 - 2009
“Defects in microelectronic materials and devices” Subjects and Themes:
- Subjects: ➤ Materials - Defects - Metal oxide semiconductor field-effect transistors - Testing - Microelectronics - Integrated circuits - Circuits intégrés - Défauts - TECHNOLOGY & ENGINEERING - Electronics - Digital - Mikroelektronik - Integrerade kretsar
Edition Identifiers:
- The Open Library ID: OL34595306M - OL33728765M - OL33476853M - OL11816432M
- Online Computer Library Center (OCLC) ID: 226308170 - 313607448
- Library of Congress Control Number (LCCN): 2008018722
- All ISBNs: ➤ 9781420043778 - 1420043765 - 1420043773 - 9781420043761 - 9780429190919 - 9781281892195 - 0429190913 - 128189219X
Access and General Info:
- First Year Published: 2008
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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20Issues of fault diagnosis for dynamic systems
By Paul M. Frank

“Issues of fault diagnosis for dynamic systems” Metadata:
- Title: ➤ Issues of fault diagnosis for dynamic systems
- Author: Paul M. Frank
- Language: English
- Number of Pages: Median: 611
- Publisher: ➤ Springer London - Springer London, Limited - Springer
- Publish Date: 2000 - 2010 - 2013
- Publish Location: New York - London
“Issues of fault diagnosis for dynamic systems” Subjects and Themes:
- Subjects: ➤ Fault location (Engineering) - System failures (Engineering) - Mathematical models - Réseau neuronal - Système dynamique - Détection de défaut (ingénierie) - Technische Sicherheit - Défauts - Commande statistique - Pannes - Détection erreur - Unsicherheit - Dynamisches System - Systèmes linéaires - Robustesse - Beobachter <Kybernetik> - Diagnostic panne - Technisches System - Risiko - Fehlererkennung - Modèles mathématiques - Tolérance aux fautes (ingénierie) - Engineering, data processing - Computer engineering - Measurement - General - Automation - Engineering (general) - Industrial & technical - Professional, career & trade -> computer science -> computer engineering - Trades & technology -> technology & engineering -> measurement - Professional, career & trade -> computer science -> operating systems - Trades & technology -> technology & engineering -> automation - Professional, career & trade -> engineering -> general engineering - Physical & earth sciences -> chemistry -> industrial & technical - Sci27000 - Scp31040 - Sci18008 - Sct19000 - Sct11022 - Scc27000 - 3402 - 5806 - 3207 - 3185 - 5373 - 3029 - Suco11645 - 4767 - 7256
Edition Identifiers:
- The Open Library ID: OL34519175M - OL27957702M - OL9054330M - OL18140387M
- Online Computer Library Center (OCLC) ID: 43500136
- Library of Congress Control Number (LCCN): 00037378
- All ISBNs: ➤ 1849969957 - 1447136446 - 9783540199687 - 9781447136446 - 3540199683 - 9781849969956
First Setence:
"The chapters of this book compile together a summary of research topics and application studies given by leading international experts in the field of fault diagnosis for dynamic systems."
Access and General Info:
- First Year Published: 2000
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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21Light-Induced Defects in Semiconductors
By Kazuo Morigaki, Harumi Hikita and Chisato Ogihara
“Light-Induced Defects in Semiconductors” Metadata:
- Title: ➤ Light-Induced Defects in Semiconductors
- Authors: Kazuo MorigakiHarumi HikitaChisato Ogihara
- Language: English
- Number of Pages: Median: 212
- Publisher: ➤ Taylor & Francis Group - Jenny Stanford Publishing
- Publish Date: 2014
“Light-Induced Defects in Semiconductors” Subjects and Themes:
- Subjects: Light - Semiconductors - Defects - Semi-conducteurs - Défauts
Edition Identifiers:
- The Open Library ID: OL37954677M - OL34607062M - OL53257835M
- Online Computer Library Center (OCLC) ID: 891385935
- All ISBNs: ➤ 9780429074271 - 9789814411493 - 9814411485 - 9814411493 - 0429074271 - 9789814411486
Access and General Info:
- First Year Published: 2014
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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22Imperfections in crystals
By H. G. van Bueren

“Imperfections in crystals” Metadata:
- Title: Imperfections in crystals
- Author: H. G. van Bueren
- Language: English
- Number of Pages: Median: 676
- Publisher: ➤ Interscience Publishers - North-Holland Pub. Co. - Interscience Pub.
- Publish Date: 1960 - 1961
- Publish Location: N. Y - Amsterdam - New York
“Imperfections in crystals” Subjects and Themes:
- Subjects: ➤ Crystals - Defects - Dislocations in crystals - Lattice theory - Mathematical Crystallography - Solids - 51.12 crystallization, crystal growth, dislocations and defects - Gitterbaufehler - Kristall - Roosterfouten - Cristaux - Défauts
Edition Identifiers:
- The Open Library ID: OL17637310M - OL5811561M - OL14574962M
- Online Computer Library Center (OCLC) ID: 1624717 - 1048827
- Library of Congress Control Number (LCCN): 60050519
Access and General Info:
- First Year Published: 1960
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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23Solid state
By J. N. Mundy

“Solid state” Metadata:
- Title: Solid state
- Author: J. N. Mundy
- Language: English
- Number of Pages: Median: 504
- Publisher: Academic Pr - Academic Press
- Publish Date: 1983
- Publish Location: Orlando
“Solid state” Subjects and Themes:
- Subjects: ➤ Lattice dynamics - Crystals - Nuclear physics - Defects - Measurement - Solid state physics - Kernfysica - Experimenteel onderzoek - Solides - Défauts - Mesure - Physique nucléaire - Dynamique réticulaire - Physics, experiments
Edition Identifiers:
- The Open Library ID: OL7328111M - OL3179854M - OL21123926M
- Online Computer Library Center (OCLC) ID: 10146417
- Library of Congress Control Number (LCCN): 83022480 - 83022460
- All ISBNs: 9780124759633 - 0124759637
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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24Corrugating Defect/Remedy Manual
By Tappi
“Corrugating Defect/Remedy Manual” Metadata:
- Title: ➤ Corrugating Defect/Remedy Manual
- Author: Tappi
- Language: English
- Publisher: Tappi Pr
- Publish Date: 1999
“Corrugating Defect/Remedy Manual” Subjects and Themes:
- Subjects: ➤ Corrugated paperboard - Defects - Terminology - Carton ondulé - Défauts - Terminologie
Edition Identifiers:
- The Open Library ID: OL11334650M
- Online Computer Library Center (OCLC) ID: 1257452227
- All ISBNs: 9780898525151 - 0898525152
Access and General Info:
- First Year Published: 1999
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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25Particle control for semiconductor manufacturing
By R. P. Donovan

“Particle control for semiconductor manufacturing” Metadata:
- Title: ➤ Particle control for semiconductor manufacturing
- Author: R. P. Donovan
- Language: English
- Number of Pages: Median: 464
- Publisher: CRC Press LLC - M. Dekker
- Publish Date: 1990
- Publish Location: New York
“Particle control for semiconductor manufacturing” Subjects and Themes:
- Subjects: ➤ Particles - Semiconductors - Defects - Design and construction - Semi-conducteurs - Défauts - Particules (Matière) - TECHNOLOGY & ENGINEERING - Electronics - Solid State
Edition Identifiers:
- The Open Library ID: OL2220291M - OL50665363M
- Online Computer Library Center (OCLC) ID: 45843769 - 395442920
- Library of Congress Control Number (LCCN): 89049025
- All ISBNs: 0585327203 - 0824782429 - 9780585327204 - 9780824782429
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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26Dynamics and defects in liquid crystals
By P. E. Cladis and P. Palffy-Muhoray

“Dynamics and defects in liquid crystals” Metadata:
- Title: ➤ Dynamics and defects in liquid crystals
- Authors: P. E. CladisP. Palffy-Muhoray
- Language: English
- Number of Pages: Median: 464
- Publisher: ➤ CRC - Gordon and Breach Science Publishers
- Publish Date: 1998
- Publish Location: Amsterdam
“Dynamics and defects in liquid crystals” Subjects and Themes:
- Subjects: ➤ Liquid crystals - Analysis - Defects - Cristaux liquides - Défauts - Analyse - SCIENCE / Chemistry / Industrial & Technical - SCIENCE / Physics - Crystals
- People: Alfred Saupe (1925-)
Edition Identifiers:
- The Open Library ID: OL9106706M - OL20801354M
- Online Computer Library Center (OCLC) ID: 40394970 - 1301431023
- All ISBNs: 9056996495 - 9789056996499
First Setence:
"A survey of Alfred Saupe's research work over the last forty years is given."
Access and General Info:
- First Year Published: 1998
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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27Fautographie
By Clément Chéroux

“Fautographie” Metadata:
- Title: Fautographie
- Author: Clément Chéroux
- Language: fre
- Number of Pages: Median: 183
- Publisher: Éditions Yellow Now
- Publish Date: 2003
- Publish Location: Crisnée
“Fautographie” Subjects and Themes:
- Subjects: ➤ Erreurs photographiques - Accident - Erreur humaine - Histoire - Photographie artistique - Erreur - Failures - Photographie - Défauts - Photographie (Art) - Photography - History - Artistic Photography
Edition Identifiers:
- The Open Library ID: OL27038283M
- Online Computer Library Center (OCLC) ID: 60175366
- All ISBNs: 2873401737 - 9782873401733
Author's Alternative Names:
"Clément Chéroux", "Clément Cheroux" and "Clement Cheroux"Access and General Info:
- First Year Published: 2003
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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28Surveillance des machines par analyse des vibrations
By Alain Boulenger

“Surveillance des machines par analyse des vibrations” Metadata:
- Title: ➤ Surveillance des machines par analyse des vibrations
- Author: Alain Boulenger
- Language: fre
- Number of Pages: Median: 321
- Publisher: Dunod - L'Usine Nouvelle
- Publish Date: 2009
- Publish Location: Paris
“Surveillance des machines par analyse des vibrations” Subjects and Themes:
- Subjects: ➤ Mesures électroniques - Amortissement (mécanique) - Surveillance - Vibrations - Machines - Entretien et réparations - Défauts - Traitement du signal
Edition Identifiers:
- The Open Library ID: OL27090280M
- Online Computer Library Center (OCLC) ID: 495412091
- All ISBNs: 2100517805 - 9782100517800
Access and General Info:
- First Year Published: 2009
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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29Defects in Semiconductors
By Lucia Romano, Vittorio Privitera and Chennupati Jagadish
“Defects in Semiconductors” Metadata:
- Title: Defects in Semiconductors
- Authors: Lucia RomanoVittorio PriviteraChennupati Jagadish
- Language: English
- Number of Pages: Median: 458
- Publisher: ➤ Elsevier Science & Technology Books - Academic Press
- Publish Date: 2015
“Defects in Semiconductors” Subjects and Themes:
- Subjects: ➤ Semiconductors - Defects - Semi-conducteurs - Défauts - SCIENCE - Physics - Electricity - Electromagnetism
Edition Identifiers:
- The Open Library ID: OL34507878M - OL28569174M
- Online Computer Library Center (OCLC) ID: 910964268 - 903596288
- All ISBNs: 9780128019405 - 0128019409 - 9780128019351 - 0128019352
Access and General Info:
- First Year Published: 2015
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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30Principles and Applications of Chemical Defects
By Richard J.D. Tilley

“Principles and Applications of Chemical Defects” Metadata:
- Title: ➤ Principles and Applications of Chemical Defects
- Author: Richard J.D. Tilley
- Language: English
- Number of Pages: Median: 320
- Publisher: CRC
- Publish Date: 1998
“Principles and Applications of Chemical Defects” Subjects and Themes:
- Subjects: ➤ Crystals, defects - Crystals - Defects - Cristaux - Défauts - SCIENCE - Physics - Crystallography
Edition Identifiers:
- The Open Library ID: OL7964672M
- Online Computer Library Center (OCLC) ID: 1090540036
- All ISBNs: 9780748739783 - 0748739785
First Setence:
"During the course of this century, and particularly in more recent years, it has been realized that many properties of solids are controlled not so much by the structure of the material itself but by faults or defects in this structure."
Access and General Info:
- First Year Published: 1998
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
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31Microelectronics Failure Analysis Desk Reference
By Tejinder Gandhi
“Microelectronics Failure Analysis Desk Reference” Metadata:
- Title: ➤ Microelectronics Failure Analysis Desk Reference
- Author: Tejinder Gandhi
- Language: English
- Publisher: Asm International
- Publish Date: 2019
“Microelectronics Failure Analysis Desk Reference” Subjects and Themes:
- Subjects: ➤ Electronics - Handbooks, manuals - Materials - Testing - Microelectronics - Defects - Electronic apparatus and appliances - Semiconductors - Microélectronique - Guides, manuels - Défauts - Appareils électroniques - Essais - Semi-conducteurs
Edition Identifiers:
- The Open Library ID: OL37341324M
- Online Computer Library Center (OCLC) ID: 1128706105
- All ISBNs: 9781627082457 - 162708245X
Access and General Info:
- First Year Published: 2019
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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32Understanding building failures and limit state design
By Mohd Zaid Yusof
“Understanding building failures and limit state design” Metadata:
- Title: ➤ Understanding building failures and limit state design
- Author: Mohd Zaid Yusof
- Language: English
- Number of Pages: Median: 95
- Publisher: ➤ Penerbit Universiti Sains Malaysia
- Publish Date: 2014
- Publish Location: Pulau Pinang
“Understanding building failures and limit state design” Subjects and Themes:
- Subjects: ➤ Building failures - Building - Defects - Structural failures - Constructions - Effondrement - Construction - Défauts
Edition Identifiers:
- The Open Library ID: OL43513001M
- Online Computer Library Center (OCLC) ID: 1257481474
- All ISBNs: 9781523135875 - 9838618381 - 9789838618380 - 1523135875
Access and General Info:
- First Year Published: 2014
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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33Green sand additives
By American Foundrymen's Society
“Green sand additives” Metadata:
- Title: Green sand additives
- Author: American Foundrymen's Society
- Language: English
- Publisher: American Foundrymen's Society
- Publish Date: 2016
- Publish Location: Schaumburg, Illinois
“Green sand additives” Subjects and Themes:
- Subjects: ➤ Foundry Sand - Handbooks, manuals - Additives - Metal castings - Defects - Pièces moulées - Guides, manuels - Défauts
Edition Identifiers:
- The Open Library ID: OL43737153M
- Online Computer Library Center (OCLC) ID: 1088724277
- All ISBNs: 1523119578 - 9781523119578
Access and General Info:
- First Year Published: 2016
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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34Degradación, daños, lesiones en la edificación
By Luis Humberto Casas Figueroa
“Degradación, daños, lesiones en la edificación” Metadata:
- Title: ➤ Degradación, daños, lesiones en la edificación
- Author: Luis Humberto Casas Figueroa
- Language: ➤ Spanish; Castilian - español, castellano
- Number of Pages: Median: 224
- Publisher: ➤ Programa Editorial Universidad del Valle
- Publish Date: 2019
- Publish Location: Cali
“Degradación, daños, lesiones en la edificación” Subjects and Themes:
- Subjects: ➤ Buildings - Defects - Building failures - Investigation - Constructions - Défauts
- Places: Repair and reconstruction
Edition Identifiers:
- The Open Library ID: OL43749376M
- Online Computer Library Center (OCLC) ID: 1309095854
- All ISBNs: 9585599139 - 9585599147 - 9789585599147 - 9789585599130
Access and General Info:
- First Year Published: 2019
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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35Large-angle convergent-beam electron diffraction (LACBED)
By Jean Paul Morniroli

“Large-angle convergent-beam electron diffraction (LACBED)” Metadata:
- Title: ➤ Large-angle convergent-beam electron diffraction (LACBED)
- Author: Jean Paul Morniroli
- Language: English
- Number of Pages: Median: 431
- Publisher: ➤ Société Française des Microscopies
- Publish Date: 2002
- Publish Location: Paris
“Large-angle convergent-beam electron diffraction (LACBED)” Subjects and Themes:
- Subjects: ➤ Analysis - Crystals - Defects - Diffraction - Electrons - Electrons, diffraction - Crystals, defects - Électrons - Cristaux - Défauts - Analyse - Electron diffraction - SCIENCE - Microscopes & Microscopy
Edition Identifiers:
- The Open Library ID: OL3468535M
- Online Computer Library Center (OCLC) ID: 55209388 - 1107880609
- Library of Congress Control Number (LCCN): 2005476460
- All ISBNs: 9782901483052 - 2901483054
Access and General Info:
- First Year Published: 2002
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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36Contamination-free manufacturing for semiconductors and other precision products
By R. P Donovan

“Contamination-free manufacturing for semiconductors and other precision products” Metadata:
- Title: ➤ Contamination-free manufacturing for semiconductors and other precision products
- Author: R. P Donovan
- Language: English
- Number of Pages: Median: 448
- Publisher: Marcel Dekker
- Publish Date: 2001
- Publish Location: New York
“Contamination-free manufacturing for semiconductors and other precision products” Subjects and Themes:
- Subjects: ➤ Semiconductors - Defects - Design and construction - Fertigung - Halbleitertechnologie - Semi-conducteurs - Défauts
Edition Identifiers:
- The Open Library ID: OL17011111M
- Online Computer Library Center (OCLC) ID: 1074362117
- Library of Congress Control Number (LCCN): 2001028403
- All ISBNs: 0824703804 - 9780824703806
Access and General Info:
- First Year Published: 2001
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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37Advances and challenges in chemical mechanical planarization
By Symposium C, "Advances and Challenges in Chemical Mechanical Planarization" (2007 San Francisco, Calif.)
“Advances and challenges in chemical mechanical planarization” Metadata:
- Title: ➤ Advances and challenges in chemical mechanical planarization
- Author: ➤ Symposium C, "Advances and Challenges in Chemical Mechanical Planarization" (2007 San Francisco, Calif.)
- Language: English
- Number of Pages: Median: 371
- Publisher: ➤ Materials Research Society, c2007.
- Publish Date: 2007
- Publish Location: Warrendale, Pa
“Advances and challenges in chemical mechanical planarization” Subjects and Themes:
- Subjects: ➤ Surfaces - Chemical mechanical planarization - Semiconductors - Congrès - Semiconducteurs - Materials - Congresses - Chimie des surfaces - Défauts - Grinding and polishing
Edition Identifiers:
- The Open Library ID: OL25176604M
- Online Computer Library Center (OCLC) ID: 181599360
- Library of Congress Control Number (LCCN): 2010540027
- All ISBNs: 1558999515 - 9781558999510
Access and General Info:
- First Year Published: 2007
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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38Point defects in crystals
By Watts

“Point defects in crystals” Metadata:
- Title: Point defects in crystals
- Author: Watts
- Language: English
- Number of Pages: Median: 312
- Publisher: Wiley
- Publish Date: 1976
- Publish Location: New York
“Point defects in crystals” Subjects and Themes:
- Subjects: ➤ Crystals - Defects - Störstelle - Gitterbaufehler - Défauts - Cristaux - Kristall - Crystals, defects
Edition Identifiers:
- The Open Library ID: OL19729293M
- Online Computer Library Center (OCLC) ID: 2439576
- Library of Congress Control Number (LCCN): 76043013
- All ISBNs: 9780471922803 - 0471922803
Access and General Info:
- First Year Published: 1976
- Is Full Text Available: Yes
- Is The Book Public: No
- Access Status: Printdisabled
Online Access
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39Le coût de la non-qualité
By H. J Harrington
“Le coût de la non-qualité” Metadata:
- Title: Le coût de la non-qualité
- Author: H. J Harrington
- Language: fre
- Number of Pages: Median: 172
- Publisher: Eyrolles
- Publish Date: 1990
- Publish Location: Paris
“Le coût de la non-qualité” Subjects and Themes:
- Subjects: ➤ Coût - Qualité des produits - Qualité - Coût de production - Contrôle - Produits commerciaux - Défauts - Production
Edition Identifiers:
- The Open Library ID: OL20595366M
Access and General Info:
- First Year Published: 1990
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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40Point defects in group IV semiconductors
By Sergio Pizzini

“Point defects in group IV semiconductors” Metadata:
- Title: ➤ Point defects in group IV semiconductors
- Author: Sergio Pizzini
- Number of Pages: Median: 134
- Publisher: Materials Research Forum LLC
- Publish Date: 2017
“Point defects in group IV semiconductors” Subjects and Themes:
- Subjects: ➤ Semiconductors - Defects - Semi-conducteurs - Défauts - TECHNOLOGY & ENGINEERING - Mechanical
Edition Identifiers:
- The Open Library ID: OL27411458M
- Online Computer Library Center (OCLC) ID: 979230357
- All ISBNs: 9781945291227 - 1945291222
Access and General Info:
- First Year Published: 2017
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
Online Access
Downloads Are Not Available:
The book is not public therefore the download links will not allow the download of the entire book, however, borrowing the book online is available.
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41Defect complexes in semiconductor structures

“Defect complexes in semiconductor structures” Metadata:
- Title: ➤ Defect complexes in semiconductor structures
- Language: English
- Number of Pages: Median: 307
- Publisher: Springer-Verlag
- Publish Date: 1983
- Publish Location: New York - Berlin
“Defect complexes in semiconductor structures” Subjects and Themes:
- Subjects: ➤ Semiconductors - Congresses - Defects - Halbleitertechnologie - Congrès - Semiconducteurs - Störstelle - Défauts - Halbleiterphysik
Edition Identifiers:
- The Open Library ID: OL3158893M
- Online Computer Library Center (OCLC) ID: 9283402
- Library of Congress Control Number (LCCN): 83000529
- All ISBNs: 0387119868 - 9780387119861
Access and General Info:
- First Year Published: 1983
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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42Point and extended defects in semiconductors
By Workshop on Point, Extended, and Surface Defects in Semiconductors (2nd 1988 Erice, Italy)

“Point and extended defects in semiconductors” Metadata:
- Title: ➤ Point and extended defects in semiconductors
- Author: ➤ Workshop on Point, Extended, and Surface Defects in Semiconductors (2nd 1988 Erice, Italy)
- Language: English
- Number of Pages: Median: 287
- Publisher: Plenum Press
- Publish Date: 1989
- Publish Location: New York
“Point and extended defects in semiconductors” Subjects and Themes:
- Subjects: ➤ Congresses - Defects - Semiconductors - Semiconducteurs - Défauts - Congrès
Edition Identifiers:
- The Open Library ID: OL2196678M
- Online Computer Library Center (OCLC) ID: 20168125
- Library of Congress Control Number (LCCN): 89016332
Access and General Info:
- First Year Published: 1989
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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43Semiconductor defect engineering--materials, synthetic structures and devices II
By S. Ashok
“Semiconductor defect engineering--materials, synthetic structures and devices II” Metadata:
- Title: ➤ Semiconductor defect engineering--materials, synthetic structures and devices II
- Author: S. Ashok
- Language: English
- Number of Pages: Median: 369
- Publisher: Materials Research Society
- Publish Date: 2007
- Publish Location: Warrendale, Pa
“Semiconductor defect engineering--materials, synthetic structures and devices II” Subjects and Themes:
- Subjects: ➤ Semiconductor doping - Semiconductors - Materials - Congresses - Semiconducteurs - Défauts - Congrès - Dopage - Semiconducteurs organiques - Composés semiconducteurs - Ions - Implantation
Edition Identifiers:
- The Open Library ID: OL21361815M
- Online Computer Library Center (OCLC) ID: 173350969
- All ISBNs: 155899954X - 9781558999541
Access and General Info:
- First Year Published: 2007
- Is Full Text Available: No
- Is The Book Public: No
- Access Status: No_ebook
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Wiki
Source: Wikipedia
Wikipedia Results
Search Results from Wikipedia
Tayc
R'AN feat. Tayc) 2020: "Cocktail Remix" (DJ R'AN feat. Tayc) 2020: "Mes défauts (Barack Adama feat. Lefa) 2020: "Melody" (Gracy Hopkins feat. Tayc) 2020:
Audrey Tautou
Title Role Notes 1996 Cœur de cible TV movie 1997 La Vérité est un vilain défaut The telephone operator TV movie Les Cordier, juge et flic Léa TV movie,
Imen Es
French rapper Abou Debeing, who became her producer. The two released "Mes défauts" in 2018. She also collaborated with Lartiste and DJ Kayz in "Fonce". Then
Frederick the Great
p. 227. Gundolf 1972, pp. 210–217. "De la littérature allemande, des défauts qu'on peut lui reprocher, quelles en sont les causes, et par quels moyens
André Berge
l'éducation nouvelle, Berger-1951. L'Écolier difficile : l'école et les défauts de l'enfant, éditions Bourrelier, Carnets de pédagogie pratique', 1954
Luis Sánchez (Colombian footballer)
América": Luis Sánchez". caracol.com.co. "Luis Sanchez: ses qualités, ses défauts... qui est la recrue surprise des Verts?". butfootballclub.fr. ""De niño
Princess Elisabeth, Duchess of Brabant
par le Prince ou la Princesse, fils aîné ou fille aînée du Roi, et, à défaut, par le Prince ou la Princesse, fils aîné ou fille aînée du fils aîné ou
Philippine Leroy-Beaulieu
1994 L'île aux mômes Florence Television film 1997 La vérité est un vilain défaut Isabelle Television film 1998 Mes enfants étrangers Pat Television film
Max Ernst
Paul Éluard: Répétitions (1922), Les malheurs des immortels (1922), Au défaut du silence (1925) Histoire Naturelle (ca. 1925–1926), a set of 34 collotypes
Faux (surname)
variant from either one of them. Cognates and variants include "Defau", "Defaut", "Defauw", "Defauwe" and "De Fauwe". The Belgian surnames could refer to